IP Library › Assignment 027987/0603
Patent Assignment
Reel/Frame 027987/0603

Change of Name

Recorded: 2012-04-04 Pages: 5
Assignor
VISTEC SEMICONDUCTOR SYSTEMS GMBH
Executed: 2009-03-10
Assignee
KLA-TENCOR MIE GMBH
KUBACHER WEG 4, WEILBURG, 35781, GERMANY
Covered Property (1)
Apparatus for Measuring Feature Widths on Masks for the Semiconductor Industry
Patent: 7,375,792 →
Application: 10/711,424 →
Publication: US 2005/0084770
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Correction to Our Error Aug 18, 2005
From: HILLMANN, FRANK; VOLLRATH, WOLFGANG; SCHEURING, GERD; BRUECK, HANS-JUERGEN
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH; MUETEC AUTOMATISIERTE MIKROSKOPIE UND MESSTECHNIK GMBH
Reel/Frame 016647/0193 →
Assignment of Assignor's Interest Apr 4, 2012
From: MUETEC AUTOMATISIERTE MIKROSKOPIE UND MESSTECHNIK GMBH
To: KLA-TENCOR MIE GMBH
Reel/Frame 027986/0540 →
Change of Name Apr 4, 2012
From: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 027987/0636 →