IP Library Granted Patent US 7,511,521
Granted Patent B2
US 7,511,521 · App. 12/045,480 · Granted Mar 31, 2009

Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component

Assignee: AEHR Test Systems
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Quick Facts
Patent No.
US 7,511,521
App. No.
12/045,480
Granted
Mar 31, 2009
Kind
B2
Abstract

In one embodiment, the invention provides a test assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component. The assembly comprises a contactor assembly to interconnect with the test component, a probe assembly to mechanically support the contactor assembly and electrically connect the contactor assembly to the testing machine, and a clamping mechanism comprising a first clamping member and a second clamping member, the clamping members being urged together to exert a clamping force to deform contactor bumps of an electrical connection between the probe assembly and the contactor assembly.

Claims (11)

1. A test assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component, the test assembly comprising:

a contactor assembly comprising first electrical conductors, a plurality of first terminals connected to first ends of the first electrical conductors, a plurality of second terminals connected to second ends of the first electrical conductors, and resilient interconnection elements to electrically interconnect the first terminals to the test component;

a probe assembly comprising a plate component supporting the contactor assembly, and an interface component on the plate component comprising a plurality of external electrical connectors for electrically connecting to the testing machine; a flexible substrate having a first end which is connected to the interface component and a second end opposite the first end, flexible conductors on the flexible substrate, the flexible conductors having a first part which is connected to the interface component and a terminal part at the second end of the flexible substrate, the terminal part comprising a plurality of third terminals which are aligned with the second terminals;

a plurality of electrical contactor bumps between the second and third terminals; and

a clamping mechanism comprising a first clamping member and a second clamping member, the clamping members being urged together to exert a clamping force that moves the second and third terminals together so that the contactor bumps are deformed therebetween.

2. The test assembly of claim 1 , wherein the resilient interconnection elements comprise springs.

3. The test assembly of claim 1 , wherein the first clamping member comprises a metal bar and the second clamping member comprises a contact surface of each third terminal, the clamping mechanism further comprising a fastening bolt and a complementary nut to urge the metal bar towards the third terminals.

4. The test assembly of claim 2 , wherein the clamping mechanism further comprises an expander member located between a head of the fastening bolt and the nut, the expander member being of a resilient material which is under compression and which expands along an axis of the fastening bolt to compensate for loss of clamping force due to elongation of the fastening bolt.

5. The test assembly of claim 4 , wherein the contactor assembly includes an electrical contactor on which is located the plurality of first electrical conductors, the plurality of first terminals and the plurality of second terminals, the electrical contactor and the flexible substrate having complementary fiducial markings to facilitate alignment of the second and third terminals.

6. The test assembly of claim 5 , wherein the conductive bumps are bonded to the third terminals.

7. The contactor assembly of claim 1 , wherein the resilient interconnection elements comprise springs.

Assignments (4)
RELEASE OF SECURITY INTEREST Recorded Nov 5, 2019
From: QVT FUND LP; QUINTESSENCE FUND L.P.
To: AEHR TEST SYSTEMS
Reel/Frame 050928/0695 →
SECURITY INTEREST Recorded Apr 14, 2015
From: AEHR TEST SYSTEMS
To: QVT FUND LP; QUINTESSENCE FUND L.P.
Reel/Frame 035424/0783 →
RELEASE OF SECURITY INTEREST Recorded Apr 13, 2015
From: SILICON VALLEY BANK
To: AEHR TEST SYSTEMS
Reel/Frame 035420/0390 →
SECURITY AGREEMENT Recorded Sep 6, 2013
From: AEHR TEST SYSTEMS
To: SILICON VALLEY BANK
Reel/Frame 031171/0001 →
Continuity (4)
Division 1143384500 · May 12, 2006
Division 1091278500 · Aug 6, 2004
Division 1019710400 · Jul 16, 2002
Related Publication 20080150560A1 · Jun 26, 2008