IP Library Granted Patent US 6,946,726
Granted Patent B1
US 6,946,726 · App. 10/724,530 · Granted Sep 20, 2005

Chip carrier substrate with a land grid array and external bond terminals

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Quick Facts
Patent No.
US 6,946,726
App. No.
10/724,530
Filed
Nov 26, 2003
Granted
Sep 20, 2005
Kind
B1
Examiner
HUYNH, ANDY
Art Unit
2818
USPC
257/693
Abstract

A carrier for a semiconductor die has a substrate with a cavity formed in the substrate. The cavity has a bottom and sidewalls, and the sidewalls have a stepped tier. Electrically conductive contacts are disposed on an underside of the substrate. Electrically conductive tabs are disposed on the stepped tier, and electrically conductive external bond terminals are disposed on an edge of the substrate. Electrically conductive paths are formed in the substrate and electrically coupled between the electrically conductive tabs, the electrically conductive contacts, and the electrically conductive external bond terminals.

Claims (27)

1. A carrier for a semiconductor die comprising:

a substrate having a cavity formed in said substrate, said cavity having a bottom and sidewalls, said sidewalls having a stepped tier;

a plurality of electrically conductive contacts on an underside of said substrate;

a plurality of electrically conductive tabs disposed on said stepped tier;

a plurality of electrically conductive external bond terminals disposed on an edge of said substrate; and

a plurality of electrically conductive paths formed in said substrate and electrically coupled between said electrically conductive tabs, said electrically conductive contacts, and said electrically conductive external bond terminals.

2. A carrier for a semiconductor die as in claim 1 , wherein said substrate is formed from a multilayer of ceramic substrates.

3. A carrier for a semiconductor die as in claim 1 , wherein said substrate is formed from laminates of organic dielectrics.

4. A carrier for a semiconductor die as in claim 1 , wherein said substrate is formed from deposited thin film layers.

5. A carrier for a semiconductor die as in claim 1 further including a sealing lid disposed on said substrate and covering said cavity.

6. A carrier for a semiconductor die as in claim 1 further including a plurality of wires electrically coupled between the semiconductor die and the plurality of electrically conductive tabs.

7. A carrier for a semiconductor die as in claim 1 wherein said plurality of electrically conductive external bond terminals disposed on an edge of said substrate are disposed on a ledge in a recess formed in said edge of said substrate.

8. A carrier for a semiconductor die as in claim 1 wherein said plurality of electrically conductive paths are formed from conductive vias and conductive lines in said substrate.

9. A carrier for a semiconductor die as in claim 1 wherein said sidewalls have a plurality of stepped tiers and said plurality of electrically conductive tabs are disposed on said plurality of stepped tiers.

10. A carrier for a semiconductor die comprising:

a substrate having an upper surface and a lower surface;

a plurality of electrically conductive surface contacts disposed on said upper surface of said substrate;

a plurality of electrically conductive contacts on an underside of said substrate;

a plurality of electrically conductive external bond terminals disposed on an edge of said substrate; and

a plurality of electrically conductive paths formed in said substrate and electrically coupled between said electrically conductive surface contacts, said electrically conductive contacts, and said electrically conductive external bond terminals.

11. A carrier for a semiconductor die as in claim 10 , wherein said substrate is formed from a multilayer of ceramic substrates.

12. A carrier for a semiconductor die as in claim 10 , wherein said substrate is formed from laminates of organic dielectrics.

13. A carrier for a semiconductor die as in claim 10 , wherein said substrate is formed from deposited thin film layers.

14. A carrier for a semiconductor die as in claim 10 further including a cover disposed on said substrate and covering the semiconductor die.

15. A carrier for a semiconductor die as in claim 10 wherein the semiconductor die has a plurality of semiconductor die contacts electrically connected to said plurality of electrically conductive surface contacts.

16. A carrier for a semiconductor die as in claim 10 wherein said plurality of electrically conductive external bond terminals disposed on an edge of said substrate are disposed on a ledge in a recess formed in said edge of said substrate.

17. A carrier for a semiconductor die as in claim 10 wherein said plurality of electrically conductive paths are formed from conductive vias and conductive lines in said substrate.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded May 29, 2018
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: MICROSEMI CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.), INC.; MICROSEMI FREQUENCY AND TIME CORPORATION; MICROSEMI COMMUNICATIONS, INC.; MICROSEMI SOC CORP.; MICROSEMI CORP. - POWER PRODUCTS GROUP; MICROSEMI CORP. - RF INTEGRATED SOLUTIONS
Reel/Frame 046251/0391 →
PATENT SECURITY AGREEMENT Recorded Feb 3, 2016
From: MICROSEMI CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.) INC. (F/K/A LEGERITY, INC., ZARLINK SEMICONDUCTOR (V.N.) INC., CENTELLAX, INC., AND ZARLINK SEMICONDUCTOR (U.S.) INC.); MICROSEMI FREQUENCY AND TIME CORPORATION (F/K/A SYMMETRICON, INC.); MICROSEMI COMMUNICATIONS, INC. (F/K/A VITESSE SEMICONDUCTOR CORPORATION); MICROSEMI SOC CORP. (F/K/A ACTEL CORPORATION); MICROSEMI CORP. - POWER PRODUCTS GROUP (F/K/A ADVANCED POWER TECHNOLOGY INC.); MICROSEMI CORP. - RF INTEGRATED SOLUTIONS (F/K/A AML COMMUNICATIONS, INC.)
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037691/0697 →
RELEASE OF SECURITY INTEREST Recorded Jan 19, 2016
From: BANK OF AMERICA, N.A.
To: MICROSEMI CORPORATION; MICROSEMI CORP.-ANALOG MIXED SIGNAL GROUP, A DELAWARE CORPORATION; MICROSEMI SOC CORP., A CALIFORNIA CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.) INC., A DELAWARE CORPORATION; MICROSEMI FREQUENCY AND TIME CORPORATION, A DELAWARE CORPORATION; MICROSEMI COMMUNICATIONS, INC. (F/K/A VITESSE SEMICONDUCTOR CORPORATION), A DELAWARE CORPORATION; MICROSEMI CORP.-MEMORY AND STORAGE SOLUTIONS (F/K/A WHITE ELECTRONIC DESIGNS CORPORATION), AN INDIANA CORPORATION
Reel/Frame 037558/0711 →
CHANGE OF NAME Recorded Dec 28, 2015
From: ACTEL CORPORATION
To: MICROSEMI SOC CORP.
Reel/Frame 037393/0562 →
NOTICE OF SUCCESSION OF AGENCY Recorded Apr 9, 2015
From: ROYAL BANK OF CANADA (AS SUCCESSOR TO MORGAN STANLEY & CO. LLC)
To: BANK OF AMERICA, N.A., AS SUCCESSOR AGENT
Reel/Frame 035657/0223 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2011
From: WHITE ELECTRONIC DESIGNS CORP.; ACTEL CORPORATION; MICROSEMI CORPORATION
To: MORGAN STANLEY & CO. INCORPORATED
Reel/Frame 025783/0613 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 5, 2004
From: KUANG, RAYMOND
To: ACTEL CORPORATION
Reel/Frame 015289/0788 →