IP Library › Assignment 013643/0803
Patent Assignment
Reel/Frame 013643/0803

Assignment of Assignor's Interest

Recorded: 2003-01-06 Pages: 3
Assignors
ITAGAKI, YOSUKE
Executed: 2002-12-25
YAMADA, KEIZO
Executed: 2002-12-25
USHIKI, TAKEO
Executed: 2002-12-25
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA 211-8668, JAPAN
Covered Property (1)
Method and Apparatus for Measuring Thickness of Thin Film
Patent: 6,683,308 →
Application: 10/336,766 →
Publication: US 2003/0132381
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 15, 2003
From: NEC ELECTRONICS CORPORATION
To: FAB SOLUTIONS, INC.
Reel/Frame 014395/0551 →
Assignment of Assignor's Interest Jun 1, 2007
From: FAB SOLUTIONS, INC.
To: TOPCON CORPORATION
Reel/Frame 019365/0356 →