IP Library Patent Application 10010504
Patent Application Utility
App. No. 10/010,504 · Confirmation No. 6442

TEST CONFIGURATION AND TEST METHOD FOR TESTING A PLURALITY OF INTEGRATED CIRCUITS IN PARALLEL

Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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Code Description Pages PDF
2004-12-21 C.AD Change of Address 1 View
2003-12-29 IFEE Issue Fee Payment (PTO-85B) 1 View
2003-12-10 A... Amendment/Request for Reconsideration-After Non-Final Rejection 1 View
2003-12-10 CLM Claims 8 View
2003-12-10 REM Applicant Arguments/Remarks Made in an Amendment 2 View
2003-12-03 LET. Miscellaneous Incoming Letter 1 View
2001-12-05 TRNA Transmittal of New Application 1 View
2001-12-05 SPEC Specification 17 View
2001-12-05 CLM Claims 11 View
2001-12-05 ABST Abstract 1 View
2001-12-05 DRW Drawings-only black and white line drawings 4 View
2001-12-05 OATH Oath or Declaration filed 4 View
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Quick Facts
App. No.
10/010,504
Filed
2001-12-05
Granted
2004-07-13
Pub. No.
US20020089341A1
Art Unit
2829
PTA
-123 days