IP Library › Granted Patent US 6,614,243
Granted Patent Utility
US 6,614,243 · Confirmation No. 7963

MEASUREMENT PROBE FOR DETECTING ELECTRICAL SIGNALS IN AN INTEGRATED SEMICONDUCTOR CIRCUIT

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2003-07-03 IFEE Issue Fee Payment (PTO-85B) 1 View
2001-09-05 TRNA Transmittal of New Application 1 View
2001-09-05 SPEC Specification 15 View
2001-09-05 CLM Claims 6 View
2001-09-05 ABST Abstract 1 View
2001-09-05 DRW Drawings-only black and white line drawings 1 View
2001-09-05 OATH Oath or Declaration filed 2 View
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Quick Facts
Patent No.
US 6,614,243
App. No.
09/947,295
Filed
2001-09-05
Granted
2003-09-02
Pub. No.
US20020084791A1
Art Unit
2829
PTA
-199 days