IP Library › Assignment 027987/0636
Patent Assignment
Reel/Frame 027987/0636

Change of Name

Recorded: 2012-04-04 Pages: 7
Assignor
Assignee
VISTEC SEMICONDUCTOR SYSTEMS GMBH
KUBACHER WEG 4, WEILBURG, 35781, GERMANY
Covered Property (1)
Apparatus for Measuring Feature Widths on Masks for the Semiconductor Industry
Patent: 7,375,792 →
Application: 10/711,424 →
Publication: US 2005/0084770
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Correction to Our Error Aug 18, 2005
From: HILLMANN, FRANK; VOLLRATH, WOLFGANG; SCHEURING, GERD; BRUECK, HANS-JUERGEN
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH; MUETEC AUTOMATISIERTE MIKROSKOPIE UND MESSTECHNIK GMBH
Reel/Frame 016647/0193 →
Assignment of Assignor's Interest Apr 4, 2012
From: MUETEC AUTOMATISIERTE MIKROSKOPIE UND MESSTECHNIK GMBH
To: KLA-TENCOR MIE GMBH
Reel/Frame 027986/0540 →
Change of Name Apr 4, 2012
From: VISTEC SEMICONDUCTOR SYSTEMS GMBH
To: KLA-TENCOR MIE GMBH
Reel/Frame 027987/0603 →