IP Library Granted Patent US 7,022,581
Granted Patent B2
US 7,022,581 · App. 10/886,763 · Granted Apr 4, 2006

Interdigitaded capacitors

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Quick Facts
Patent No.
US 7,022,581
App. No.
10/886,763
Granted
Apr 4, 2006
Kind
B2
Abstract

The specification describes matched capacitor pairs that employ interconnect metal in an interdigitated form, and are made with an area efficient configuration. In addition, structural variations between capacitors in the capacitor pair are minimized to provide optimum matching. According to the invention, the capacitor pairs are interdigitated in a manner that ensures that the plates of each pair occupy common area on the substrate. Structural anomalies due to process conditions are compensated in that a given anomaly affects both capacitors in the same way. Two of the capacitor plates, one in each pair, are formed of comb structures, with the fingers of the combs interdigitated. The other plates are formed using one or more plates interleaved between the interdigitated plates.

Claims (29)

1. Method for the manufacture of a capacitor pair device, the capacitor pair device having a first capacitor and a second capacitor, comprising the steps of:

a. providing a substrate,

b. depositing an electrically conductive layer on the substrate,

c. patterning the conductive layer in a single operation to form:

i. a first conductive comb structure forming a plate of the first capacitor of the capacitor pair,

ii. a second conductive comb structure forming another plate of the second capacitor of the capacitor pair, the second conductive comb structure interdigitated with the first comb structure, and

iii. a continuous conductive runner interleaved between the first conductive comb structure and the second conductive comb structure, the continuous conductive runner forming the first capacitor with the first conductive comb structure and the second capacitor with the second conductive comb structure, thus forming the capacitor pair.

2. The method of claim 1 including the step of forming an insulating layer on the capacitor pair, and repeating steps b. and c.

3. The method of claim 1 wherein step c. includes forming interconnections to one or more elements selected from the group consisting of resistors, inductors, transistors and diodes.

4. Method for the manufacture of a capacitor pair device, the capacitor pair device having a first capacitor and a second capacitor, comprising the steps of:

a. providing a substrate,

b. depositing an electrically conductive layer on the substrate,

c. patterning the conductive layer in a single operation to form:

i. a first conductive comb structure forming another plate of the first capacitor of the capacitor pair,

ii. a second conductive comb structure forming a plate of the second capacitor of the capacitor pair, the second conductive comb structure interdigitated with the first conductive comb structure,

iii. a first continuous conductive runner interleaved between the first conductive comb structure and the second conductive comb structure, the first continuous conductive runner forming the first capacitor with the first conductive comb structure,

iv. a second continuous conductive runner parallel to the first continuous conductive runner, and interleaved between the first continuous conductive runner and the second conductive comb structure, the second continuous conductive runner forming the second capacitor with the second conductive comb structure, thus forming the capacitor pair.

5. The method of claim 4 including the step of forming an insulating layer on the capacitor pair, and repeating steps b. and c.

6. The method of claim 4 wherein step c. includes forming interconnections to one or more elements selected from the group consisting of resistors, inductors, transistors and diodes.

7. The method of claim 4 wherein step c. additionally includes forming a ground plane between the first continuous runner and the second continuous runner.

8. A method of manufacturing an integrated circuit including a capacitor pair, the capacitor pair comprising a first capacitor and a second capacitor, comprising the steps of

a. providing a substrate,

b. depositing an electrically conductive layer on the substrate,

c. patterning the conductive layer in a single operation to form:

i. a first conductive comb structure forming a plate of the first capacitor of the capacitor pair,

ii. a second conductive comb structure forming another plate of the second capacitor of the capacitor pair, the second conductive comb structure interdigitated with the first conductive comb structure, and

iii. a continuous conductive runner interleaved between the first conductive comb structure and the second conductive comb structure, the continuous conductive runner forming the first capacitor with the first comb structure and the second capacitor with the second conductive comb structure, thus forming the capacitor pair.

9. The method of claim 8 including the step of forming an insulating layer on the capacitor pair, and repeating steps b. and c.

10. The method of claim 8 wherein step c. includes forming interconnections to one or more elements selected from the group consisting of resistors, inductors, transistors and diodes.

Assignments (11)
RELEASE OF SECURITY INTEREST Recorded Apr 15, 2022
From: CORTLAND CAPITAL MARKET SERVICES LLC
To: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
Reel/Frame 059720/0719 →
SECURITY INTEREST Recorded Apr 15, 2022
From: CORTLAND CAPITAL MARKET SERVICES LLC
To: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
Reel/Frame 060885/0001 →
SECURITY INTEREST Recorded Feb 1, 2018
From: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
To: CORTLAND CAPITAL MARKET SERVICES LLC, AS COLLATERAL AGENT
Reel/Frame 045216/0020 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2017
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.; BROADCOM CORPORATION
To: BELL SEMICONDUCTOR, LLC
Reel/Frame 044886/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2017
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.; BROADCOM CORPORATION
To: BELL SEMICONDUCTOR, LLC
Reel/Frame 044886/0608 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032856-0031) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: LSI CORPORATION; AGERE SYSTEMS LLC
Reel/Frame 037684/0039 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 20, 2015
From: AGERE SYSTEMS LLC
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 035059/0001 →
MERGER Recorded Feb 20, 2015
From: AGERE SYSTEMS INC.
To: AGERE SYSTEMS LLC
Reel/Frame 035058/0895 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: LSI CORPORATION; AGERE SYSTEMS LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032856/0031 →