See-saw interconnect assembly with dielectric carrier grid providing spring suspension
View Patent ↗An interconnect assembly includes a number of interconnects combined in a preferably planar dielectric carrier frame having resilient portions acting as spring members in conjunction with their respective interconnect's rotational displacement during operational contacting. Each interconnect is fabricated as a see-saw structure pivoting around a rotation axis that substantially coincides with a symmetry plane of the torsion features provided by the resilient portion. The torsion features protrude towards and adhere to a central portion of the see-saw interconnect such that an angular movement of the interconnect is resiliently opposed by the torsion feature and the resilient portion. The torsion features and interconnects may be independently optimized to provide the interconnect with maximum stiffness and a maximum deflection at same time.
1. An interconnect assembly comprising:
a carrier grid, at least a portion of the carrier grid having a resilient property; and
a plurality of conductive contact structures supported by the carrier grid,
at least a portion of the carrier grid compliantly bending upon a predetermined force being applied to at least a portion of the conductive contact structures, the resilient property of the carrier grid being configured to oppose displacement of the plurality of conductive contact structures, wherein the resilient property of the carrier grid opposes at least one of (1) rotational displacement of the conductive contact structures about a rotative axis, or (2) vertical displacement of the conductive contact structures.
2. The interconnect assembly of claim 1 wherein the carrier grid includes a plurality of x-axis grid members and a plurality of y-axis grid members, corresponding ones of the x-axis grid members and y-axis grid members extending to nodes of the carrier grid.
3. The interconnect assembly of claim 2 wherein the conductive contact structures are secured to respective y-axis grid members.
4. The interconnect assembly of claim 1 wherein each of the conductive contact structures includes (1) a center portion secured to the carrier grid, (2) a first arm portion extending along a downward angle from the center portion, and (3) a second arm portion extending along an upward angle from the center portion.
5. The interconnect assembly of claim 1 wherein the interconnect assembly is configured to provide electrical interconnection between a first structure and a second structure, a first contact tip of each of the conductive contact structures being fixedly electrically coupled to electrical contacts of one of the first structure and the second structure.
6. The interconnect assembly of claim 1 wherein each of the conductive contact structures includes a first contact tip at a first end thereof, and a second contact tip at a second end thereof, at least a portion of the conductive contact structures defining a slot dividing at least one of the first contact tip and/or the second contact tip into a left tip portion and a right tip portion.
7. The interconnect assembly of claim 1 wherein each of the conductive contact structures includes a first contact tip at a first end thereof, and a second contact tip at a second end thereof, at least a portion of the conductive contact structures defining a slot extending from the first contact tip to the second contact tip and dividing the conductive contact structure into a left portion and a right portion.
8. The interconnect assembly of claim 1 wherein each of the conductive contact structures includes a core and a conductive plating disposed on the core.
9. The interconnect assembly of claim 8 wherein the core includes NiMn alloy and the plating is an electroplating.
10. The interconnect assembly of claim 1 wherein the carrier grid comprises a polyimide layer.
11. The interconnect assembly of claim 1 wherein the carrier grid includes a support layer and a dielectric layer provided on the support layer, and wherein predetermined portions of the carrier grid are void of the support layer such that the predetermined portions of the support layer have a resilient property with respect to other portions of the carrier grid.
12. The interconnect assembly of claim 11 wherein the support layer is a metallic layer, and the dielectric layer comprises a polyimide material.
13. An interconnect assembly comprising:
a carrier grid, at least a portion of the carrier grid having a resilient property; and
a plurality of conductive contact structures supported by the carrier grid,
at least a portion of the carrier grid compliantly bending upon a predetermined force being applied to at least a portion of the conductive contact structures, the resilient property of the carrier arid being configured to oppose displacement of the plurality of conductive contact structures, wherein at least one of the x-axis grid members and/or the y-axis grid members includes an interface region to which a respective conductive contact structure is secured, the interface region having a width dimension greater than the remainder of the corresponding x-axis grid member or y-axis grid member.
14. An interconnect assembly comprising:
a carrier grid, at least a portion of the carrier grid having a resilient property; and
a plurality of conductive contact structures supported by the carrier grid,
at least a portion of the carrier grid compliantly bending upon a predetermined force being applied to at least a portion of the conductive contact structures, the resilient property of the carrier grid being configured to oppose displacement of the plurality of conductive contact structures, wherein the conductive contact structures are secured to the carrier grid on a first surface thereof at an interface region, the interconnect assembly additionally comprising a stiffening structure on a second surface of the carrier grid opposite the interface region.
15. An interconnect assembly comprising:
a carrier grid, at least a portion of the carrier grid having a resilient property; and
a plurality of conductive contact structures supported by the carrier grid,
at least a portion of the carrier grid compliantly bending upon a predetermined force being applied to at least a portion of the conductive contact structures, the conductive contact structures being configured to pivot about a rotative axis upon the application of the predetermined force, wherein the resilient property of the carrier grid opposes pivoting of the conductive contact structures about the rotative axis, wherein the carrier grid includes a plurality of x-axis grid members and a plurality of y-axis grid members, corresponding ones of the x-axis grid members and y-axis grid members extending to nodes of the carrier grid.
16. The interconnect assembly of claim 15 wherein at least one of the x-axis grid members and/or the y-axis grid members includes an interface region to which a respective conductive contact structure is secured, the interface region having a width dimension greater than the remainder of the corresponding x-axis grid member or y-axis grid member.
17. The interconnect assembly of claim 15 wherein the conductive contact structures are secured to respective y-axis grid members.
18. The interconnect assembly of claim 15 wherein each of the conductive contact structures includes (1) a center portion secured to the carrier grid, (2) a first arm portion extending along a downward angle from the center portion, and (3) a second arm portion extending along an upward angle from the center portion.
19. The interconnect assembly of claim 15 wherein the interconnect assembly is configured to provide electrical interconnection between a first structure and a second structure, a first contact tip of each of the conductive contact structures being fixedly electrically coupled to electrical contacts of one of the first structure and the second structure.
20. The interconnect assembly of claim 15 wherein each of the conductive contact structures includes a first contact tip at a first end thereof, and a second contact tip at a second end thereof, at least a portion of the conductive contact structures defining a slot dividing at least one of the first contact tip and/or the second contact tip into a left tip portion and a right tip portion.
21. The interconnect assembly of claim 15 wherein each of the conductive contact structures includes a first contact tip at a first end thereof, and a second contact tip at a second end thereof, at least a portion of the conductive contact structures defining a slot extending from the first contact tip to the second contact tip and dividing the conductive contact structure into a left portion and a right portion.
22. The interconnect assembly of claim 15 wherein the conductive contact structures are secured to the carrier grid on a first surface thereof at an interface region, the interconnect assembly additionally comprising a stiffening structure on a second surface of the carrier grid opposite the interface region.
23. The interconnect assembly of claim 15 wherein each of the conductive contact structures includes a core and a conductive plating disposed on the core.
24. The interconnect assembly of claim 23 wherein the core includes an NiMn alloy and the plating is an electroplating.
25. The interconnect assembly of claim 15 wherein the carrier grid comprises a polyimide layer.
26. The interconnect assembly of claim 15 wherein the carrier grid includes a support layer and a dielectric layer provided on the support layer, and wherein predetermined portions of the carrier grid are void of the support layer such that the predetermined portions of the support layer have a resilient property with respect to other portions of the carrier grid.
27. The interconnect assembly of claim 26 wherein the support layer is a metallic layer, and the dielectric layer comprises a polyimide material.
28. An interconnect assembly comprising:
a carrier grid, at least a portion of the carrier grid having a resilient property, the carrier grid including a plurality of x-axis grid members and a plurality of y-axis grid members such that corresponding ones of the x-axis grid members and y-axis grid members extend to nodes of the carrier grid; and
a plurality of conductive contact structures supported by the carrier grid,
at least a portion of the carrier grid compliantly bending upon a predetermined force being applied to at least a portion of the conductive contact structures, the conductive contact structures being configured to pivot about a rotative axis upon the application of the predetermined force,
wherein at least one of the x-axis grid members and/or the y-axis grid members includes an interface region to which a respective conductive contact structure is secured, the interface region having a width dimension greater than the remainder of the corresponding x-axis grid member or y-axis grid member.
29. The interconnect assembly of claim 28 wherein the resilient property of the carrier grid opposes pivoting of the conductive contact structures about the rotative axis.
30. The interconnect assembly of claim 28 wherein the conductive contact structures are secured to respective y-axis grid members.
31. The interconnect assembly of claim 28 wherein each of the conductive contact structures includes (1) a center portion secured to the carrier grid, (2) a first arm portion extending along a downward angle from the center portion, and (3) a second arm portion extending along an upward angle from the center portion.
32. The interconnect assembly of claim 28 wherein the interconnect assembly is configured to provide electrical interconnection between a first structure and a second structure, a first contact tip of each of the conductive contact structures being fixedly electrically coupled to electrical contacts of one of the first structure and the second structure.
33. The interconnect assembly of claim 28 wherein each of the conductive contact structures includes a first contact tip at a first end thereof, and a second contact tip at a second end thereof at least a portion of the conductive contact structures defining a slot dividing at least one of the first contact tip and/or the second contact tip into a left tip portion and a right tip portion.
34. The interconnect assembly of claim 28 wherein each of the conductive contact structures includes a first contact tip at a first end thereof, and a second contact tip at a second end thereof, at least a portion of the conductive contact structures defining a slot extending from the first contact tip to the second contact tip and dividing the conductive contact structure into a left portion and a right portion.
35. The interconnect assembly of claim 28 wherein the conductive contact structures are secured to the carrier grid on a first surface thereof at an interface region, the interconnect assembly additionally comprising a stiffening structure on a second surface of the carrier grid opposite the interface region.
36. The interconnect assembly of claim 28 wherein each of the conductive contact structures includes a core and a conductive plating disposed on the core.
37. The interconnect assembly of claim 36 wherein the core includes an NiMn alloy and the plating is an electroplating.
38. The interconnect assembly of claim 28 wherein the carrier grid comprises a polyimide layer.
39. The interconnect assembly of claim 28 wherein the carrier grid includes a support layer and a dielectric layer provided on the support layer, and wherein predetermined portions of the carrier grid are void of the support layer such that the predetermined portions of the support layer have a resilient property with respect to other portions of the carrier grid.
40. The interconnect assembly of claim 39 wherein the support layer is a metallic layer, and the dielectric layer comprises a polyimide material.
41. An interconnect assembly comprising:
a carrier grid at least a portion of the carrier grid having a resilient property;
a plurality of conductive contact structures supported by the carrier grid, the conductive contact structures being secured to the carrier grid on a first surface thereof at an interface region; and
a stiffening structure on a second surface of the carrier grid opposite the interface region,
at least a portion of the carrier grid compliantly bending upon a predetermined force being applied to at least a portion of the conductive contact structures, the conductive contact structures being configured to pivot about a rotative axis upon the application of the predetermined force.
42. The interconnect assembly of claim 41 wherein the resilient property of the carrier grid opposes pivoting of the conductive contact structures about the rotative axis.
43. The interconnect assembly of claim 41 wherein the carrier grid includes a plurality of x-axis grid members and a plurality of y-axis grid members, corresponding ones of the x-axis grid members and y-axis grid members extending to nodes of the carrier grid.
44. The interconnect assembly of claim 43 wherein at least one of the grid members and/or the y-axis grid members includes an interface region to which a respective conductive contact structure is secured, the interface region having a width dimension greater than the remainder of the corresponding x-axis grid member or y-axis grid member.
45. The interconnect assembly of claim 43 wherein the conductive contact structures are secured to respective y-axis grid members.
46. The interconnect assembly of claim 41 wherein each of the conductive contact structures includes (1) a center portion secured to the carrier grid, (2) a first arm portion extending along a downward angle from the center portion, and (3) a second arm portion extending along an upward angle from the center portion.
47. The interconnect assembly of claim 41 wherein the interconnect assembly is configured to provide electrical interconnection between a first structure and a second structure, a first contact tip of each of the conductive contact structures being fixedly electrically coupled to electrical contacts of one of the first structure and the second structure.
48. The interconnect assembly of claim 41 wherein each of the conductive contact structures includes a first contact tip at a first end thereof, and a second contact tip at a second end thereof at least a portion of the conductive contact structures defining a slot dividing at least one of the first contact tip and/or the second contact tip into a left tip portion and a right tip portion.
49. The interconnect assembly of claim 41 wherein each of the conductive contact structures includes a first contact tip at a first end thereof, and a second contact tip at a second end thereof at least a portion of the conductive contact structure defining a slot extending from the first contact tip to the second contact tip and dividing the conductive contact structure into a left portion and a right portion.
50. The interconnect assembly of claim 41 wherein each of the conductive contact structures includes a core and a conductive plating disposed on the core.
51. The interconnect assembly of claim 50 wherein the core includes an NiMn alloy and the plating is an electroplating.
52. The interconnect assembly of claim 41 wherein the carrier grid comprises a polyimide layer.
53. The interconnect assembly of claim 41 wherein the carrier grid includes a support layer and a dielectric layer provided on the support layer, and wherein predetermined portions of the carrier grid are void of the support layer such that the predetermined portions of the support layer have a resilient property with respect to other portions of the carrier grid.
54. The interconnect assembly of claim 53 wherein the support layer is a metallic layer, and the dielectric layer comprises a polyimide material.