IP Library Granted Patent US 6,623,991
Granted Patent Utility
US 6,623,991 · Confirmation No. 7519

METHOD OF MEASURING MESO-SCALE STRUCTURES ON WAFERS

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Code Description Pages PDF
2003-07-03 IFEE Issue Fee Payment (PTO-85B) 1 View
2003-07-03 LET. Miscellaneous Incoming Letter 2 View
2001-10-31 TRNA Transmittal of New Application 1 View
2001-10-31 SPEC Specification 36 View
2001-10-31 CLM Claims 2 View
2001-10-31 ABST Abstract 1 View
2001-10-31 DRW Drawings-only black and white line drawings 19 View
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Quick Facts
Patent No.
US 6,623,991
App. No.
09/999,410
Filed
2001-10-31
Granted
2003-09-23
Pub. No.
US20020090743A1
Art Unit
2813
PTA
0 days