IP Library Assignment 021184/0946
Patent Assignment
Reel/Frame 021184/0946

Assignment of Assignor's Interest

Recorded: 2008-07-02 Pages: 5
Assignor
MAYDER, ROMI O.
Executed: 2008-06-10
Assignee
SILICON TEST SYSTEMS, INC.
1331 SIERRA AVENUE, SAN JOSE, CALIFORNIA, 95126
Covered Property (1)
A Method of Fabricating a Probe Card Assembly Using Magnetically Aligned Electrical Contact Elements, a Stamped Construction Electrical Contact Element Usable with the Method, and a Standalone Probe Card Tester Formable Using the Method
Patent: 8,305,098 →
Application: 12/109,522 →
Publication: US 2008/0265927
Related Assignments (5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 9, 2009
From: SILICON TEST SYSTEMS, INC.
To: VERIGY (SINGAPORE) PTE. LTD.
Reel/Frame 022078/0762 →
Assignment of Assignor's Interest Mar 20, 2012
From: VERIGY (SINGAPORE) PTE LTD
To: ADVANTEST (SINGAPORE) PTE LTD
Reel/Frame 027896/0018 →
Assignment of Assignor's Interest Apr 6, 2015
From: ADVANTEST (SINGAPORE) PTE. LTD.
To: ADVANTEST CORPORATION
Reel/Frame 035371/0265 →
Corrective Assignment to Correct the Assignee Address Previously Recorded at Reel: 035371 Frame: 0265. Assignor(S) Hereby Confirms the Assignment. Apr 14, 2015
From: ADVANTEST (SINGAPORE) PTE. LTD.
To: ADVANTEST CORPORATION
Reel/Frame 035425/0768 →
Change of Address Dec 18, 2018
From: ADVANTEST CORPORATION
To: ADVANTEST CORPORATION
Reel/Frame 047987/0626 →