IP Library › Granted Patent US 6,720,785
Granted Patent Utility
US 6,720,785 · Confirmation No. 2536

INTEGRATED CIRCUIT WITH TEST MODE, AND TEST CONFIGURATION FOR TESTING AN INTEGRATED CIRCUIT

Inventor: Alexander Bette
Patented Case View Patent ↗ View Publication ↗
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2003-10-06 IFEE Issue Fee Payment (PTO-85B) 1 View
2003-10-03 IDS Information Disclosure Statement (IDS) Form (SB08) 2 View
2001-06-18 TRNA Transmittal of New Application 1 View
2001-06-18 SPEC Specification 13 View
2001-06-18 CLM Claims 3 View
2001-06-18 ABST Abstract 1 View
2001-06-18 DRW Drawings-only black and white line drawings 1 View
2001-06-18 OATH Oath or Declaration filed 2 View
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Quick Facts
Patent No.
US 6,720,785
App. No.
09/883,822
Filed
2001-06-18
Granted
2004-04-13
Pub. No.
US20020008235A1
Art Unit
2829
PTA
-5 days