Patent Assignment
Reel/Frame 065545/0474
Nunc Pro Tunc Assignment
Recorded: 2023-11-13
Pages: 5
Assignor
JSR CORPORATION
Executed: 2023-07-24
Assignees
JAPAN SCIENCE AND TECHNOLOGY AGENCY
4-1-8, HONCHO, KAWAGUCHI-SHI, SAITAMA, 332-0012, JAPAN
HITACHI HIGH-TECH SCIENCE CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, 105-6411, JAPAN
Covered Property
(1)
Charged Particle Beam Apparatus, Thin Film Forming Method, Defect Correction Method and Device Forming Method
Related Assignments
(5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Mar 27, 2013
From: KOYAMA, YOSHIHIRO; YASAKA, ANTO; SHIMODA, TATSUYA; MATSUKI, YASUO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 030120/0421 →
Assignment of Assignor's Interest
Mar 27, 2013
From: KOYAMA, YOSHIHIRO; YASAKA, ANTO; SHIMODA, TATSUYA; MATSUKI, YASUO
To: HITACHI HIGH-TECH SCIENCE CORPORATION; JAPAN SCIENCE AND TECHNOLOGY AGENCY; JSR CORPORATION
Reel/Frame 030120/0534 →
Change of Address
Nov 13, 2023
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 065551/0804 →
Change of Name
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0636 →
Change of Address
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0223 →