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App. No. 10/336,766 · Confirmation No. 8150

METHOD AND APPARATUS FOR MEASURING THICKNESS OF THIN FILM

Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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 Code Description Pages PDF
2003-12-08 IFEE Issue Fee Payment (PTO-85B) 1 View
2003-01-06 TRNA Transmittal of New Application 2 View
2003-01-06 ADS Application Data Sheet 3 View
2003-01-06 A.PE Preliminary Amendment 3 View
2003-01-06 SPEC Specification 40 View
2003-01-06 CLM Claims 9 View
2003-01-06 ABST Abstract 1 View
2003-01-06 DRW Drawings-only black and white line drawings 12 View
2003-01-06 OATH Oath or Declaration filed 4 View
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Quick Facts
App. No.
10/336,766
Filed
2003-01-06
Granted
2004-01-27
Pub. No.
US20030132381A1
Art Unit
2881
PTA
0 days