IP Library Granted Patent US 7,008,820
Granted Patent B2
US 7,008,820 · App. 10/866,561 · Granted Mar 7, 2006

Chip scale package with open substrate

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,008,820
App. No.
10/866,561
Granted
Mar 7, 2006
Kind
B2
Abstract

A method for manufacturing an integrated circuit package comprises forming a substrate by forming a core layer with a through opening and vias. A first conductive layer is formed on the core layer covering the through opening and a second conductive layer is formed on the core layer opposite the first conductive layer in the through opening and in the vias contacting the first conductive layer. An integrated circuit die is bonded to the second conductive layer and in the through opening. Connections are formed between the integrated circuit die and the second conductive layer, and the integrated circuit die and the connections are encapsulated.

Claims (43)

1. A method of manufacturing an integrated circuit package comprising:

forming a substrate including:

forming a core layer;

forming a through opening and vias in the core layer;

forming a first conductive layer on the core layer covering the through opening;

forming a second conductive layer on the core layer opposite the first conductive layer, the second conductive layer formed in the through opening and in the vias contacting the first conductive layer;

bonding an integrated circuit die to the second conductive layer and in the through opening;

forming connections between the integrated circuit die and the second conductive layer; and

encapsulating the integrated circuit die and the connections.

2. The method as claimed in claim 1 wherein:

forming the first conductive layer into terminals and a ground or thermal pad, the terminals extending out from the core layer; and

forming the second conductive layer into an integrated circuit die bonded portion and terminals.

3. The method as claimed in claim 1 wherein:

forming the first conductive layer into terminals and a ground or thermal pad;

forming the second conductive layer into an integrated circuit die bonded portion and terminals; and

forming the terminals of the first and second conductive layers to have a shape of at least one of square, rectangular, and round.

4. The method as claimed in claim 1 wherein:

forming the second conductive layer into terminals and a ground or thermal pad; and

further comprising:

forming solder balls connected to the terminals in a plurality of rows.

5. The method as claimed in claim 1 wherein:

forming the first conductive layer forms a ground or thermal pad;

forming the second conductive layer into an integrated circuit die bonded portion and terminals; and

further comprising:

forming solder balls connected to the terminals.

6. The method as claimed in claim 1 wherein forming the second conductive layer forms blind vias in the vias.

7. The method as claimed in claim 1 wherein forming the first conductive layer forms a plurality of rows of terminals.

8. The method as claimed in claim 1 wherein forming the first conductive layer forms a plurality of terminals having at least one shape from a rectangle, square, and circle.

9. The method as claimed in claim 1 further comprising forming a solder mask over at least one of the first and second conductive layer.

10. The method as claimed in claim 1 further comprising:

forming a second substrate including:

forming a core layer;

forming a through opening and vias in the core layer;

forming a first conductive layer on the bottom of the core layer covering the through opening;

forming a second conductive layer on the top of the core layer, the second conductive layer formed in the through opening and in the vias contacting the first conductive layer, the second conductive layer in the vias formed into terminals;

bonding a second integrated circuit die to the second conductive layer of the second substrate and in the through opening thereof;

forming second connections bonding the integrated circuit die to the second conductive layer of the second substrate;

encapsulating the second integrated circuit die and the second connections; and

wherein:

forming the first substrate includes the first conductive layer thereof formed into terminals extending from the core layer thereof;

forming the first and second substrates are bonded with the terminals of the first and second substrates electrically connected.

11. The method as claimed in claim 10 wherein:

bonding the first and second substrates by at least one of solder, solder balls, conductive adhesive, or a combination thereof.

Assignments (6)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S NAME PREVIOUSLY RECORDED AT REEL: 038378 FRAME: 0400. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Sep 5, 2023
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 064806/0593 →
RELEASE OF SECURITY INTEREST Recorded Jun 16, 2020
From: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
To: STATS CHIPPAC, INC.; STATS CHIPPAC PTE. LTD. FORMERLY KNOWN AS STATS CHIPPAC LTD.
Reel/Frame 052950/0497 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0400 →
CHANGE OF NAME Recorded Aug 6, 2015
From: ST ASSEMBLY TEST SERVICES LTD.
To: STATS CHIPPAC LTD.
Reel/Frame 036286/0590 →
SECURITY INTEREST Recorded Aug 6, 2015
From: STATS CHIPPAC, INC.; STATS CHIPPAC LTD.
To: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
Reel/Frame 036288/0748 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 29, 2004
From: SHIM, IL KWON; TAN, KWEE LAN; LI, JIAN JUN; FILOTEO, JR., DARIO S.
To: ST ASSEMBLY TEST SERVICES LTD.
Reel/Frame 015200/0096 →