IP Library Granted Patent US 8,233,252
Granted Patent B2
US 8,233,252 · App. 11/376,138 · Granted Jul 31, 2012

ESD protection circuit for low voltages

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Quick Facts
Patent No.
US 8,233,252
App. No.
11/376,138
Granted
Jul 31, 2012
Kind
B2
Abstract

An ESD protection circuit is provided having a first field-effect transistor, which has a first drain terminal, a first source terminal and a first control terminal, and having an input network which, in the event that a first voltage present between the first drain terminal and the first source terminal crosses a threshold value, alters a second voltage that appears between the first control terminal and the first source terminal. The input network contains a second field-effect transistor, complementary to the first field-effect transistor, having a second drain terminal, a second source terminal and a second control terminal, wherein the first drain terminal is connected to the second source terminal and, through a first resistance, to the second control terminal, and the second drain terminal is connected to the first control terminal and, through a second resistance, to the first source terminal.

Claims (25)

1. A circuit comprising:

a first field-effect transistor having a first drain terminal, a first source terminal, and a first control terminal;

a second field-effect transistor having a second drain terminal, a second source terminal, and a second control terminal, the second field-effect transistor being complementary to the first field-effect transistor, the first drain terminal being coupled directly to the second source terminal and, through a first resistance, to the second control terminal, the second drain terminal being coupled to the first control terminal and, through a second resistance, to the first source terminal; and

a Zener diode having a cathode coupled to the second control terminal;

a gate-source capacitance of the second field-effect transistor corresponding to a depletion-layer capacitance of the Zener diode.

2. The circuit of claim 1 , further comprising a third resistance coupling the Zener diode to the first source terminal.

3. The circuit of claim 1 , wherein:

the first transistor is an n-channel field-effect transistor; and

the second transistor is a p-channel field-effect transistor.

4. The circuit of claim 1 , wherein the second field-effect transistor has a smaller channel area than the first field-effect transistor.

5. A circuit comprising:

an n-channel field-effect transistor having a first drain terminal, a first source terminal, and a first control terminal;

a p-channel field-effect transistor having a second drain terminal, a second source terminal, and a second control terminal, the first drain terminal being coupled directly to the second source terminal and, through a first resistance, to the second control terminal, the second drain terminal being coupled to the first control terminal and, through a second resistance, to the first source terminal; and

a Zener diode coupled to the second control terminal;

a gate-source capacitance of the p-channel field-effect transistor corresponding to a depletion-layer capacitance of the Zener diode.

6. The circuit of claim 5 , wherein a cathode of the Zener diode is coupled to the second control terminal.

7. The circuit of claim 5 , further comprising a third resistance coupling the Zener diode to the first source terminal.

8. The circuit of claim 5 , wherein the p-channel field-effect transistor has a smaller channel area than the n-channel field-effect transistor.

9. A circuit comprising:

an n-channel field-effect transistor having a first drain terminal, a first source terminal, and a first control terminal;

a p-channel field-effect transistor having a second drain terminal, a second source terminal, and a second control terminal, the first drain terminal coupled directly to the second source terminal and, through a first resistance, to the second control terminal, the second drain terminal coupled to the first control terminal and, through a second resistance, to the first source terminal; and

a Zener diode coupled to the second control terminal and, through a third resistance, to the first source terminal;

a gate-source capacitance of the p-channel field-effect transistor corresponding to a depletion-layer capacitance of the Zener diode.

10. The circuit of claim 9 , wherein a cathode of the Zener diode is coupled to the second control terminal.

11. The circuit of claim 9 , wherein the p-channel field-effect transistor has a smaller channel area than the n-channel field-effect transistor.

Assignments (19)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: ATMEL CORPORATION
Reel/Frame 038376/0001 →
PATENT SECURITY AGREEMENT Recorded Jan 3, 2014
From: ATMEL CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC. AS ADMINISTRATIVE AGENT
Reel/Frame 031912/0173 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 4, 2011
From: ATMEL AUTOMOTIVE GMBH
To: ATMEL CORPORATION
Reel/Frame 025899/0710 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 9, 2009
From: ATMEL GERMANY GMBH
To: ATMEL AUTOMOTIVE GMBH
Reel/Frame 023205/0838 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 16, 2006
From: GROMBACH, PETER; KLAUSSNER, MANFRED
To: ATMEL GERMANY GMBH
Reel/Frame 017662/0692 →