IP Library Granted Patent US 7,384,149
Granted Patent B2
US 7,384,149 · App. 10/623,180 · Granted Jun 10, 2008

Lithographic projection apparatus, gas purging method and device manufacturing method and purge gas supply system

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Quick Facts
Patent No.
US 7,384,149
App. No.
10/623,180
Granted
Jun 10, 2008
Kind
B2
Abstract

A lithographic projection apparatus includes a support configured to support a patterning device, the patterning device configure to pattern the projection beam according to a desired patter. The apparatus has a substrate table configure to hold a substrate, a projection system configured to project the patterned beam onto a target portion of the substrate. The apparatus also has a purge gas supply system configured to provide a purge gas near a surface of a component of the lithographic projection apparatus. The purge gas supply system includes a purge gas mixture generator configured to generate a purge gas mixture which includes at least one purging gas and a moisture. The purge gas mixture generator has a moisturizer configured to add the moisture to the purge gas and a purge gas mixture outlet connected to the purge gas mixture generator configured to supply the purge gas mixture near the surface.

Claims (35)

1. A lithographic projection apparatus, comprising:

an illuminator configured to condition a beam of radiation;

a support configured to support a patterning device, the patterning device configured to pattern the beam according to a desired pattern;

a substrate table configured to hold a substrate;

a projection system configured to project the patterned beam onto a target portion of the substrate; and

at least one purge gas supply system configured to provide a purge gas to at least part of the lithographic projection apparatus, the at least one purge gas supply system comprising:

a purge gas mixture generator comprising a moisturizer configured to add moisture to a purge gas, the purge gas mixture generator configured to generate a purge gas mixture, which gas mixture comprises at least one purge gas and the moisture, wherein the moisturizer comprises a vessel with at least one gas inlet and gas outlet, the at least one gas inlet and gas outlet being connected to each other via a moisturizing connection, such that in case a purge gas flows through the moisturizing connection, the purge gas is fed through a liquid present in the vessel and the purge gas is moisturized;

a purge gas mixture outlet connected to the purge gas mixture generator configured to supply the purge gas mixture to the at least part of the lithographic projection apparatus; and

a dry gas inlet configured to mix a non-moisturized purge gas with the moisturized purge gas fed through the liquid to thereby obtain the purge gas mixture.

2. A lithographic projection apparatus according to claim 1 , wherein the moisturizing connection is a saturating connection configured to feed the purge gas through the liquid such that the purge gas is moisturized to saturation with the moisture.

3. A lithographic projection apparatus according to claim 1 , further comprising a control device connected to the vessel configured to control at least an amount of moisture present in the purge gas mixture.

4. A lithographic projection apparatus according to claim 1 , wherein the purge gas mixture generator further comprises at least one regenerable filter device configured to filter at least one undesired component out of at least one of: the purge gas, the moisture or the purge gas mixture.

5. A lithographic projection apparatus according to claim 4 , wherein the at least one regenerable filter device comprises two regenerable filter devices connected in parallel, the filter devices can be regenerated in an alternating manner to allow continuous filtering.

6. A lithographic projection apparatus according to claim 1 , wherein the purge gas supply system further comprises a purge gas outlet configured to provide the purge gas substantially without moisture to another part of the lithographic projection apparatus.

7. A lithographic projection apparatus according to claim 1 , wherein the moisture includes water vapor.

8. A lithographic projection apparatus according to claim 7 , wherein the purge gas mixture contains between at least 20% and not more than 70% relative humidity water vapor.

9. A lithographic projection apparatus according to claim 8 , configured to a purge gas mixture flow rate of at least 20 liters per minute.

10. A lithographic projection apparatus according to claim 1 , further comprising:

a heater or heat exchanger; and

a control device connected to the heater or heat exchanger to control a temperature of the liquid.

11. A lithographic projection apparatus according to claim 1 , wherein the dry gas inlet is connected to the at least one gas outlet.

12. A purge gas supply system for providing a purge gas to at least part of a lithographic projection apparatus, the purge gas supply system comprising:

a purge gas mixture generator comprising a moisturizer configured to add moisture to a purge gas, the purge gas mixture generator configured to generate a purge gas mixture including at least one purging gas and the moisture, wherein the moisturizer comprises a vessel with at least one gas inlet and gas outlet, the at least one gas inlet and gas outlet being connected to each other via a moisturizing connection, such that in case a purge gas flows through the moisturizing connection, the purge gas is fed through a liquid present in the vessel and the purge gas is moisturized;

a purge gas outlet configured to supply the purge gas mixture to the at least part of the lithographic projection apparatus;

a dry gas inlet configured to mix a non-moisturized purge gas with the moisturized purge gas fed through the liquid to thereby obtain the purge gas mixture.

13. A purge supply system according to claim 12 , wherein the moisturizing connection is a saturating connection configured to feed the purge gas through the liquid such that the purge gas is moisturized to saturation with the moisture.

14. A purge gas supply system according to claim 12 , further comprising a control device connected to the vessel configured to control at least an amount of moisture present in the purge gas mixture.

15. A purge gas supply system according to claim 12 , wherein the purge gas mixture generator further comprises at least one regenerable filter device configured to filter at least one undesired component out of at least one of: the purge gas, the moisture or the purge gas mixture.

16. A purge gas supply system according to claim 15 , wherein the at least one regenerable filter device comprises two regenerable filter devices connected in parallel, the filter devices can be regenerated in an alternating manner to allow continuous filtering.

17. A purge gas supply system according to claim 12 , wherein the moisture includes water vapor.

18. A purge gas supply system according to claim 12 , wherein the purge gas mixture contains between at least 20% and not more than 70% relative humidity water vapor.

19. A purge gas supply system according to claim 18 , configured to a purge gas mixture flow rate of at least 20 liters per minute.

20. A purge gas supply system according to claim 12 , further comprising:

a heater or heat exchanger; and

a control device connected to the heater or heat exchanger to control a temperature of the liquid.

Assignments (10)
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
ASSIGNMENT OF PATENT SECURITY INTEREST RECORDED AT REEL/FRAME 048811/0679 Recorded Nov 5, 2019
From: GOLDMAN SACHS BANK USA
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 050965/0035 →
SECURITY INTEREST Recorded Nov 13, 2018
From: ENTEGRIS, INC.; SAES PURE GAS, INC.
To: GOLDMAN SACHS BANK USA
Reel/Frame 048811/0679 →
RELEASE OF SECURITY INTEREST Recorded Nov 8, 2018
From: GOLDMAN SACHS BANK USA, AS COLLATERAL AGENT
To: ENTEGRIS, INC.; POCO GRAPHITE, INC.; ATMI, INC.; ATMI PACKAGING, INC.; ADVANCED TECHNOLOGY MATERIALS, INC.
Reel/Frame 047477/0151 →
RELEASE OF SECURITY INTEREST Recorded Nov 8, 2018
From: GOLDMAN SACHS BANK USA, AS COLLATERAL AGENT
To: ENTEGRIS, INC.; POCO GRAPHITE, INC.; ATMI, INC.; ATMI PACKAGING, INC.; ADVANCED TECHNOLOGY MATERIALS, INC.
Reel/Frame 047477/0032 →
SECURITY INTEREST Recorded May 2, 2014
From: ENTEGRIS, INC.; POCO GRAPHITE, INC.; ATMI, INC.; ADVANCED TECHNOLOGY MATERIALS, INC.; ATMI PACKAGING, INC.
To: GOLDMAN SACHS BANK USA, AS COLLATERAL AGENT
Reel/Frame 032812/0192 →
SECURITY INTEREST Recorded May 1, 2014
From: ENTEGRIS, INC.; POCO GRAPHITE, INC.; ATMI, INC.; ADVANCED TECHNOLOGY MATERIALS, INC.; ATMI PACKAGING, INC.
To: GOLDMAN SACHS BANK USA, AS COLLATERAL AGENT
Reel/Frame 032815/0852 →
MERGER Recorded Jul 28, 2006
From: MYKROLIS CORPORATION
To: ENTEGRIS, INC.
Reel/Frame 018026/0873 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 2, 2005
From: AERONEX, INC.
To: MYKROLIS CORPORATION
Reel/Frame 016186/0121 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 25, 2004
From: VAN DER NET, ANTONIUS JOHANNNES; VAN BRAGT, JOHANNUS JOSEPHUS; SPIEGELMAN, JEFFREY J.
To: AERONEX, INC.; ASML NETHERLANDS B.V.
Reel/Frame 015016/0285 →