IP Library › Assignment 058737/0512
Patent Assignment
Reel/Frame 058737/0512

Change of Name

Recorded: 2022-01-14 Pages: 58
Assignor
TOSHIBA MEMORY CORPORATION
Executed: 2019-10-01
Assignee
KIOXIA CORPORATION
1-21, SHIBAURA 3-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Properties (4)
Reticle Defect Inspection Apparatus and Reticle Defect Inspection Method
Patent: 7,911,599 →
Application: 12/047,554 →
Publication: US 2008/0239290
Reticle Defect Inspection Apparatus and Reticle Defect Inspection Method
Patent: 8,072,592 →
Application: 12/985,849 →
Publication: US 2011/0096324
Ferroelectric Memory Device
Application: 16/670,375 →
Publication: US 2020/0066868
Memory Device
Application: 17/147,695 →
Publication: US 2021/0134814
Related Assignments (4)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Mar 13, 2008
From: WATANABE, TOSHIYUKI; OGAWA, RIKI
To: ADVANCED MASK INSPECTION TECHNOLOGY, INC.
Reel/Frame 020646/0754 →
Assignment of Assignor's Interest Sep 20, 2010
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: KABUSHIKI KAISHA TOSHIBA; NEC CORPORATION
Reel/Frame 025008/0164 →
Assignment of Assignor's Interest Aug 8, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043482/0364 →
Merger and Change of Name Jan 14, 2022
From: TOSHIBA MEMORY CORPORATION; K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 058737/0338 →