IP Library Granted Patent US 6,838,890
Granted Patent B2
US 6,838,890 · App. 09/637,527 · Granted Jan 4, 2005

Membrane probing system

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Quick Facts
Patent No.
US 6,838,890
App. No.
09/637,527
Granted
Jan 4, 2005
Kind
B2
Abstract

A membrane probing assembly includes a probe card with conductors supported thereon, wherein the conductors include at least a signal conductor located between a pair of spaced apart guard conductors. A membrane assembly includes a membrane with contacts thereon, and supporting at least a signal conductor located between a pair of spaced apart guard conductors. The guard conductors of the probe card are electrically interconnected proximate the interconnection between the probe card and the membrane assembly. The guard conductors of the membrane assembly are electrically interconnected proximate the interconnection between the probe card and the membrane assembly.

Claims (83)

1. A probing device for probing an electrical device comprising:

(a) a first support;

(b) a membrane in overlying relationship to said first support;

(c) a plurality of first elongate conductors supported by said membrane;

(d) a plurality of contacts supported by said membrane, each of said contacts electrically connected to at least a respective one of said first conductors;

(e) a second support suitable to support said first support thereon for probing said electrical device;

(f) a second elongate conductor supported by said second support and having a first end supported by said second support, wherein said first end is closer to said contacts than the other end of said second elongate conductor;

(g) a third elongate conductor supported by said second support and spaced apart from said second elongate conductor;

(h) a fourth elongate conductor supported by said second support and spaced apart from said second elongate conductor, wherein said second conductor is located between said third conductor and said fourth conductor;

(i) an interconnecting conductor electrically interconnecting said third conductor and said fourth conductor at a location beyond said first end of said second elongate conductor;

(j) wherein when said first support is engaged with said second support said second elongate conductor is electrically interconnected to at least one of said first elongate conductors.

2. The probing device of claim 1 wherein said interconnecting conductor is substantially coplanar with said third conductor and said fourth conductor.

3. The probing device of claim 1 wherein said interconnecting conductor is substantially coplanar with said second conductor.

4. The probing device of claim 1 wherein said second conductor provides a test signal.

5. The probing device of claim 4 wherein said third conductor provides a guard signal.

6. The probing device of claim 1 wherein said fourth elongate conductor has a first surface area in a region proximate to said first end of said second elongate conductor greater than a second surface area of said third elongate conductor in a region proximate to said first end of said second elongate conductor.

7. A probing device for probing an electrical device comprising:

(a) a first support;

(b) a membrane in overlying relationship to said first support;

(c) a plurality of first elongate conductors supported by said membrane;

(d) a plurality of contacts supported by said membrane, each of said contacts electrically connected to at least a respective one of said first conductors;

(e) a second support suitable to support said first support thereon for probing said electrical device;

(f) a second elongate conductor supported by said second support and having a first end supported by said second support;

(g) a third elongate conductor supported by said second support and spaced apart from said second elongate conductor, wherein said second conductor is located between said third conductor and a fourth conductor supported by said second support;

(h) said fourth elongate conductor spaced apart from said second elongate conductor, said fourth elongate conductor having a first surface area in a region proximate to said first end of said second elongate conductor greater than a second surface area of said third elongate conductor in a region proximate to said first end of said second elongate conductor;

(i) wherein when said first support is engaged with said second support said second elongate conductor is electrically interconnected to at least one of said first elongate conductors.

8. The probing device of claim 7 wherein said first surface area has a maximum width greater than said second surface area.

9. The probing device of claim 7 further comprising an interconnecting conductor electrically interconnecting said third conductor and said fourth conductor at a location beyond said first end of said second elongate conductor.

10. The probing device of claim 9 wherein said interconnecting conductor is substantially coplanar with said third conductor and said fourth conductor.

11. The probing device of claim 10 wherein said interconnecting conductor is substantially coplanar with said second conductor.

12. The probing device of claim 7 wherein said second conductor provides a test signal.

13. The probing device of claim 7 wherein said third conductor provides a guard signal.

14. A probing device for probing an electrical device comprising:

(a) a first support;

(b) a membrane in overlying relationship to said first support;

(c) a plurality of first elongate conductors supported by said membrane;

(d) a plurality of contacts supported by said membrane, each of said contacts electrically connected to at least a respective one of said first conductors;

(e) a first one of said first elongate conductors having a first end wherein said first end is farther from said contacts than the other end of said one of said first elongate conductors;

(f) a second one of said first elongate conductors spaced apart from said first one;

(g) a third one of said first elongate conductors spaced apart from said first one, wherein said first one is located between said second one and said third one; and

(h) a first interconnecting conductor supported by said membrane and electrically interconnecting said third one and said fourth one at a location beyond said first end of said first one.

15. The probing device of claim 14 further comprising:

(a) a second support suitable to support said first support thereon for probing said electrical device;

(b) a second elongate conductor having a first end supported by said second support;

(c) a third elongate conductor spaced apart from said second elongate conductor;

(d) a fourth elongate conductor spaced apart from said second elongate conductor, wherein said second conductor is located between said third conductor and said fourth conductor; and

(e) a second interconnecting conductor electrically interconnecting said third conductor and said fourth conductor at a location beyond said first end of said second elongate conductor.

16. The probing device of claim 15 wherein said second interconnecting conductor is substantially coplanar with said third conductor and said fourth conductor.

17. The probing device of claim 15 wherein said second interconnecting conductor is substantially coplanar with said second conductor.

18. The probing device of claim 15 wherein said second conductor provides a test signal.

19. The probing device of claim 18 wherein said third conductor provides a guard signal.

20. The probing device of claim 15 wherein said fourth elongate conductor has a first surface area in a region proximate to said first end of said second elongate conductor greater than a second surface area of said third elongate conductor in a region proximate to said first end of said second elongate conductor.

21. The probing device of claim 14 wherein said first interconnecting conductor is substantially coplanar with said second one and said third one.

22. The probing device of claim 14 wherein said second interconnecting conductor is substantially coplanar with said first one.

23. The probing device of claim 14 wherein said first one provides a test signal.

24. The probing device of claim 23 wherein said second one provides a guard signal.

25. A probing device for probing an electrical device comprising:

(a) a first support;

(b) a membrane in overlying relationship to said first support;

(c) a plurality of first elongate conductors supported by said membrane;

(d) a plurality of contacts supported by said membrane, each of said contacts electrically connected to at least a respective one of said first conductors;

(e) a second support suitable to support said first support thereon for probing said electrical device;

(f) a second elongate conductor supported by said second support and having a first end supported by said second support, wherein said first end of said second elongate conductor is farther from said contacts than the other end of said second elongate conductor;

(g) a fifth elongate conductor supported by said second support and having a first end supported by said second support, wherein said first end of said fifth elongate conductor is farther from said contacts than the other end of said fifth elongate conductor;

(h) a third elongate conductor supported by said second support and spaced apart from said second elongate conductor;

(i) a fourth elongate conductor supported by said second support and spaced apart from said second elongate conductor, wherein said third conductor and said fifth conductor are located between said second conductor and fourth conductor; and

(j) a first interconnecting conductor supported by said second support and electrically interconnecting said third conductor and said fourth conductor at a location beyond said first end of said second elongate conductor and said first end of said fifth conductor.

26. The probing device of claim 25 for probing an electrical device comprising:

(a) a first one of said first elongate conductors having a first end;

(b) a second one of said first elongate conductors spaced apart from said first one;

(c) a fourth one of said first elongate conductors spaced apart from said first one;

(d) a third one of said first elongate conductors spaced apart from said first one, wherein said first one and said fourth one are located between said second one and said third one; and

(e) a second interconnecting conductor electrically interconnecting said third one and said fourth one at a location beyond said first end of said first one.

27. The probing device of claim 26 wherein said second interconnecting conductor is substantially coplanar with said second one and said third one.

28. The probing device of claim 26 wherein said second interconnecting conductor is substantially coplanar with said first one.

29. The probing device of claim 26 wherein said first one provides a force signal.

30. The probing device of claim 29 wherein said second one provides a guard signal.

31. The probing device of claim 29 wherein said fourth one provides a sense signal.

32. The probing device of claim 25 wherein said second conductor and said fifth conductor are substantially coplanar with said third conductor and said fourth conductor.

33. The probing device of claim 25 wherein said first interconnecting conductor is substantially coplanar with said second conductor.

34. The probing device of claim 25 wherein said second conductor provides a force signal.

35. The probing device of claim 34 wherein said fifth conductor provides a sense signal.

36. The probing device of claim 34 wherein said third conductor provides a guard signal.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Aug 7, 2025
From: HSBC BANK USA, NATIONAL ASSOCIATION
To: FORMFACTOR, INC.
Reel/Frame 072853/0001 →
SECURITY INTEREST Recorded Jul 29, 2025
From: FORMFACTOR, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
Reel/Frame 072263/0272 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 1, 2021
From: FORMFACTOR BEAVERTON, INC.
To: FORMFACTOR, INC.
Reel/Frame 057393/0609 →
CHANGE OF NAME Recorded Jul 18, 2018
From: CASCADE MICROTECH, INC.
To: FORMFACTOR BEAVERTON, INC.
Reel/Frame 046573/0664 →
SECURITY INTEREST IN UNITED STATES PATENTS AND TRADEMARKS Recorded Jul 12, 2016
From: FORMFACTOR, INC.; ASTRIA SEMICONDUCTOR HOLDINGS, INC.; CASCADE MICROTECH, INC.; MICRO-PROBE INCORPORATED
To: HSBC BANK USA, NATIONAL ASSOCIATION
Reel/Frame 039184/0280 →