IP Library Assignment 021745/0198
Patent Assignment
Reel/Frame 021745/0198

Assignment of Assignor's Interest

Recorded: 2008-10-27 Pages: 2
Assignors
HSIEH, YI-WEI
Executed: 2008-07-16
RUSSELL, JEREMY DUNCAN
Executed: 2008-07-17
CHEN, PEI-YI
Executed: 2008-07-16
Assignee
INOTERA MEMORIES, INC.
NO. 667, FUSING 3RD RD., GUEISHAN TOWNSHIP, TAOYUAN COUNTY 333, R.O.C., TAIWAN
Covered Property (1)
Observation Method of Wafer Ion Implantation Defect
Patent: 7,772,015 →
Application: 12/258,694 →
Publication: US 2010/0015735
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Supplement No. 3 to Patent Security Agreement Feb 10, 2017
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041675/0105 →
Assignment of Assignor's Interest Feb 27, 2017
From: INOTERA MEMORIES, INC.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 041820/0815 →
Release of Security Interest Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050695/0825 →