IP Library Granted Patent US 6,960,493
Granted Patent B2
US 6,960,493 · App. 10/914,870 · Granted Nov 1, 2005

Semiconductor device package

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Quick Facts
Patent No.
US 6,960,493
App. No.
10/914,870
Granted
Nov 1, 2005
Kind
B2
Abstract

An embodiment of the present invention allows mold compound to flow underneath a substrate where the mold compound will remain in place until the process of mold formation is completed. The mold compound of the package will penetrate all available cavities where the mold compound will remain in place and harden. After hardening, the mold compound surrounding a mold anchor will support an anchored area.

Claims (24)

1. A semiconductor device package, comprising:

a semiconductor device supporting substrate, said substrate having been provided with interconnect metal;

at least one opening created though said substrate, said at least one opening not intersecting with said interconnect metal;

at least one semiconductor device mounted over the surface of said substrate, thereby electrically connecting said at least one semiconductor device to said interconnect metal; and

a mold compound applied over the surface of said substrate and over said semiconductor device, said mold compound including at least one anchor of said mold compound extending out parallel to the plane of said substrate from the body of said mold compound over said semiconductor device and assuring that said mold compound of the anchor penetrates perpendicular to the plane of said substrate said at least one opening created through said substrate.

2. The package of claim 1 , said at least one opening comprising four openings located in four corners of said substrate.

3. The package of claim 1 , said at least one opening created through said substrate comprising drilling an opening.

4. The package of claim 1 , said at least one opening created through said substrate comprising punching an opening.

5. The package of claim 1 , said at least one opening created through said substrate comprising methods of etching an opening.

6. The package of claim 1 , said mold cavity comprising: a top cavity bar; and a bottom cavity bar.

7. The package of claim 6 , said bottom cavity bar having been provided with at least one first relief, said at least one first relief being aligned with said at least one opening created through said substrate.

8. The package of claim 6 , said top cavity bar having been provided with at least one second relief, said at least one second relief being aligned with said at least one opening created through said substrate.

9. The package of claim 1 , said at least one opening comprising at least one opening located along a perimeter of said substrate.

10. A semiconductor device package with mold cap, comprising:

a semiconductor device supporting substrate, said substrate having been provided with interconnect metal;

openings created through said substrate in corners of said substrate, said openings not intersecting with said interconnect metal;

at least one semiconductor device mounted over the surface of said substrate, said at least one semiconductor device having been electrically connected to said interconnect metal; and

a mold compound applied over the surface of said substrate and over said semiconductor device, said mold compound including at least one anchor of said mold compound extending out parallel to the plane of said substrate from the body of said mold compound over said semiconductor device and said mold compound or the anchor having penetrated perpendicular to the plane of said substrate said openings through said substrate created in corners of said substrate.

11. The package of claim 10 , said openings created through said substrate in corners of said substrate comprising methods of drilling openings.

12. The package of claim 10 , said openings having been created through said substrate in corners of said substrate comprising methods of punching openings.

13. The package of claim 10 , said openings having been created through said substrate in corners of said substrate comprising methods of etching openings.

14. The package of claim 10 , said mold cavity being enclosed by: a top cavity bar, and a bottom cavity bar.

15. The package of claim 14 , said bottom cavity bar having been provided with at least one first relief, said at least one first relief being aligned with at least one of said openings created through said substrate in corners of said substrate.

16. The package of claim 14 , said top cavity bar having been provided with at least one second relief, said at least one second relief being aligned with at least one of said openings created through said substrate in corners of said substrate.

Assignments (5)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S NAME PREVIOUSLY RECORDED AT REEL: 038378 FRAME: 0400. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Sep 5, 2023
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 064806/0593 →
RELEASE OF SECURITY INTEREST Recorded Jun 16, 2020
From: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
To: STATS CHIPPAC, INC.; STATS CHIPPAC PTE. LTD. FORMERLY KNOWN AS STATS CHIPPAC LTD.
Reel/Frame 052950/0497 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0400 →
CHANGE OF NAME Recorded Aug 6, 2015
From: ST ASSEMBLY TEST SERVICES LTD.
To: STATS CHIPPAC LTD.
Reel/Frame 036286/0590 →
SECURITY INTEREST Recorded Aug 6, 2015
From: STATS CHIPPAC, INC.; STATS CHIPPAC LTD.
To: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
Reel/Frame 036288/0748 →