IP Library Granted Patent US 6,807,454
Granted Patent Utility
US 6,807,454 · Confirmation No. 6765

METHOD FOR AUTOMATICALLY CONTROLLING DEFECT -SPECIFICATION IN A SEMICONDUCTOR MANUFACTURING PROCESS

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Code Description Pages PDF
2004-06-29 IFEE Issue Fee Payment (PTO-85B) 3 View
2003-03-17 TRNA Transmittal of New Application 8 View
2003-03-17 ADS Application Data Sheet 2 View
2003-03-17 SPEC Specification 8 View
2003-03-17 CLM Claims 2 View
2003-03-17 ABST Abstract 2 View
2003-03-17 DRW Drawings-only black and white line drawings 4 View
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Quick Facts
Patent No.
US 6,807,454
App. No.
10/249,103
Filed
2003-03-17
Granted
2004-10-19
Pub. No.
US20030212469A1
Art Unit
2125
PTA
0 days