Patent Assignment
Reel/Frame 060552/0826
Assignment of Assignor's Interest
Recorded: 2022-07-19
Pages: 4
Assignors
LINDSEY, SCOTT E.
Executed: 2007-12-10
JOVANOVIC, JOVAN
Executed: 2007-12-10
HENDRICKSON, DAVID S.
Executed: 2007-12-10
RICHMOND, DONALD P., II
Executed: 2007-12-10
Assignee
AEHR TEST SYSTEMS
400 KATO TERRACE, FREMONT, CALIFORNIA, 94539
Covered Properties
(4)
System for Testing an Integrated Circuit of a Device and Its Method of Use
System for Testing an Integrated Circuit of a Device and Its Method of Use
System for Testing an Integrated Circuit of a Device and Its Method of Use
System for Testing an Integrated Circuit of a Device and Its Method of Use
Related Assignments
(5)
Other recorded transfers of the patents in this record — the chain of ownership.
Security Agreement
Sep 6, 2013
From: AEHR TEST SYSTEMS
To: SILICON VALLEY BANK
Reel/Frame 031171/0001 →
Release of Security Interest
Apr 13, 2015
From: SILICON VALLEY BANK
To: AEHR TEST SYSTEMS
Reel/Frame 035420/0390 →
Security Interest
Apr 14, 2015
From: AEHR TEST SYSTEMS
To: QVT FUND LP; QUINTESSENCE FUND L.P.
Reel/Frame 035424/0783 →
Security Interest
Sep 29, 2016
From: AEHR TEST SYSTEMS
To: QVT FUND LP; QUINTESSENCE FUND L.P.
Reel/Frame 039894/0004 →
Release of Security Interest
Nov 5, 2019
From: QVT FUND LP; QUINTESSENCE FUND L.P.
To: AEHR TEST SYSTEMS
Reel/Frame 050928/0695 →