Patent Assignment
Reel/Frame 023519/0078
Assignment of Assignor's Interest
Recorded: 2009-11-15
Received: 2009-11-15
Pages: 5
Assignor
INFINEON TECHNOLOGIES AG
Executed: 2006-09-05
Assignee
QIMONDA AG
GUSTAV-HEINEMANN-RING 212, MUNICH, DEX, GERMANY
Covered Properties
(96)
Mechanical Isolation of Electrical Contacts
Application:
61/182,292 →
Integrated Lens Barrel
Application:
12/463,234 →
Zoom Lens Assembly
Application:
12/353,728 →
Wafer Scale Optics
Application:
61/140,504 →
Planar Flexure System with High Pitch Stiffness
Application:
12/273,830 →
Mems Deployment Flexures
Application:
12/273,785 →
Lens Barrel
Application:
12/030,704 →
Adaptive Autofocus Lens Positioning
Application:
11/972,296 →
Integrated Lens Barrel
PCT:
PCTUS2007084301 ↗
Lens Barrel Assembly
PCT:
PCTUS2007084343 ↗
Adaptive Autofocus Lens Positioning
Application:
11/859,513 →
Impulse Actuated Mems Devices
Application:
11/854,806 →
Video Mode Hidden Autofocus
Application:
11/848,996 →
Lens Barrel Assembly
Application:
11/848,933 →
Shutter for Autofocus
Application:
11/849,049 →
Lens Positioning Systems and Methods
Application:
11/847,547 →
Mems Deployment Flexures
Application:
60/968,706 →
Planar Flexure System with High Pitch Stiffness
Application:
60/968,711 →
Integrated lens Barrel
Application:
60/946,217 →
Mems Device with Integrated Memory Cells
Application:
11/735,803 →
Shutter for Miniature Camera
PCT:
PCTUS2007062506 ↗
Auto-Focus with Lens Vibration
Application:
11/676,991 →
Optical System with Plano Convex Lens
Application:
11/625,204 →
Lens Barrel Assembly for a Camera
Application:
11/565,518 →
Lens Barrel Systems and Methods
Application:
60/865,143 →
Uniform Wall Thickness Lens Barrel
Application:
11/550,305 →
Triaxial Snubber Assembly
Application:
11/550,119 →
Camera with Multiple Focus Captures
Application:
11/549,414 →
Hidden Autofocus
Application:
11/549,381 →
Lens Positioning Systems and Methods
Application:
11/511,001 →
Miniature Camera Lens Systems
Application:
11/505,660 →
Board Mounted Hermetically Sealed Optical Device Enclosure and Manufacturing Methods Therefor
Application:
11/490,196 →
Stage with Built-in Damping
Application:
11/488,411 →
Lens positioning systems and methods
Application:
11/487,908 →
Electronic Damping for Stage Positioning
Application:
11/485,812 →
Image Sensor Using Single Photon Jots and Processor to Create Pixels
Application:
11/442,458 →
3D Camera
Application:
11/416,882 →
Telephone Vibrator
Application:
11/391,871 →
Shutter for Miniature Camera
Application:
11/365,790 →
Method of Enhancing an Etch System
Application:
11/365,047 →
Lens Mount and Alignment Method
Application:
11/364,100 →
Lens Barrel
Application:
11/364,099 →
Autofocus Camera
Application:
11/361,608 →
PCT:
PCTUS2006007024 ↗
Axial Snubbers for Camera
Application:
11/269,304 →
Lens Assembly
Application:
11/263,153 →
Lorentz actuator for miniature camera
Application:
11/263,149 →
Zoom Lens Assembly
Application:
11/263,152 →
Method and system for cleaning molded items
Application:
11/219,258 →
Resolution Adjustment for Miniature Camera
Application:
11/219,410 →
Range and Speed Finder
Application:
11/219,374 →
Open loop damping
Application:
60/713,971 →
Oil damping for camera optical assembly
Application:
11/219,137 →
Mems Digital Linear Actuator
Application:
11/190,307 →
Resolution adjustment for miniature camera
Application:
60/697,476 →
3D camera
Application:
60/679,486 →
Camera used as a vibrator
Application:
60/665,882 →
Miniature Camera
Application:
11/078,667 →
Autofocus camera
Application:
60/657,261 →
Centipede Actuator Motion Stage
Application:
11/061,145 →
Motion Control Stages and Methods of Making the Same
Application:
11/041,122 →
Base, Payload and Connecting Structure and Methods of Making the Same
Application:
11/037,883 →
Micro-Electromechanical System Inertial Sensor
Application:
10/982,044 →
Apparatus for the Automated Testing, Calibration and Characterization of Test Adapters
Application:
10/965,513 →
MEMS inertial sensor
Application:
60/574,677 →
Apparatus for Flexible Deactivation of Word Lines of Dynamic Memory Modules and Method Therefor
Application:
10/834,416 →
Miniature camera
Application:
60/552,521 →
Centipede actuator motion stage
Application:
60/546,100 →
Method and Probe Card Configuration for Testing a Plurality of Integrated Circuits in Parallel
Application:
10/736,356 →
Fiber Optic Collimator and Collimator Array
Application:
10/669,676 →
Snap Down Pivoting Optical Element
Application:
10/660,816 →
Temperature-Dependent Refresh Cycle for Dram
Application:
10/386,148 →
Method for Determining the Transit Time of Electrical Signals on Printed Circuit Boards Using Automatic Standard Test Equipment
Application:
10/223,899 →
Circuit for Testing an Integrated Circuit
Application:
10/208,252 →
Integrated Dynamic Memory and Operating Method
Application:
10/206,299 →
Tester Apparatus for Electronic Components
Application:
10/186,659 →
Delay Locked Loop
Application:
10/177,945 →
Test Apparatus for Parallel Testing a Number of Electronic Components and a Method for Calibrating the Test Apparatus
Application:
10/134,132 →
Circuit Configuration for Selectively Transmitting Information Items from a Measuring Device to Chips on a Wafer During Chip Fabrication
Application:
10/131,374 →
Method for Releasable Contact-Connection of a Plurality of Integrated Semiconductor Modules on a Wafer
Application:
10/105,590 →
Base, Payload and Connecting Structure and Methods of Making the Same
Application:
10/067,466 →
Kinematic and Non-Kinematic Passive Alignment Assemblies and Methods of Making the Same
Application:
10/067,420 →
Flexure Assemblies and Methods of Making the Same
Application:
10/067,597 →
Method for Improving Thermal Process Steps
Application:
09/914,749 →
Test Configuration and Test Method for Testing a Plurality of Integrated Circuits in Parallel
Application:
10/010,504 →
Method of Calibrating a Test System for Semiconductor Components, and Test Substrate
Application:
09/992,290 →
Optical Element Support Structure and Methods of Using and Making the Same
Application:
10/001,092 →
Measurement Probe for Detecting Electrical Signals in an Integrated Semiconductor Circuit
Application:
09/947,295 →
Soft Snap-Down Optical Element Using Kinematic Supports
Application:
09/948,176 →
Apparatus for Testing Semiconductor Devices
Application:
09/915,984 →
System for Testing Fast Synchronous Semiconductor Circuits
Application:
09/907,695 →
Integrated Circuit Configuration for Testing Transistors, and a Semiconductor Wafer Having Such a Circuit Configuration
Application:
09/876,706 →
Snap-Down Pivoting Optical Element
Application:
09/870,967 →
Slipface Lens
Application:
09/862,358 →
Angled Fiber Termination and Methods of Making the Same
Application:
09/855,305 →
Low Insertion Loss Non-Blocking Optical Switch
Application:
09/853,514 →
Apparatus and Method for Patterning a Semiconductor Wafer
Application:
09/801,413 →