IP Library › Assignment 030169/0990
Patent Assignment
Reel/Frame 030169/0990

Assignment of Assignor's Interest

Recorded: 2013-04-08 Pages: 5
Assignors
HAN, WEI
Executed: 2013-04-08
CHAKRABORTY, KANAD
Executed: 2013-04-08
RATCHEN, DAN
Executed: 2013-04-08
Assignee
LATTICE SEMICONDUCTOR CORPORATION
5555 N.E. MOORE CT., HILLSBORO, OREGON, 97124-6421
Covered Property (1)
Highly Secure and Extensive Scan Testing of Integrated Circuits
Patent: 8,977,917 →
Application: 13/858,422 →
Publication: US 2014/0136914
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest May 20, 2013
From: HAN, WEI; CHEN, ZHENG; LEE, ERIC; QIN, JIE
To: LATTICE SEMICONDUCTOR CORPORATION
Reel/Frame 030452/0765 →
Security Interest Mar 24, 2015
From: LATTICE SEMICONDUCTOR CORPORATION; SIBEAM, INC.; SILICON IMAGE, INC.; DVDO, INC.
To: JEFFERIES FINANCE LLC
Reel/Frame 035309/0142 →
Security Interest May 21, 2019
From: LATTICE SEMICONDUCTOR CORPORATION
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
Reel/Frame 049980/0786 →
Release of Security Interest May 21, 2019
From: JEFFERIES FINANCE LLC
To: LATTICE SEMICONDUCTOR CORPORATION; SILICON IMAGE, INC.; SIBEAM, INC.; DVDO, INC.
Reel/Frame 049827/0326 →