Autonomous self-monitoring and corrective operation of an integrated circuit
View Patent ↗Disclosed is a method and apparatus for autonomously self-monitoring and self-adjusting the operation of an integrated circuit device throughout the integrated circuit device's useful life. The invention periodically performs performance self-testing on the integrated circuit device throughout the integrated circuit devices useful life. The invention also evaluates whether results from the self-testing are within acceptable limits and self-adjusts parameters of the integrated circuit device until the results from the self-testing are within the acceptable limits.
1. An autonomously self-monitoring and self-correcting integrated circuit device comprising:
a self testing controller that periodically and autonomously performs on-chip performance self-testing of said integrated circuit device, said performance self-testing comprising autonomous application of functional test sequences to said integrated circuit device until failure;
a comparator that evaluates whether results from said self testing are within acceptable limits; and
a processor that autonomously adjusts parameters of said integrated circuit device until said results from said self-testing are within said acceptable limits.
2. The integrated circuit in claim 1 , further comprising one or more of a built-in self test (BIST) unit and a functional testing unit.
3. The integrated circuit in claim 2 , said functional testing unit applies said functional test sequences to said integrated circuit device until failure, and said comparator compares the failure frequency against predetermined limits.
4. The integrated circuit in claim 1 , said processor further adjusts said parameters by altering the voltage supplied to portions of said integrated circuit device.
5. The integrated circuit in claim 1 , further comprising electronic fuses, said processor further activates said electronic fuses to permanently change said parameters of said integrated circuit device.
6. The integrated circuit in claim 1 , said processor further adjusts said parameters by permanently altering the voltage produced by voltage regulators.
7. The integrated circuit in claim 1 , further comprising a permanent storage device that maintains a history of adjustments made to said parameters by said processor.
8. An autonomously self-monitoring and self-correcting integrated circuit device comprising:
a self testing controller that periodically performs on-chip performance self-testing of said integrated circuit device throughout the useful life of said integrated circuit device, said performance self-testing comprising application of functional test sequences to said integrated circuit device until failure;
a comparator that evaluates whether results from said self testing are within acceptable limits; and
a processor that permanently self-adjusts parameters of said integrated circuit device by altering the voltage supplied to portions of said integrated circuit device until said results from said self-testing are within said acceptable limits.
9. The integrated circuit in claim 8 , further comprising one or more of a built-in self test (BIST) unit and a functional testing unit.
10. The integrated circuit in claim 9 , said functional testing unit applies said functional test sequences to said integrated circuit device until failure, and said comparator compares the failure frequency against predetermined limits.
11. The integrated circuit in claim 8 , further comprising electronic fuses, said processor further activates said electronic fuses to permanently change said parameters of said integrated circuit device.
12. The integrated circuit in claim 8 , said processor further adjusts said parameters by permanently altering the voltage produced by voltage regulators.
13. The integrated circuit in claim 8 , further comprising a permanent storage device that maintains a history of adjustments made to said parameters by said processor.
14. A method of continuously and autonomously self-monitoring and self-adjusting the operation of an integrated circuit device, said method comprising:
periodically performing, by said integrated circuit device, on-chip performance self-testing of said integrated circuit device,
said integrated circuit device comprises a product to be tested and
said performing of said performance self-testing comprises applying functional test sequences to said integrated circuit device until failure;
self-evaluating, by said integrated circuit device, whether results from said self-testing are within acceptable limits; and
self-adjusting, by said integrated circuit device, parameters of said integrated circuit device until said results from said self-testing are within said acceptable limits.
15. The method in claim 14 , said performance testing comprising one of built-in self testing (BIST) and functional testing.
16. The method in claim 15 , said functional testing comprising looping through functional test sequences until failure, and said evaluating of said results compares the failure frequency against predetermined limits.
17. The method in claim 14 , said process of adjusting said parameters comprises altering the voltage supplied to portions of said integrated circuit device.
18. The method in claim 14 , said process of adjusting said parameters comprises activating electronic fuses to permanently change said parameters of said integrated circuit device.
19. The method in claim 14 , said process of adjusting said parameters comprises permanently altering the voltage produced by voltage regulators.
20. The method in claim 14 , further comprising maintaining a history of adjustments made to said parameters during said adjusting process.
21. A method of continuously and autonomously self-monitoring and self-adjusting the operation of an integrated circuit device throughout the useful life of said integrated circuit device, said method comprising:
periodically performing, by said integrated circuit device, on-chip performance self-testing of said integrated circuit device throughout said useful life of said integrated circuit device,
said integrated circuit device comprises a product to be tested and
said performing of said performance self-testing comprises applying functional test sequences to said integrated circuit device until failure;
self-evaluating, by said integrated circuit device, whether results from said self-testing are within acceptable limits; and
permanently self-adjusting, by said integrated circuit device, parameters of said integrated circuit device by altering the voltage supplied to portions of said integrated circuit device until said results from said self-testing are within said acceptable limits.
22. The method in claim 21 , said performance self testing comprising one of built-in self testing (BIST) and functional testing.
23. The method in claim 22 , said functional testing comprising looping through functional test sequences until failure, and said evaluating of said results compares the failure frequency against predetermined limits.
24. The method in claim 21 , said process of self-adjusting said parameters comprises altering the voltage supplied to portions of said integrated circuit device.
25. The method in claim 21 , said process of self-adjusting said parameters comprises activating electronic fuses to permanently change said parameters of said integrated circuit device.
26. The method in claim 21 , said process of self-adjusting said parameters comprises permanently altering the voltage produced by voltage regulators.
27. The method in claim 21 further comprising maintaining a history of adjustments made to said parameters during said self-adjusting process.