IP Library Granted Patent US 7,385,407
Granted Patent B2
US 7,385,407 · App. 11/433,845 · Granted Jun 10, 2008

Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component

Assignee: Aehr Test Systems
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,385,407
App. No.
11/433,845
Granted
Jun 10, 2008
Kind
B2
Abstract

In one embodiment, the invention provides a test assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component. The assembly comprises a contactor assembly to interconnect with the test component, a probe assembly to mechanically support the contactor assembly and electrically connect the contactor assembly to the testing machine, and a clamping mechanism comprising a first clamping member and a second clamping member, the clamping members being urged together to exert a clamping force to deform contactor bumps of an electrical connection between the probe assembly and the contactor assembly.

Claims (13)

1. A contactor assembly for electrically connecting an electrical test component to a testing machine for testing the test component, the contactor assembly comprising:

a first test structure, the first test structure comprising:

a first plurality of electrical terminals;

a first plurality of resilient interconnection elements, each having a first end connected to an electrical terminal of the first plurality of electrical terminals and a free end opposite the first end to electrically contact the test component; and

a second plurality of resilient interconnection elements, each having a first end connected to an electrical terminal of the first plurality of electrical terminals and a free end opposite the first end to electrically contact a second plurality of electrical terminals;

a second test structure, the second test structure comprising:

the second plurality of electrical terminals; and

a plurality of electrical contact elements distant from the electrical terminals;

a retaining component to secure the position of the first test structure to a relative position of the second test structure; and

an electrical path bridging each electrical terminal with a respective one of the electrical contact elements, wherein each electrical contact element has a body which defines a flat surface to provide support to matching contactor elements when the matching contactor elements are deformed under a clamping force.

2. The contactor assembly of claim 1 , wherein the resilient interconnection elements comprise springs.

3. The contactor assembly of claim 1 , wherein the second test structure comprises a plurality of apertures formed therein to cooperate with clamping members to clamp the matching contactor elements.

4. The contactor assembly of claim 3 , wherein the second test structure further comprises fiducial markings to facilitate alignment of the electrical contact elements with the matching contactor elements.

Assignments (4)
RELEASE OF SECURITY INTEREST Recorded Nov 5, 2019
From: QVT FUND LP; QUINTESSENCE FUND L.P.
To: AEHR TEST SYSTEMS
Reel/Frame 050928/0695 →
SECURITY INTEREST Recorded Apr 14, 2015
From: AEHR TEST SYSTEMS
To: QVT FUND LP; QUINTESSENCE FUND L.P.
Reel/Frame 035424/0783 →
RELEASE OF SECURITY INTEREST Recorded Apr 13, 2015
From: SILICON VALLEY BANK
To: AEHR TEST SYSTEMS
Reel/Frame 035420/0390 →
SECURITY AGREEMENT Recorded Sep 6, 2013
From: AEHR TEST SYSTEMS
To: SILICON VALLEY BANK
Reel/Frame 031171/0001 →
Continuity (3)
Division 1091278500 · Aug 6, 2004
Division 1019710400 · Jul 16, 2002
Related Publication 20060267624A1 · Nov 30, 2006