IP Library Granted Patent US 7,312,644
Granted Patent B2
US 7,312,644 · App. 11/302,954 · Granted Dec 25, 2007

Power failure detection circuit with fast drop response

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Quick Facts
Patent No.
US 7,312,644
App. No.
11/302,954
Granted
Dec 25, 2007
Kind
B2
Abstract

A device is provided for resetting an integrated circuit generating a reset signal after a power supply voltage drop to a very low level has been detected. Such a device includes at least one control means, the state of which (conducting or non-conducting) is controlled by a control voltage equal to the difference between the power supply voltage and a predetermined offset voltage, such that if the control voltage is less than or equal to a threshold, the control means authorizes activation of the means for generating a reset signal.

Claims (40)

1. A resetting device comprising:

detection means for detecting a drop in a power supply voltage received by the said device; and

means for generating a reset signal, activated after a drop in the said power supply voltage has been detected by the said detection means, wherein the said detection means comprise:

a first control means itself comprising a first transistor forming a first switch and cooperating with energy storing means included within the said detection means, the said first transistor comprising a control element on which a first control voltage is applied, which is equal to the difference between the said power supply voltage and a first predetermined offset voltage, such that:

if the said first control voltage is greater than a first threshold, the said first transistor is in a non-conducting state, in which the said first transistor authorizes storage of energy in the said storage means; and

if the said first control voltage is less than or equal to the said first threshold, the said first transistor is in a conducting state in which the said first transistor authorizes the said energy storage means to release the said energy, so as to activate the said generation means;

a second control means itself comprising a second transistor forming a second switch and cooperating with a first current source included within the said detection means, the said second transistor comprising a control element on which a second control voltage is applied, which is equal to the difference between the said power supply voltage and a second predetermined offset voltage, such that:

if the said second control voltage is greater than a second threshold, the said second transistor is in a conducting state, in which the said second transistor prevents a current generated by the said first current source from reaching the said generation means; and

if the said second control voltage is less than or equal to the said second threshold, the said second transistor is in a non-conducting state, in which the said second transistor directs the current generated by the said first current source to the said means for generating a reset signal, so as to activate the said generation means.

2. The resetting device according to claim 1 , wherein the said first threshold is equal to the difference between a determined voltage applied to a source of the said first transistor and a threshold voltage of the said first transistor.

3. The resetting device according to claim 1 , wherein the said first predetermined offset voltage, denoted VX 1 , is such that: 0≦VX 1 <VCCn −(VS-VT) where

VCCn is a nominal value of the said power supply voltage;

VT is a threshold voltage of the said first transistor; and

VS is a determined voltage applied to a source of the said first transistor.

4. The resetting device according to claim 1 , wherein the said energy storage means comprise a third transistor used as a filtering capacitance.

5. The resetting device according to claim 1 , wherein the said second threshold is equal to a threshold voltage of the said second transistor.

6. The resetting device according to claim 1 , wherein the said second predetermined offset voltage, denoted VX 2 , is such that:

0 ≦VX 2 <VCCn−VT,

where:

VCCn is a nominal value of the said power supply voltage; and

VT is a threshold voltage of the said second transistor.

7. The resetting device according to claim 1 , wherein the said first current source comprises a current mirror powered by the said power supply voltage.

8. The resetting device according to claim 1 , wherein the said second transistor comprises:

a gate forming the said control element of the second transistor;

a source connected to the ground; and

a drain connected to a mid-point between the said first current source and the said generation means.

9. The resetting device according to claim 1 , wherein the said first threshold is less than the said second threshold.

10. The resetting device according to any one of claims 1 , wherein the said detection means also comprise a third control means, itself comprising:

means for comparing a voltage proportional to the said power supply voltage (div) with a determined reference voltage (VBGP), the said comparison means generating a resultant voltage (VDIFF) that depends on the result of the comparison;

a fourth transistor forming a third switch and cooperating with a second current source, that may or may not be coincident with the said first current source, the said fourth transistor comprising a control element on which the said resultant voltage is applied, such that:

if the said resultant voltage (VDIFF) is greater than a third threshold, the said fourth transistor is in a conducting state, in which the said fourth transistor prevents a current generated by the said second current source from reaching the said generation means;

if the said resultant voltage (VDIFF) is less than or equal to the said third threshold, the said fourth transistor is in a non-conducting state, in which the said fourth transistor directs the current generated by the said second current source to the said means for generating a reset signal, so as to activate the said generation means.

11. The resetting device according to claim 10 , wherein the said second threshold is less than the said third threshold.

12. The resetting device according to claim 10 , wherein the said first threshold is less than the said third threshold.

13. The resetting device according to claim 10 , wherein the fourth transistor is mounted with respect to the second transistor such that the said second switch formed by the second transistor behaves like a master switch with respect to the third switch formed by the fourth transistor, such that if the second transistor is in the said non-conducting state, the said generation means are activated regardless of the state of the fourth transistor.

14. The resetting device according to any one of claims 10 , wherein the said fourth transistor comprises:

a gate forming the said control element of the fourth transistor;

a source connected to the drain of the second transistor; and

a drain connected to a mid-point between the said first current source and the said generation means.

15. An electronic circuit comprising the resetting device of claim 1 .

Assignments (19)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: ATMEL CORPORATION
Reel/Frame 038376/0001 →
PATENT SECURITY AGREEMENT Recorded Jan 3, 2014
From: ATMEL CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC. AS ADMINISTRATIVE AGENT
Reel/Frame 031912/0173 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 3, 2011
From: ATMEL SWITZERLAND SARL
To: ATMEL CORPORATION
Reel/Frame 026387/0881 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 16, 2009
From: ATMEL NANTES SA
To: ATMEL SWITZERLAND SARL
Reel/Frame 023234/0513 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 10, 2006
From: MESSAGER, PHILIPPE
To: ATMEL NANTES SA
Reel/Frame 017780/0069 →