IP Library Granted Patent US 6,891,769
Granted Patent B2
US 6,891,769 · App. 10/623,111 · Granted May 10, 2005

Flash/dynamic random access memory field programmable gate array

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Quick Facts
Patent No.
US 6,891,769
App. No.
10/623,111
Granted
May 10, 2005
Kind
B2
Abstract

A circuit for selectively interconnecting two nodes in an integrated circuit device includes a memory array having a plurality of wordlines and a plurality of bitlines. A refresh transistor has a source coupled to one of the plurality of bitlines, a control gate coupled to a dynamic random access memory wordline and a drain. A switching transistor has a gate coupled to the drain of the refresh transistor, a source coupled to a first one of the nodes and a drain coupled to a second one of the nodes. An address decoder for supplies periodic signals to the wordlines and the dynamic random access memory wordline.

Claims (36)

1. A circuit for selectively interconnecting two nodes in an integrated circuit device comprising:

a memory array having a plurality of wordlines and a plurality of bitlines;

a refresh transistor having a source coupled to one of said plurality of bitlines, a control gate coupled to a dynamic random access memory wordline, and a drain;

a switching transistor having a gate coupled to said drain of said refresh transistor, a source coupled to a first one of the nodes and a drain coupled to a second one of the nodes; and

an address decoder for supplying periodic signals to drive said wordlines and said dynamic random access memory wordline.

2. The circuit of claim 1 wherein said memory array drives said bitlines through a sense amplifier and a level-shifting circuit.

3. The circuit of claim 1 wherein said periodic signals have a repetition rate that is a function of temperature of a die on which said circuit is disposed.

4. The circuit of claim 1 wherein said memory array is a flash memory array.

5. A circuit for selectively interconnecting N pairs of nodes in an integrated circuit device comprising:

a memory array having a plurality of wordlines and a plurality of bitlines;

a plurality of dynamic random access memory wordlines;

a separate switch for each pair of nodes in the integrated circuit, each said switch associated with a unique combination of one of said bitlines and one of said dynamic random access memory wordlines, each said switch including a refresh transistor and a switching transistor, said refresh transistor having a source coupled to one of said plurality of bitlines, a control gate coupled to one of said dynamic random access memory wordlines and a drain, said switching transistor having a gate coupled to said drain of said refresh transistor, a source coupled to a first one of the nodes and a drain coupled to a second one of the nodes;

an address decoder having at least N distinct states for supplying signals to said wordlines and said dynamic random access memory wordlines; and

a sequencing circuit for sequencing said address decoder through said at least N states.

6. The circuit of claim 5 wherein said memory array drives said bitlines through a sense amplifier and a level-shifting circuit.

7. The circuit of claim 5 wherein said sequencing circuit sequences said address decoder through said at least N states at a rate that is a function of temperature of a die on which said circuit is disposed.

8. The circuit of claim 5 wherein said memory array is disposed on a first die and the remainder of said circuit is disposed on a second die interconnected to said first die.

9. The circuit of claim 8 wherein said memory array is a flash memory array.

10. The circuit of claim 8 wherein said first die is interconnected to said second die by face-to-face interconnect.

11. The circuit of claim 10 wherein said memory array is a flash memory array.

12. A method for interconnecting two nodes in an integrated circuit device comprising:

storing a charge representing an on-status bit on a gate capacitance of a switching transistor coupled between the two nodes; and

periodically refreshing said charge, said periodically refreshing said charge comprises periodically coupling a voltage representing said on-status bit to said gate capacitance of said switching transistor through a refresh transistor;

wherein periodically coupling a voltage comprises periodically coupling a voltage having a magnitude sufficient to turn on said switching transistor without a Vth drop.

13. The method of claim 12 wherein coupling a voltage representing said on-status bit comprises:

retrieving a signal representing said on-status bit from a memory; and

converting said signal into said voltage.

14. The method of claim 12 wherein periodically refreshing said charge is performed at a periodic interval that is a function of temperature of a die on which said circuit is disposed.

15. A method for interconnecting N pairs of nodes in an integrated circuit device comprising:

for each of said N pairs of nodes storing a charge representing an on-status bit on a gate capacitance of a switching transistor coupled between the pair of nodes; and

periodically refreshing each said charge, said periodically refreshing each said charge comprises periodically coupling a voltage representing said on-status bit to said gate capacitance of each said switching transistor through a separate refresh transistor;

wherein periodically coupling a voltage comprises periodically coupling a. voltage having a magnitude sufficient to turn on each said switching transistor without a Vth drop.

16. The method of claim 15 wherein coupling a voltage representing said on-status bit comprises:

retrieving a signal representing said on-status bit from a memory; and

converting said signal into said voltage.

17. The method of claim 15 wherein periodically refreshing said charge is performed at a periodic interval that is a function of temperature of a die on which said circuit is disposed.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded May 29, 2018
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: MICROSEMI CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.), INC.; MICROSEMI FREQUENCY AND TIME CORPORATION; MICROSEMI COMMUNICATIONS, INC.; MICROSEMI SOC CORP.; MICROSEMI CORP. - POWER PRODUCTS GROUP; MICROSEMI CORP. - RF INTEGRATED SOLUTIONS
Reel/Frame 046251/0391 →
PATENT SECURITY AGREEMENT Recorded Feb 3, 2016
From: MICROSEMI CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.) INC. (F/K/A LEGERITY, INC., ZARLINK SEMICONDUCTOR (V.N.) INC., CENTELLAX, INC., AND ZARLINK SEMICONDUCTOR (U.S.) INC.); MICROSEMI FREQUENCY AND TIME CORPORATION (F/K/A SYMMETRICON, INC.); MICROSEMI COMMUNICATIONS, INC. (F/K/A VITESSE SEMICONDUCTOR CORPORATION); MICROSEMI SOC CORP. (F/K/A ACTEL CORPORATION); MICROSEMI CORP. - POWER PRODUCTS GROUP (F/K/A ADVANCED POWER TECHNOLOGY INC.); MICROSEMI CORP. - RF INTEGRATED SOLUTIONS (F/K/A AML COMMUNICATIONS, INC.)
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037691/0697 →
RELEASE OF SECURITY INTEREST Recorded Jan 19, 2016
From: BANK OF AMERICA, N.A.
To: MICROSEMI CORPORATION; MICROSEMI CORP.-ANALOG MIXED SIGNAL GROUP, A DELAWARE CORPORATION; MICROSEMI SOC CORP., A CALIFORNIA CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.) INC., A DELAWARE CORPORATION; MICROSEMI FREQUENCY AND TIME CORPORATION, A DELAWARE CORPORATION; MICROSEMI COMMUNICATIONS, INC. (F/K/A VITESSE SEMICONDUCTOR CORPORATION), A DELAWARE CORPORATION; MICROSEMI CORP.-MEMORY AND STORAGE SOLUTIONS (F/K/A WHITE ELECTRONIC DESIGNS CORPORATION), AN INDIANA CORPORATION
Reel/Frame 037558/0711 →
CHANGE OF NAME Recorded Dec 28, 2015
From: ACTEL CORPORATION
To: MICROSEMI SOC CORP.
Reel/Frame 037393/0562 →
NOTICE OF SUCCESSION OF AGENCY Recorded Apr 9, 2015
From: ROYAL BANK OF CANADA (AS SUCCESSOR TO MORGAN STANLEY & CO. LLC)
To: BANK OF AMERICA, N.A., AS SUCCESSOR AGENT
Reel/Frame 035657/0223 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2011
From: WHITE ELECTRONIC DESIGNS CORP.; ACTEL CORPORATION; MICROSEMI CORPORATION
To: MORGAN STANLEY & CO. INCORPORATED
Reel/Frame 025783/0613 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 29, 2003
From: MCCOLLUM, JOHN; BELLIPPADY, VIDYA; BAKKER, GREGORY
To: ACTEL CORPORATION
Reel/Frame 014834/0456 →