Patent Application
Utility
App. No. 09/877,179
· Confirmation No. 1229
METHOD OF FABRICATION OF MULTILAYERSEMICONDUCTOR WIRING STRUCTURE WITH REDUCED ALIGNMENT MARK AREA
Inventor:
Hirofumi Saito
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2001-06-11 | TRNA |
Transmittal of New Application | 4 | View | |
| 2001-06-11 | SPEC |
Specification | 32 | View | |
| 2001-06-11 | CLM |
Claims | 3 | View | |
| 2001-06-11 | ABST |
Abstract | 1 | View | |
| 2001-06-11 | DRW |
Drawings-only black and white line drawings | 18 | View | |
| 2001-06-11 | OATH |
Oath or Declaration filed | 2 | View | |
| 2001-06-11 | LET. |
Miscellaneous Incoming Letter | 1 | View |
Inventors
Hirofumi Saito
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
257/622
H10W46/00
G03F9/7084
H10W20/40
H10W46/501
H10W46/301
H10W46/503
Prosecution
- Examiner
- NGUYEN, THINH T
- Art Unit
- 2818
- Customer No.
- 21254
- Docket No.
- 01FN020US
- Confirmation No.
- 1229
Foreign Priority
2000-176249
·
2000-06-13
·
JAPAN
Publication
- Pub. No.
- US20010050437A1
- Pub. Date
- 2001-12-13
Patent Term Adjustment
-2days
from
NEC CORPORATION
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-02-27
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Quick Facts
- App. No.
- 09/877,179
- Filed
- 2001-06-11
- Granted
- 2003-02-04
- Pub. No.
- US20010050437A1
- Examiner
- NGUYEN, THINH T
- Art Unit
- 2818
- PTA
- -2 days
External Links