IP Library Granted Patent US 7,045,851
Granted Patent B2
US 7,045,851 · App. 10/465,797 · Granted May 16, 2006

Nonvolatile memory device using semiconductor nanocrystals and method of forming same

Assignee: International Business Machines Corporation
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,045,851
App. No.
10/465,797
Granted
May 16, 2006
Kind
B2
Abstract

A floating gate for a field effect transistor (and method for forming the same and method of forming a uniform nanoparticle array), includes a plurality of discrete nanoparticles in which at least one of a size, spacing, and density of the nanoparticles is one of templated and defined by a self-assembled material.

Claims (81)

1. A floating gate for a field effect transistor, comprising:

a plurality of discrete nanoparticles in which at least one of a size, spacing, and density of said nanoparticles is at least one of templated and defined by a self-assembled material,

wherein said nanoparticles comprise a substantially uniform diameter, said nanoparticles comprising diameters between about 2 nanometers and about 30 nanometers, with size distributions no greater than about 15% of a mean diameter of the nanoparticles,

wherein said nanoparticles comprise a substantially uniform center-to-center spacing between said nanoparticles, and

wherein said nanoparticles are arranged in a two-dimensional array.

2. The floating gate of claim 1 , wherein said spacing of said nanoparticles comprises a variance of no more than 20%.

3. The floating gate of claim 2 , wherein said spacing of said nanoparticles comprises a variance of no more than 15%.

4. The floating gate of claim 3 , wherein said spacing of said nanoparticles comprises a variance of no more than 10%.

5. The floating gate of claim 1 , wherein a center-to-center spacing between adjacent nanoparticles is controlled to comprise a variance within a range of 10% to about 20%.

6. A field effect transistor, comprising:

a source region and a drain region formed in a semiconductor material;

a channel region disposed between said source region and said drain region;

an insulating layer of electrically insulating material disposed over said channel region;

a floating gate layer of electrically conducting material disposed over said insulating layer;

a layer of electrically insulating material disposed over said floating gate layer; and

a gate electrode overlying said layer of insulating material,

wherein said floating gate layer comprises a plurality of discrete nanoparticles in which at least one of a size, spacing, and density of said nanoparticles is one of templated and defined by a self-assembled material,

wherein said nanoparticles comprise a substantially uniform diameter, said nanoparticles comprising diameters between about 2 nanometers and about 30 nanometers, with size distributions no greater than about 15% of a mean diameter of the nanoparticles,

wherein said nanoparticles comprise a substantially uniform center-to-center spacing between said nanoparticles, and

wherein said nanoparticle density is greater than 10 10 /cm 2 .

7. The field effect transistor of claim 6 , wherein said self assembly involves a block copolymer film.

8. The field effect transistor of claim 7 , wherein said block copolymer comprises a diblock copolymer including polystyrene (PS) and poly(methyl methacrylate) (PMMA).

9. The field effect transistor of claim 6 , wherein said nanoparticles comprise at least one of silicon, germanium, and silicon-germanium.

10. The field effect transistor of claim 6 , wherein said nanoparticles are arranged in a close-packed, two-dimensional hexagonal lattice.

11. The field effect transistor of claim 10 , wherein said hexagonal lattice comprises an average inter-nanoparticle distance between about 1 times and about 2 times an average nanoparticle diameter, and a standard deviation of inter-nanoparticle distance no greater than substantially 20% of the mean distance.

12. The field effect transistor of claim 6 , wherein said nanoparticles in said floating gate comprise a first distinct size and a second distinct size, each with diameter standard deviations being less than approximately 15% of a mean diameter of said nanoparticles.

13. The field effect transistor of claim 7 , wherein said block copolymer comprises a diblock copolymer comprising at least one of polystyrene (PS), poly(methyl methacrylate) (PMMA), polybutadiene-polybutylmethcrylate, polybutadiene-polydimethylsiloxane, polybutadiene-polymethylmethacrylate, polybutadiene-polyvinylpyridine, polyisoprene-polymethylmethacrylate, polyisoprene-polyvinylpyridine, polybutylacrylate-polymethylmethacrylate, polybutylacrylate-polyvinylpyridine, polyhexylacrylate-polyvinylpyridine, polyisobutylene-polybutylmethacrylate, polyisobutylene-polydimethoxysiloxane, polyisobutylene-polymethylmethacrylate, polyisobutylene-polyvinylpyridine, polybutylmethacrylate-polybutylacrylate, polybutylmethacrylate-polyvinylpyridine, polyethylene-polymethylmethacrylate, polymethylmathacrylate-polybutylacrylate, polymethylmethacrylate-polybutylmethacrylate, polystyrene-polybutadiene, polystyrene-polybutylacrylate, polystyrene-polybutylmethacrylate, polystyrene-polybutylstyrene, polystyrene-polydimethoxysiloxane, polystyrene-polyisoprene, polystyrene-polymethylmethacrylate, polystyrene-polyvinylpyridine, polyethylene-polyvinylpyridine, polyvinylpyridine-polymethylmethacrylate, polyethyleneoxide-polyisoprene, polyethyleneoxide-polybutadiene, polyethyleleoxide-polystyrene, and polyetheleneoxide-polymethylmethacrylate.

14. The field effect transistor of claim 6 , wherein said nanoparticles are arranged in one of a hexagonal lattice and a cubic lattice.

15. The field effect transistor of claim 7 , wherein said block copolymer comprises a diblock copolymer comprising a molecular weight within a range of about 5,000 kg/mol to about 250,000 kg/mol.

16. The field effect transistor of claim 7 , wherein a molecular weight of said block copolymer film is selected to determine dimensions of said nanoparticles.

17. The field effect transistor of claim 7 , wherein a molecular weight of said block copolymer film is selected to determine a diameter of said nanoparticles after said self-assembly and a spacing between adjacent ones of said nanoparticles.

18. The floating gate of claim 1 , wherein said self-assembled material uses a material which naturally forms a regular array.

19. A floating gate for a field effect transistor, comprising:

a plurality of discrete nanoparticles in which at least one of a size, spacing and density of said nanoparticles is at least one of templated and defined by a self-assembled material,

wherein said nanoparticles comprise diameters between about 2 nanometers and about 30 nanometers, with size distributions no greater than about 15% of a mean diameter of the nanoparticles, and

wherein a center-to-center spacing between adjacent nanoparticles is controlled to comprise a variance within a range of about 10% to about 20%.

20. A field effect transistor, comprising:

a source region and a drain region formed in a semiconductor material;

a channel region disposed between said source region and said drain region;

an insulating layer of electrically insulating material disposed over said channel region;

a floating gate layer of electrically conducting material disposed over said insulating layer;

a layer of electrically insulating material disposed over said floating gate layer; and

a gate electrode overlying said layer of insulating material,

wherein said floating gate layer comprises a plurality of discrete nanoparticles in which at least one of a size, spacing, and density of said nanoparticles is at least one of templated and defined by a self-assembled material, and

wherein said nanoparticles are arranged in a close-packed, two-dimensional hexagonal lattice.

21. A field effect transistor, comprising:

a source region and a drain region formed in a semiconductor material;

a channel region disposed between said source region and said drain region;

an insulating layer of electrically insulating material disposed over said channel region;

a floating gate layer of electrically conducting material disposed over said insulating layer;

a layer of electrically insulating material disposed over said floating gate layer; and

a gate electrode overlying said layer of insulating material,

wherein said floating gate layer comprises a plurality of discrete nanoparticles in which at least one of a size, spacing, and density of said nanoparticles is at least one of templated and defined by a self-assembled material,

wherein said nanoparticles are arranged in a close-packed, two-dimensional hexagonal lattice, and

wherein said hexagonal lattice comprises an average inter-nanoparticle distance between about 1 times and about 2 times an average nanoparticle diameter, and a standard deviation of inter-nanoparticle distance no greater than substantially 20% of the mean distance.

22. A field effect transistor, comprising:

a source region and a drain region formed in a semiconductor material;

a channel region disposed between said source region and said drain region;

an insulating layer of electrically insulating material disposed over said channel region;

a floating gate layer of electrically conducting material disposed over said insulating layer;

a layer of electrically insulating material disposed over said floating gate layer; and

a gate electrode overlying said layer of insulating material,

wherein said floating gate layer comprises a plurality of discrete nanoparticles in which at least one of a size, spacing, and density of said nanoparticles is at least one of templated and defined by a self-assembled material, and

wherein said nanoparticles in said floating gate comprise a first distinct size and a second distinct size, each with diameter standard deviations being less than approximately 15% of a mean diameter of said nanoparticles.

23. A floating gate for a field effect transistor, comprising:

a plurality of discrete nanoparticles, wherein said nanoparticles have diameters between about 2 nanometers and about 30 nanometers, with size distributions no greater than about 15% of mean diameter of the nanoparticles,

wherein a center-to-center spacing between adjacent nanoparticles is controlled to comprise a variance within a range of no greater than about 20%, and

wherein said nanoparticles are arranged in a two-dimensional array.

24. A field effect transistor, comprising:

a floating gate, comprising:

a plurality of discrete nanoparticles, wherein said nanoparticles have diameters between about 2 nanometers and about 30 nanometers, with size distributions no greater than about 15% of mean diameter of the nanoparticles,

wherein a center-to-center spacing between adjacent nanoparticles is controlled to comprise a variance within a range of no greater than about 20%, and

wherein said nanoparticles are arranged in a two-dimensional array.

25. A floating gate for a field effect transistor, comprising:

a plurality of discrete nanoparticles,

wherein said nanoparticles are arranged in a close-packed, two-dimensional hexagonal lattice.

26. A field effect transistor, comprising:

a floating gate, comprising:

a plurality of discrete nanoparticles,

wherein said nanoparticles are arranged in a close-packed, two-dimensional hexagonal lattice.

27. The field effect transistor according to claim 10 , wherein said two-dimensional hexagonal lattice is imperfect, having defects in the form of grain boundaries.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded May 12, 2021
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 056987/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 20, 2020
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES INC.
Reel/Frame 054636/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 2, 2020
From: GLOBALFOUNDRIES INC.
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 054633/0001 →
SECURITY AGREEMENT Recorded Nov 29, 2018
From: GLOBALFOUNDRIES INC.
To: WILMINGTON TRUST, NATIONAL ASSOCIATION
Reel/Frame 049490/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 5, 2015
From: GLOBALFOUNDRIES U.S. 2 LLC; GLOBALFOUNDRIES U.S. INC.
To: GLOBALFOUNDRIES INC.
Reel/Frame 036779/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2015
From: INTERNATIONAL BUSINESS MACHINES CORPORATION
To: GLOBALFOUNDRIES U.S. 2 LLC
Reel/Frame 036550/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 16, 2004
From: BLACK, CHARLES T.; GUARINI, KATHRYN WILDER
To: INTERNATIONAL BUSINESS MACHINES CORPORATON
Reel/Frame 014864/0048 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 28, 2003
From: BLACK, CHARLES T.; GUARINI, KATHRYN WILDER
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 015245/0883 →
Continuity (1)
Related Publication 20040256662A1 · Dec 23, 2004