Patent Assignment
Reel/Frame 023519/0083
Assignment of Assignor's Interest
Recorded: 2009-11-15
Received: 2009-11-15
Pages: 5
Assignor
QIMONDA AG
Executed: 2006-09-05
Assignee
MOSAID TECHNOLOGIES INCORPORATED
11 HINES ROAD, KANATA, CAX, K2K 2X1, CANADA
Covered Properties
(22)
Low-voltage-insensitive electro-pyrotechnic device
Application:
11/811,568 →
Stage with Built-in Damping
Application:
11/488,411 →
Apparatus for the Automated Testing, Calibration and Characterization of Test Adapters
Application:
10/965,513 →
Apparatus for Flexible Deactivation of Word Lines of Dynamic Memory Modules and Method Therefor
Application:
10/834,416 →
Method and Probe Card Configuration for Testing a Plurality of Integrated Circuits in Parallel
Application:
10/736,356 →
Temperature-Dependent Refresh Cycle for Dram
Application:
10/386,148 →
Method for Determining the Transit Time of Electrical Signals on Printed Circuit Boards Using Automatic Standard Test Equipment
Application:
10/223,899 →
Circuit for Testing an Integrated Circuit
Application:
10/208,252 →
Integrated Dynamic Memory and Operating Method
Application:
10/206,299 →
Tester Apparatus for Electronic Components
Application:
10/186,659 →
Delay Locked Loop
Application:
10/177,945 →
Test Apparatus for Parallel Testing a Number of Electronic Components and a Method for Calibrating the Test Apparatus
Application:
10/134,132 →
Circuit Configuration for Selectively Transmitting Information Items from a Measuring Device to Chips on a Wafer During Chip Fabrication
Application:
10/131,374 →
Method for Releasable Contact-Connection of a Plurality of Integrated Semiconductor Modules on a Wafer
Application:
10/105,590 →
Method for Improving Thermal Process Steps
Application:
09/914,749 →
Test Configuration and Test Method for Testing a Plurality of Integrated Circuits in Parallel
Application:
10/010,504 →
Method of Calibrating a Test System for Semiconductor Components, and Test Substrate
Application:
09/992,290 →
Measurement Probe for Detecting Electrical Signals in an Integrated Semiconductor Circuit
Application:
09/947,295 →
Apparatus for Testing Semiconductor Devices
Application:
09/915,984 →
System for Testing Fast Synchronous Semiconductor Circuits
Application:
09/907,695 →
Integrated Circuit Configuration for Testing Transistors, and a Semiconductor Wafer Having Such a Circuit Configuration
Application:
09/876,706 →
Apparatus and Method for Patterning a Semiconductor Wafer
Application:
09/801,413 →