IP Library Granted Patent US 7,056,770
Granted Patent B2
US 7,056,770 · App. 10/719,379 · Granted Jun 6, 2006

Method of resin encapsulation, apparatus for resin encapsulation, method of manufacturing semiconductor device, semiconductor device and resin material

Assignees: Towa Corporation; Fujitsu Limited
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Quick Facts
Patent No.
US 7,056,770
App. No.
10/719,379
Granted
Jun 6, 2006
Kind
B2
Abstract

First, a board is placed on a board mounting portion with a lower mold and an upper mold being opened. Then, a resin material having such size and shape that correspond to the size and shape of a cavity formed in the lower mold is fitted in the cavity. Thereafter, the resin material is heated resulting in melted resin. Thereafter, the lower mold and the upper mold are closed, with a space formed by the upper mold and the lower mold being reduced in pressure. As a result, chips and wires are immersed in the melted resin. Thereafter, the melted resin is set, so that a resin mold product including the board and the set resin is formed.

Claims (24)

1. A method of resin-encapsulating an electronic component mounted on a main surface of a board, using a mold pair having an upper mold and a lower mold, comprising the steps of:

attaching said board on said upper mold;

generating melted resin in a cavity provided in said lower mold solely by melting a solid resin material in said lower mold cavity;

immersing said electronic component in said melted resin in said lower mold cavity by closing said mold pair; and

forming a resin molded product including said electronic component encapsulated in a set resin by setting said melted resin in said lower mold cavity to produce said set resin only from said melted resin that was generated from said solid resin material in said lower mold cavity.

2. The method of resin encapsulation according to claim 1 , further comprising, before said step of generating melted resin, another step of placing said solid resin material in said lower mold cavity.

3. The method of resin encapsulation according to claim 1 , wherein

an electrode of said board and an electrode of said electronic component are connected by a conductive material forming a loop in a prescribed plane; and

in said step of immersing said electronic component in said melted resin, said prescribed plane moves substantially vertically to a main surface of said melted resin.

4. A method of manufacturing a semiconductor device, using the method of resin encapsulation according to claim 1 .

5. A method of resin-encapsulating an electronic component mounted on a main surface of a board, using a mold pair having an upper mold and a lower mold and a solid resin material for resin encapsulation, comprising the steps of:

placing said board on said lower mold;

placing said solid resin material on a main surface of said board such that said solid resin material is not in contact with a conductive material connecting an electrode of said board with an electrode of said electronic component;

closing said mold pair to form a mold cavity between said upper and lower molds;

generating melted resin on the main surface of said board and enclosing said electronic component in said melted resin only by heating and melting only said solid resin material in said mold cavity; and

forming a resin mold product by setting only said melted resin that was generated from said solid resin material in said mold cavity.

6. The method of resin encapsulation according to claim 5 , wherein

said solid resin material has such a size and a shape that correspond to a size and a shape of said cavity; and

said melted resin is generated by heat transmitted from said upper mold to said solid resin material.

7. The method of resin encapsulation according to claim 5 , wherein

said solid resin material is formed such that a space formed by said board and said solid resin material encloses said electronic component, when said solid resin material is placed on the main surface of said board; and

said space is set to have such a size that said solid resin material is not in contact with the conductive material connecting the electrode of said board with the electrode of said electronic component.

8. A method of manufacturing a semiconductor device, using the method of resin encapsulation according to claim 5 .

9. The method of resin encapsulation according to claim 1 , wherein said step of placing said solid resin material in said cavity comprises transporting and depositing said solid resin material into said cavity using a vacuum-holding conveyor.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 22, 2016
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 037786/0316 →
CHANGE OF NAME Recorded Aug 3, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024776/0288 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 13, 2009
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 022248/0521 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 20, 2003
From: URAGAMI, HIROSHI; NAKAGAWA, OSAMU; FUJINO, KINYA; TAKASE, SHINJI; TOKUYAMA, HIDEKI; MEGURO, KOICHI; NISHINO, TORU; HAYASAKA, NOBORU
To: TOWA CORPORATION; FUJITSU LIMITED
Reel/Frame 014736/0880 →
Priority Claims (1)
JP 2002-341965 · Nov 26, 2002 · national
Continuity (1)
Related Publication 20040101631A1 · May 27, 2004