IP Library Granted Patent US 7,554,378
Granted Patent B2
US 7,554,378 · App. 11/766,701 · Granted Jun 30, 2009

Fast DC coupled level translator

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Quick Facts
Patent No.
US 7,554,378
App. No.
11/766,701
Granted
Jun 30, 2009
Kind
B2
Abstract

A level translator has an inverter comprising a first transistor having a first predetermined voltage threshold and a second transistor having a second predetermined voltage threshold. The two transistors have control gates being of complementary conductivity. A first capacitor is connected at one end to the gate of the first transistor and at a second end to an input signal. A second capacitor is connected at one end to the gate of the second transistor, the input signal being applied to a second end of the second capacitor. A comparator is used for detecting the relationship between the input signal and a reference voltage. A first current mirror has one terminal connected to an output of the comparator, and another terminal connected to the gate of the first transistor. A second current mirror has one terminal connected to an output of the comparator, and another terminal connected to the gate of the second transistor. A first clamp circuit is used for limiting a gate voltage of said first transistor. A second clamp circuit is used for limiting a gate voltage of said second transistor.

Claims (55)

1. A level translator comprising:

a comparator having a first input coupled to a voltage input VIN and a second input coupled to a reference voltage VREF, the comparator having four output terminals, a first terminal that sinks current if the voltage input VIN is greater than the reference voltage VREF, a second terminal that sinks current if the voltage input VIN is less than the reference voltage VREF, a third terminal that sources current if the voltage input VIN is greater than VREF, and a fourth terminal that sources current if the voltage input VIN is less than VREF;

a first coupling capacitive element coupled to the voltage input VIN and to the first terminal of the comparator;

a second coupling capacitive element coupled to the voltage input VIN and to the fourth terminal of the comparator;

a first transistor having drain, gate, and source terminals, the drain of the first transistor coupled to an output of the translator, the gate of the first transistor coupled to the first coupling capacitive element and to the first terminal of the comparator, the first transistor having a predetermined minimum gate to source voltage required for current conduction;

a second transistor having drain, gate, and source terminals, the drain of the second transistor coupled to an output of the translator, the gate of the first transistor coupled to the second coupling capacitive element and to the fourth terminal of the comparator, the second transistor having a predetermined minimum gate to source voltage required for current conduction, the gates of the first and second transistors being of complementary conductivity;

a first current mirror having one terminal connected to the second terminal of the comparator and a second terminal connected to the gate of the first transistor, and a third terminal connected to the source terminal of the first transistor;

a second current mirror having one terminal connected to the third terminal of the comparator, a second terminal connected to the gate of the second transistor, and a third terminal connected to the source terminal of the second transistor;

a first clamp circuit for limiting a gate voltage of the first transistor and having a first terminal connected to the gate of the first transistor and a second terminal connected to the source terminal of the first transistor; and

a second clamp circuit for limiting a gate voltage of the second transistor and having a first terminal connected to the gate of the second transistor and a second terminal connected to the source terminal of the second transistor.

2. A level translator in accordance with claim 1 further comprising:

a first compensation voltage source coupled to the source terminal of the first transistor and to the third terminal of the first current mirror and to the second terminal of the first clamp circuit; and

a second compensation voltage source coupled to the source terminal of the second transistor and to the third terminal of the second current mirror and to the second terminal of the second clamp circuit.

3. A level translator in accordance with claim 2 wherein the first compensation voltage source comprises a third transistor having drain, gate and source terminals, wherein the gate terminal of the third transistor is connected to the drain terminal of the third transistor, the source terminal of the third transistor is coupled to a voltage supply VDD.

4. A level translator in accordance with claim 3 the third transistor is a PMOS transistor sized so that a voltage dropped across the third transistor is sufficient to turn on the first transistor at a low value of current.

5. A level translator in accordance with claim 3 wherein the second compensation voltage source comprises a fourth transistor having drain, gate and source terminals, wherein the gate terminal of the fourth transistor is connected to the drain terminal of the fourth transistor, the source terminal of the third transistor is coupled to a voltage supply VSS.

6. A level translator in accordance with claim 3 the third transistor is a NMOS transistor sized so that a voltage dropped across the fourth transistor is sufficient to turn on the second transistor at a low value of current.

7. A level translator in accordance with claim 1 wherein the first clamp circuit comprises:

a voltage source V 1 ; and

a diode coupled in series with the voltage source V 1 .

8. A level translator in accordance with claim 1 wherein the first clamp circuit comprises a PMOS transistor having drain, gate and source terminals, wherein the gate terminal of the PMOS transistor is coupled to the drain terminal of the PMOS transistor so that a value of drain to source voltage controls a drain current.

9. A level translator in accordance with claim 1 wherein the second clamp circuit comprises:

a voltage source V 2 ; and

a diode coupled in series with the voltage source V 2 .

10. A level translator in accordance with claim 1 wherein the second clamp circuit comprises an NMOS transistor having drain, gate and source terminals, wherein the gate terminal of the NMOS transistor is coupled to the drain terminal of the NMOS transistor so that a value of drain to source voltage controls a drain current.

11. A level translator comprising:

an inverter circuit comprising:

a first field effect transistor having a first predetermined voltage threshold; and

a second field effect transistor having a second predetermined voltage threshold, wherein said first and second transistors having control gates;

a first capacitor connected at one end to the gate of said first field effect transistor and at a second end to an input signal;

a second capacitor connected at one end to the gate of said second field effect transistor, the input signal being applied to a second end of said second capacitor;

a comparator circuit for detecting the values of said input signal and a reference voltage;

a first current mirror having one terminal connected to a first output of said comparator, and another terminal connected to said gate of said first field effect transistor;

a second current mirror having one terminal connected to a second output of said comparator, and another terminal connected to said gate of said second field effect transistor;

a first clamp circuit connected to a source and the gate terminal of the first field effect transistor for limiting a gate voltage of said first field effect transistor; and

a second clamp circuit connected to a source and the gate terminal of the second field effect transistor for limiting a gate voltage of said second field effect transistor.

12. A level translator in accordance with claim 11 wherein the source of said first field effect transistor is connected to a first terminal of a power source, the source of said second field effect transistor is connected to a second terminal of said power source, the drains of said first and second field effect transistors are connected together and to an output terminal of the amplifier.

13. A level translator in accordance with claim 12 , wherein the comparator further comprises additional output terminals connected to the gates of said first and second field effect transistors.

14. A level translator in accordance with claim 12 , wherein at least one of said first and second clamp circuits comprises a MOS transistor.

15. A level translator in accordance with claim 12 , wherein a third terminal of said first current mirror connects to a second terminal of said first clamp circuit and to a first terminal of a first voltage source, a third terminal of said second current mirror connects to a second terminal of said second clamp circuit and to a first terminal of a second voltage source, a second terminal of said first voltage source connects to said first terminal of said power source, and a second terminal of said second voltage source connects to said second terminal of said power source.

16. An amplifier according to claim 15 , wherein at least one of said first or second voltage sources contains at least one MOS transistor.

17. A level translator comprising:

a comparator having a first input coupled to a voltage input VIN and a second input coupled to a reference voltage VREF, the comparator having four output terminals, a first terminal that sinks current if the voltage input VIN is greater than the reference voltage VREF, a second terminal that sinks current if the voltage input VIN is less than the reference voltage VREF, a third terminal that sources current if the voltage input VIN is greater than VREF, and a fourth terminal that sources current if the voltage input VIN is less than VREF;

a first coupling capacitive element coupled to the voltage input VIN and to the first terminal of the comparator;

a second coupling capacitive element coupled to the voltage input VIN and to the fourth terminal of the comparator;

a first transistor having drain, gate, and source terminals, the drain of the first transistor coupled to an output of the translator, the gate of the first transistor coupled to the first coupling capacitive element and to the first terminal of the comparator, the first transistor having a a predetermined minimum gate to source voltage required for current conduction;

a second transistor having drain, gate, and source terminals, the drain of the second transistor coupled to an output of the translator, the gate of the first transistor coupled to the second coupling capacitive element and to the fourth terminal of the comparator, the second transistor having a predetermined minimum gate to source voltage required for current conduction, the gates of the first and second transistors being of complementary conductivity;

a first current mirror having one terminal connected to the second terminal of the comparator and a second terminal connected to the gate of the first transistor, and a third terminal connected to the source terminal of the first transistor;

a second current mirror having one terminal connected to the third terminal of the comparator, a second terminal connected to the gate of the second transistor, and a third terminal connected to the source terminal of the second transistor;

a first clamp circuit for limiting a gate voltage of the first transistor and having a first terminal connected to the gate of the first transistor and a second terminal connected to the source terminal of the first transistor;

a second clamp circuit for limiting a gate voltage of the second transistor and having a first terminal connected to the gate of the second transistor and a second terminal connected to the source terminal of the second transistor;

a first compensation voltage source coupled to the source terminal of the first transistor and to the third terminal of the first current mirror and to the second terminal of the first clamp circuit; and

a second compensation voltage source coupled to the source terminal of the second transistor and to the third terminal of the second current mirror and to the second terminal of the second clamp circuit.

18. A level translator in accordance with claim 17 wherein the first compensation voltage source comprises a PMOS transistor having drain, gate and source terminals, wherein the gate terminal of the third transistor is connected to the drain terminal of the third transistor, the source terminal of the third transistor is coupled to a voltage supply VDD, wherein a voltage dropped across the PMOS transistor is sufficient to turn on the first transistor at a low value of current.

19. A level translator in accordance with claim 17 wherein the second compensation voltage source comprises an NMOS transistor having drain, gate and source terminals, wherein the gate terminal of the fourth transistor is connected to the drain terminal of the fourth transistor, the source terminal of the third transistor is coupled to a voltage supply VSS, wherein a voltage dropped across the NMOS transistor is sufficient to turn on the second transistor at a low value of current.

Assignments (17)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED
Reel/Frame 059666/0545 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: MICROCHIP TECHNOLOGY INCORPORATED
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041675/0617 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 22, 2014
From: SUPERTEX LLC
To: MICROCHIP TECHNOLOGY INCORPORATED
Reel/Frame 034689/0257 →
CHANGE OF NAME Recorded Dec 19, 2014
From: SUPERTEX, INC.
To: SUPERTEX LLC
Reel/Frame 034682/0134 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 21, 2007
From: WALKER, JAMES T.
To: SUPERTEX, INC.
Reel/Frame 019467/0163 →