IP Library Granted Patent US 7,908,107
Granted Patent B2
US 7,908,107 · App. 11/879,865 · Granted Mar 15, 2011

Line-reflect-reflect match calibration

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Quick Facts
Patent No.
US 7,908,107
App. No.
11/879,865
Granted
Mar 15, 2011
Kind
B2
Abstract

A method of compensating a calibration for a vector network analyzer includes performing calibrations on at least a pair of ports to determine error terms associated with each port wherein at least one of the error terms is based upon selecting the reactance of the load standard from a set of potential values in a manner such that the reference reactance errors are reduced.

Claims (12)

1. A method of calibrating a port of a vector network analyzer comprising the steps of:

(a) determining a magnitude of an expected reflection for a reference open standard;

(b) estimating a plurality of load inductance values for a load;

(c) calculating a magnitude of an estimated reflection for each of said plurality of estimated load inductance values;

(d) determining a difference between said magnitude of said expected reflection for said reference open standard and said magnitude of said estimated reflection for each of said estimated load inductance values; and

(e) selecting one estimated load inductance value that minimizes a sum of said difference between said magnitude of said expected reflection for said reference open standard and said magnitude of said estimated reflection for said estimated load inductance for a plurality of frequencies; and

(f) calibrating a port of said vector network analyzer to correct a measurement at said port for an effect of said one estimated load inductance value.

2. The method of claim 1 wherein said method accounts for differences between the load measured at a probe-tip reference plane and measured at a center-of-thru reference plane.

3. The method of claim 1 wherein each of said plurality of estimated load inductance values comprises a reactance of said load.

4. The method of claim 1 wherein for each of said estimated load inductance values a load impedance at a probe tip is computed.

5. The method of claim 4 wherein each computed load impedance at said probe tip is translated to a thru-center reference plane.

6. The method of claim 5 wherein at least one error term is renormalized based upon said translated computed load impedance.

Assignments (6)
RELEASE OF SECURITY INTEREST Recorded Aug 7, 2025
From: HSBC BANK USA, NATIONAL ASSOCIATION
To: FORMFACTOR, INC.
Reel/Frame 072853/0001 →
SECURITY INTEREST Recorded Jul 29, 2025
From: FORMFACTOR, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
Reel/Frame 072263/0272 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 1, 2021
From: FORMFACTOR BEAVERTON, INC.
To: FORMFACTOR, INC.
Reel/Frame 057393/0609 →
CHANGE OF NAME Recorded Jul 18, 2018
From: CASCADE MICROTECH, INC.
To: FORMFACTOR BEAVERTON, INC.
Reel/Frame 046573/0664 →
SECURITY INTEREST IN UNITED STATES PATENTS AND TRADEMARKS Recorded Jul 12, 2016
From: FORMFACTOR, INC.; ASTRIA SEMICONDUCTOR HOLDINGS, INC.; CASCADE MICROTECH, INC.; MICRO-PROBE INCORPORATED
To: HSBC BANK USA, NATIONAL ASSOCIATION
Reel/Frame 039184/0280 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 25, 2007
From: HAYDEN, LEONARD
To: CASCADE MICROTECH, INC.
Reel/Frame 019912/0993 →