IP Library › Assignment 058737/0338
Patent Assignment
Reel/Frame 058737/0338

Merger and Change of Name

Recorded: 2022-01-14 Pages: 48
Assignors
TOSHIBA MEMORY CORPORATION
Executed: 2018-08-01
K.K. PANGEA
Executed: 2018-08-01
Assignee
TOSHIBA MEMORY CORPORATION
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Properties (3)
Reticle Defect Inspection Apparatus and Reticle Defect Inspection Method
Patent: 7,911,599 →
Application: 12/047,554 →
Publication: US 2008/0239290
Reticle Defect Inspection Apparatus and Reticle Defect Inspection Method
Patent: 8,072,592 →
Application: 12/985,849 →
Publication: US 2011/0096324
Memory Device
Application: 17/147,695 →
Publication: US 2021/0134814
Related Assignments (4)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Mar 13, 2008
From: WATANABE, TOSHIYUKI; OGAWA, RIKI
To: ADVANCED MASK INSPECTION TECHNOLOGY, INC.
Reel/Frame 020646/0754 →
Assignment of Assignor's Interest Sep 20, 2010
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: KABUSHIKI KAISHA TOSHIBA; NEC CORPORATION
Reel/Frame 025008/0164 →
Assignment of Assignor's Interest Aug 8, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043482/0364 →
Change of Name Jan 14, 2022
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 058737/0512 →