Apparatus and method for initializing an integrated circuit device and activating a function of the device once an input power supply has reached a threshold voltage
View Patent ↗An apparatus for generating a function activation signal to activate a function in an integrated circuit device comprises a power-on circuit receiving a power input and initializing and generating a test activation signal, a test circuit receiving the test activation signal and generating a test result signal, and a threshold decision circuit receiving the test result signal and generating the function activation signal. The test circuit models a function of the integrated circuit device and generates the test result signal when the power input has reached a sufficient voltage to perform the function of the integrated circuit device. The threshold decision circuit generates the function activation signal if the test result signal indicates the power input has reached a sufficient voltage to perform the function of the integrated circuit device.
1. An apparatus for generating a function activation signal to activate a function in an integrated circuit device comprising:
a power-on circuit receiving a power input and initializing and generating a test activation signal;
a test circuit receiving said test activation signal and generating a test result signal; and
a threshold decision circuit receiving said test result signal and generating the function activation signal;
wherein said test circuit models a function of the integrated circuit device and generates said test result signal when said power input has reached a sufficient voltage to perform said function of the integrated circuit device; and
wherein said threshold decision circuit generates the function activation signal if said test result signal indicates said power input has reached a sufficient voltage to perform said function of the integrated circuit device.
2. The apparatus of claim 1 , wherein said test activation signal initializes said test circuit.
3. The apparatus of claim 1 , wherein said function of the integrated circuit device is a memory clear function.
4. The apparatus of claim 1 , wherein said integrated circuit device comprises a programmable logic device.
5. The apparatus of claim 4 , wherein said programmable logic device comprises an FPGA.
6. The apparatus of claim 1 , further comprising:
an array of memory cells, wherein said test circuit comprises a memory cell.
7. The apparatus of claim 6 , wherein said test circuit is included in said array of memory cells.
8. The apparatus of claim 6 , wherein said test circuit is located outside said array of memory cells.
9. The apparatus of claim 6 , wherein said function is a memory clear function, said test circuit memory cell generates said test result signal when said power input has reached a sufficient voltage to reset said test circuit memory cell and said threshold decision circuit generates said function activation signal if said test result signal indicates said test circuit memory cell was cleared.
10. The apparatus of claim 1 , further comprising:
a signal generator circuit for generating a test-triggering signal, wherein said test activation signal initializes said test circuit and said test-triggering signal activates said test circuit to perform a test function.
11. An apparatus configured to generate a function activation signal to activate a function in an integrated circuit device comprising:
a power-on circuit configured to receive a power input and to initialize and to generate a test activation signal;
a first test circuit configured to receive said test activation signal and to generate a first test result signal;
a second test circuit configured to receive said test activation signal and to generate a second test result signal; and
a threshold decision circuit configured to receive said first test result signal and said second test result signals and to generate the function activation signal;
wherein said first test circuit and said second test circuit model functions of the integrated circuit device and generate said first test result signal and said second test result signal when said power input has reached a sufficient voltage to perform said function; and
wherein said threshold decision circuit is configured to generate the function activation signal based on said first test result signal and said second test result signal.
12. A method for generating a function activation signal to activate a function in an integrated circuit device comprising:
powering on the device;
initializing a test circuit to test a function of the device;
performing a test with said test circuit to determine whether said function of the device should be activated;
determining whether said test is successful, if not successful, repeating said test; and
activating said function of said device if said test is successful.
13. A method for generating a function activation signal to activate a function in an integrated circuit device comprising:
powering a device having the function;
sending a test activation signal to a test-triggering signal generator and a plurality of test circuits disposed in said device;
initializing said test-triggering signal generator and said plurality of test circuits;
sending said test-triggering signal to said plurality of test circuits;
performing a plurality of tests on said device with said plurality of test circuits to determine whether the function should be activated;
determining whether said tests are successful, repeating said tests if said tests are not successful;
generating test result signals if said tests are successful;
performing a logic function on at least one of said test result signals to determine whether the at least one test result signal indicates that the function can be performed; and
activating the function if said logic function indicates that the function can be performed.