Method of manufacturing a semiconductor device comprising stacked chips and a corresponding semiconductor device
View Patent ↗A first reconstituted wafer is formed, followed by a first redistribution layer. In parallel, a second reconstituted wafer is formed. The second reconstituted wafer is diced along a gap such that individualized embedded chips are formed having tilted sidewalls defining an angle of more than 90 degrees with respect to the active surface of the reconstituted wafer. The embedded chips are placed with the backside on an active surface of the first reconstituted wafer on the first redistribution layer. Afterwards, a second redistribution layer is formed on the active surface of the embedded chips and tilted sidewalls wherein the second redistribution layer connects contact pads of the second chips with the first redistribution layer.
1. A method of manufacturing of a semiconductor device having stacked chips comprising:
forming a first reconstituted wafer having a first plurality of chips horizontally separated by a first gap filled with a mould, wherein contact pads of the first chips are arranged in an active surface of the first reconstituted wafer;
forming a first redistribution layer on the active surface of the first reconstituted wafer, the first redistribution layer contacting contact pads of first chips and extending on the mould;
forming a second reconstituted wafer having a second plurality of chips horizontally separated by a second gap filled with a mould, wherein contact pads of the second chips are arranged in an active surface opposite to a back side of the second reconstituted wafer;
dicing the second reconstituted wafer along the second gap such that individualized embedded chips are formed having tilted sidewalls defining an angle of more than ninety degrees with respect to the active surface of the second reconstituted wafer;
placing the embedded chips with their back side on the active surface of the first reconstituted wafer and the first redistribution layer; and
forming a second redistribution layer on the active surface of the embedded chips and tilted sidewalls the second redistribution layer connecting contact pads of the second chips with the first redistribution layer.
2. The method according to claim 1 , wherein the first reconstituted wafer is diced along the first gap after the second redistribution layer is formed thus providing interconnected stacked chips.
3. The method according to claim 2 , further comprising:
placing the interconnected chip staple on a carrier; and
contacting the first redistribution layer with the contact areas provided on the carrier.
4. The method according to claim 3 , wherein the first redistribution layer is contacted via bonding wires.
5. The method according to claims 1 , where in after a formation of a third redistribution layer on an active surface of a third embedded chip a forth embedded chip is placed with its backside on the active surface of the third embedded chip; and a forth redistribution layer is formed on the active surface of the forth embedded chip.
6. The method according to claim 5 , wherein the third embedded chip is the second embedded chip and the third redistribution layer is the second redistribution layer.
7. The method according to claim 1 , wherein the first gap is broader than the second gap.