Methods of cell population distribution assisted read margining
View Patent ↗A memory using techniques to extract the data content of its storage elements, when the distribution of stored states is degraded, is presented. If the distribution of stored states has degraded, secondary evaluations of the memory cells are performed using modified read conditions. Based upon the results of these supplemental evaluations, the memory device determines the read conditions at which to best decide the data stored.
1. In a memory device having a plurality of memory cells each storing one of at least two data states, a method of reading the memory cells to determine which of the memory cells contain data corresponding to a selected one of the data states, the method comprising:
evaluating the memory cells at a first reference condition;
evaluating the memory cells at a plurality of secondary reference conditions; and
determining a read condition at which to determine the memory cells that contain data corresponding to said selected one of the data states based on comparing the number of memory cells evaluated at the first reference condition and the second reference conditions, wherein the read condition is determined based on the rate of change of number of memory cells evaluated at the plurality of reference conditions.
2. The method of claim 1 , further comprising:
determining whether the evaluation result at the first reference condition has unacceptable error, wherein said evaluating the memory cells at the plurality of secondary reference conditions is in response to the evaluation result at the first reference point having unacceptable error.
3. The method of claim 2 , wherein said determining whether the evaluation result at the first reference condition has unacceptable error is based on an error correction code result.
4. The method of claim 1 , wherein the determined read condition is one of said secondary reference conditions.
5. The method of claim 1 , wherein the determined read condition is a reference condition other than one of said first and secondary reference conditions.
6. The method of claim 1 , wherein the plurality of evaluation conditions use the same bias conditions, but differing reference points.
7. The method of claim 6 , wherein said reference points are current levels.
8. The method of claim 6 , wherein said reference points are voltage levels.
9. The method of claim 6 , wherein said reference points are time values.
10. The method of claim 1 , wherein the first reference condition is a first set of bias conditions and the plurality of secondary reference conditions are a plurality of secondary sets of bias conditions.
11. The method of claim 10 , wherein the first set of bias conditions and the secondary sets of bias conditions are distinguished from each other by a differing control gate voltage.
12. The method of claim 1 , wherein said memory cells are non-volatile memory cells.
13. The method of claim 12 , wherein said memory cells are charge storing devices.
14. The method of claim 13 , wherein said memory device is a flash memory.
15. The method of claim 1 , wherein said memory device includes a memory containing the memory cells and a controller, wherein the determining a read condition is performed within the memory.
16. The method of claim 1 , wherein said memory device includes a memory containing the memory cells and a controller, wherein the determining a read condition is performed by the controller.
17. The method of claim 1 , wherein said first reference condition is established by one or more reference cells.