IP Library Granted Patent US 7,705,420
Granted Patent B2
US 7,705,420 · App. 11/122,038 · Granted Apr 27, 2010

Method for producing a conductor path on a substrate, and a component having a conductor path fabricated in accordance with such a method

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Quick Facts
Patent No.
US 7,705,420
App. No.
11/122,038
Granted
Apr 27, 2010
Kind
B2
Abstract

A component having at least one conductor path on a substrate, and a production method for fabricating such a component is provided. The component is made by providing at least one conductor path on a predefined area of the substrate. Then a dielectric insulating layer is formed over the at least one conductor path, and a an area of the substrate is completely back etched below the at least one conductor path beginning on the bottom side of the substrate in such a way that the at least one conductor path is supported across the completely back-etched area of the substrate by adhesion to the second insulating layer.

Claims (35)

1. A component comprising:

a substrate having a portion thereof completely back-etched on a lower surface thereof;

a first dielectric insulating layer being provided on an upper surface of the substrate, and which covers the portion of the substrate that is back-etched; and

at least one conductor path, which is integratable into the first dielectric insulating layer, and which has a lower surface thereof adjacent to the portion of the substrate that is back-etched,

wherein a second dielectric insulating layer is provided between the first dielectric insulating layer and the substrate, and

wherein the substrate is completely back-etched directly to a surface of the first dielectric insulating layer.

2. The component according to claim 1 , wherein the substrate is a silicon-containing semiconductor substrate, particularly monocrystalline silicon.

3. The component according to claim 2 , wherein the second dielectric insulating layer is made of an inorganic insulation material, a silicon oxide, a silicon dioxide, a silicon nitride, or a silicon with buried air gaps.

4. The component according to claim 1 , wherein the first dielectric insulating layer is a membrane made of an organic insulating material, an organic polymer material, benzocyclobutene, a SILK material, an SU-8 material, or a polyimide.

5. The component according to claim 1 , wherein the at least one conductor path is made of aluminum, copper, silver, gold, or titanium.

6. The component according to claim 1 , wherein the at least one conductor path is a conductor path that is used in a high frequency field.

7. The component according to claim 1 , wherein the component is a semiconductor component.

8. The component according to claim 1 , wherein the at least one conductor path is embedded into the first dielectric insulating layer.

9. The component according to claim 1 , wherein the at least one conductor path is completely embedded into the first dielectric insulating layer.

10. The component according to claim 1 , wherein the at least one conductor path is supported by the first dielectric insulating layer across the back-etched portion of the substrate.

11. The component according to claim 1 , wherein the at least one conductor path is suspended from the first dielectric insulating layer across the back-etched portion of the substrate.

12. The component according to claim 1 , wherein the at least one conductor path is embedded into the first dielectric insulating layer, except for the lower surface of the at least one conductor which is adjacent to the portion of the substrate that is back-etched.

13. The component according to claim 1 , wherein the lower surface of the at least one conductor which is exposed to air in the portion of the substrate that is back-etched.

14. The component according to claim 1 , further comprising:

a third dielectric insulating layer provided above the first dielectric insulating layer, and

at least one additional conductor that is embedded in the third dielectric insulating layer and that is adjacent to the portion of the substrate that is back-etched.

15. A component comprising:

a substrate having a back-etched portion on a lower surface thereof;

a first dielectric insulating layer provided above an upper surface of the substrate; and

at least one conductor path that is adjacent to the back-etched portion of the substrate,

wherein at least a portion of the at least one conductor path is embedded into the first dielectric insulating layer such that the at least one conductor path is supported by the first dielectric insulating layer across the back-etched portion of the substrate,

wherein a second dielectric insulating layer is provided between the first dielectric insulating layer and the substrate, and

wherein the substrate is completely back-etched directly to a surface of the first dielectric insulating layer.

16. The component according to claim 15 , wherein the at least one conductor path is completely embedded into the first dielectric insulating layer.

17. The component according to claim 15 , wherein the at least one conductor path is embedded into the first dielectric insulating layer, except for the lower surface of the at least one conductor which is adjacent to the back-etched portion of the substrate.

18. The component according to claim 15 , wherein the at least one conductor path is imbedded in the first dielectric insulating layer, except for the lower surface of the at least one conductor which is exposed to air in the back-etched portion of the substrate.

19. The component according to claim 15 , wherein the first dielectric insulating layer comprises a membrane made of an organic insulating material, an organic polymer material, benzocyclobutene, a SiLK material, an SU-8material, or a polyimide.

20. The component according to claim 15 , further comprising:

a third dielectric insulating layer provided above the first dielectric insulating layer, and

at least one additional conductor that is embedded in the third dielectric insulating layer and that is adjacent to the portion of the substrate that is back-etched.

Assignments (19)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: ATMEL CORPORATION
Reel/Frame 038376/0001 →
PATENT SECURITY AGREEMENT Recorded Jan 3, 2014
From: ATMEL CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC. AS ADMINISTRATIVE AGENT
Reel/Frame 031912/0173 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 4, 2011
From: ATMEL AUTOMOTIVE GMBH
To: ATMEL CORPORATION
Reel/Frame 025899/0710 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 9, 2009
From: ATMEL GERMANY GMBH
To: ATMEL AUTOMOTIVE GMBH
Reel/Frame 023205/0838 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 5, 2005
From: JOODAKI, MOJTABA
To: ATMEL GERMANY GMBH
Reel/Frame 016531/0323 →