IP Library Granted Patent US 7,085,127
Granted Patent B2
US 7,085,127 · App. 10/792,639 · Granted Aug 1, 2006

Surface mount chip capacitor

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Quick Facts
Patent No.
US 7,085,127
App. No.
10/792,639
Granted
Aug 1, 2006
Kind
B2
Abstract

The surface mount chip capacitor of the present invention includes a wire and a conductive powder element electrically connected to the wire. The surface mount chip capacitor has insulative material surrounding at least a portion of the conductive powder element and the wire extending from the conductive powder element. A first terminal is formed on the surface mount chip capacitor at the first end surface of the wire and a second terminal is formed by being electrically connected to the conductive powder element. The surface mount chip capacitor of the present invention is created by methods which include the steps of forming a wire and placing conductive powder upon the wire. An embodiment of the present invention, presses the wire from a foil sheet and electrophoretically depositing the conductive powder element upon the wire.

Claims (44)

1. A surface mount chip capacitor comprising:

a wire having opposite first and second ends and side surfaces;

a conductive powder element electrically connected to the wire and covering the second end and a portion of the wire side surfaces;

insulative material surrounding at least a portion of the conductive powder element and a portion of the wire side surfaces;

a layer of conductive material over the wire first end and an exterior surface of the insulative material adjacent a first end of the conductive powder element;

a first terminal formed by a first body of conductive material disposed over the first end of the wire and a portion of the insulating material; and

a second terminal formed by a second body of conductive material disposed over and being electrically connected to a second end of the conductive powder element.

2. The surface mount chip capacitor of claim 1 wherein the first terminal is an anode and the second terminal is a cathode end.

3. The surface mount chip capacitor of claim 1 wherein the conductive powder element is made of powder.

4. The surface mount chip capacitor of claim 3 wherein the powder is from the group consisting of: Ta, Nb, Hf, Zr, Ti, V, W, Be, and Al.

5. The surface mount chip capacitor of claim 3 wherein the powder is a substrate of a metal from the group consisting of: Ta, Nb, Hf, Zr, Ti, V, W, Be, and Al.

6. The surface mount chip capacitor of claim 3 wherein the powder has been electrophoretically deposited upon the wire.

7. The surface mount chip capacitor of claim 1 wherein the conductive powder element has a density between 3–8 g/cc.

8. The surface mount chip capacitor of claim 1 wherein the conductive powder element has a capacitance-voltage between 10 CV and 150 KCV.

9. A surface mount chip capacitor comprising:

a wire having opposite first and second ends and side surfaces;

a conductive powder element upon the wire covering the second end and a portion of the wire side surfaces, the conductive powder element having a cathode end, an anode end, and conductive powder element sides extending between the anode and cathode ends;

an insulation material over the anode end and the conductive powder element to create a layer of the insulation material exterior of, and in covering relation over the anode end and the conductive powder element sides, whereby the wire extends through and has a protruding wire portion protruding from an exterior surface of the layer of insulation material;

an anode layer of conductive material over the wire first end and the exterior surface of the insulation material adjacent the anode end of the conductive powder element so that the anode layer of conductive material is in electrical contact with and covers the wire first end;

a conductive anode termination cap in covering relation over, and in electrical contact with, the anode layer of conductive material, whereby electrical continuity is achieved from the anode end of the conductive powder element, through the wire and the anode layer of conductive material to the conductive anode termination cap;

a cathode layer of conductive material over at least a portion of the cathode end of the conductive powder element;

a conductive cathode termination cap in covering relation over, and in electrical contact with, the cathode end of the conductive powder element.

10. The surface mount chip capacitor of claim 9 wherein the conductive powder element is made of powder.

11. The surface mount chip capacitor of claim 10 wherein the powder is from the group consisting of: Ta, Nb, Hf, Zr, Ti, V, W, Be, and Al.

12. The surface mount chip capacitor of claim 10 wherein the powder is a substrate of a metal from the group consisting of: Ta, Nb, Hf, Zr, Ti, V, W, Be, and Al.

13. The surface mount chip capacitor of claim 10 wherein the powder has been electrophoretically deposited upon the wire.

14. The surface mount chip capacitor of claim 9 wherein the conductive powder element has a density between 3–8 g/cc.

15. The surface mount chip capacitor of claim 9 wherein the conductive powder element has a capacitance-voltage between 10 CV and 150 KCV.

16. The surface mount chip capacitor of claim 9 wherein the wire is formed by pressing foil.

17. The surface mount chip capacitor of claim 16 wherein the foil may be received into a reel to reel process.

18. A surface mount chip capacitor comprising:

a wire having opposite first and second ends and side surfaces;

a conductive powder element electrically connected to the wire and covering the second end and a portion of the wire side surfaces;

insulative material surrounding at least a portion of the conductive powder element and a portion of the wire,

a first terminal formed by a first body of conductive material disposed over the first end of the wire and a portion of the insulative material;

a second terminal formed by a second body of conductive material disposed over and being electrically connected to the second end of the conductive powder element; and

wherein said first terminal and said second terminal are separated by the insulative material and share a common outer perimeter with the insulative material.

19. The surface mount chip capacitor of claim 18 wherein the first terminal is an anode and the second terminal is a cathode end.

20. The surface mount chip capacitor of claim 18 wherein the conductive powder element is made of powder.

21. The surface mount chip capacitor of claim 20 wherein the powder is from the group consisting of: Ta, Nb, Hf, Zr, Ti, V, W, Be, and Al.

22. The surface mount chip capacitor of claim 20 wherein the powder is a substrate of a metal from the group consisting of: Ta, Nb, Hf, Zr, Ti, V, W, Be, and Al.

23. The surface mount chip capacitor of claim 20 wherein the powder has been electrophoretically deposited upon the wire.

24. The surface mount chip capacitor of claim 18 wherein the conductive powder element has a density between 3–8 g/cc.

25. The surface mount chip capacitor of claim 18 wherein the conductive powder element has a capacitance-voltage between 10 CV and 150 KCV.

Assignments (6)
RELEASE OF SECURITY INTEREST Recorded Jul 17, 2019
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: VISHAY DALE ELECTRONICS, INC.; DALE ELECTRONICS, INC.; VISHAY INTERTECHNOLOGY, INC.; SILICONIX INCORPORATED; VISHAY SPRAGUE, INC.; VISHAY TECHNO COMPONENTS, LLC; VISHAY EFI, INC.; VISHAY VITRAMON, INC.; SPRAGUE ELECTRIC COMPANY
Reel/Frame 049826/0312 →
SECURITY INTEREST Recorded Jun 12, 2019
From: VISHAY DALE ELECTRONICS, INC.; DALE ELECTRONICS, INC.; VISHAY DALE ELECTRONICS, LLC; VISHAY-DALE, INC.; VISHAY INTERTECHNOLOGY, INC.; SILICONIX INCORPORATED; VISHAY-SILICONIX, INC.; VISHAY-SILICONIX; VISHAY SPRAGUE, INC.; VISHAY EFI, INC.; SPRAGUE ELECTRIC COMPANY; VISHAY GENERAL SEMICONDUCTOR, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 049440/0876 →
SECURITY AGREEMENT Recorded Jan 21, 2011
From: VISHAY INTERTECHNOLOGY, INC.; VISHAY DALE ELECTRONICS, INC.; SILICONIX INCORPORATED; VISHAY SPRAGUE, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 025675/0001 →
RELEASE OF SECURITY INTEREST Recorded Dec 14, 2010
From: COMERICA BANK, AS AGENT, A TEXAS BANKING ASSOCIATION (FORMERLY A MICHIGAN BANKING CORPORATION)
To: VISHAY SPRAGUE, INC., SUCCESSOR-IN-INTEREST TO VISHAY EFI, INC. AND VISHAY THIN FILM, LLC, A DELAWARE CORPORATION; VISHAY DALE ELECTRONICS, INC., A DELAWARE CORPORATION; VISHAY INTERTECHNOLOGY, INC., A DELAWARE CORPORATION; SILICONIX INCORPORATED, A DELAWARE CORPORATION; VISHAY MEASUREMENTS GROUP, INC., A DELAWARE CORPORATION; VISHAY GENERAL SEMICONDUCTOR, LLC, F/K/A GENERAL SEMICONDUCTOR, INC., A DELAWARE LIMITED LIABILITY COMPANY; VISHAY VITRAMON, INCORPORATED, A DELAWARE CORPORATION; YOSEMITE INVESTMENT, INC., AN INDIANA CORPORATION
Reel/Frame 025489/0184 →
SECURITY AGREEMENT Recorded Mar 2, 2010
From: VISHAY SPRAGUE, INC., SUCCESSOR IN INTEREST TO VISHAY EFI, INC. AND VISHAY THIN FILM, LLC; VISHAY DALE ELECTRONICS, INC.; VISHAY INTERTECHNOLOGY, INC.; SILICONIX INCORPORATED; VISHAY MEASUREMENTS GROUP, INC.
To: COMERICA BANK, AS AGENT
Reel/Frame 024006/0515 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 15, 2004
From: GOLDBERGER, HAIM; EIDELMAN, ALEX; AGULYANSKY, DR. ANATOLY; SKATKOV, DR. ILIA
To: VISHAY SPRAGUE, INC.
Reel/Frame 015357/0244 →