IP Library Granted Patent US 8,476,965
Granted Patent B2
US 8,476,965 · App. 12/045,588 · Granted Jul 2, 2013

Method and circuit for an operating area limiter

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Quick Facts
Patent No.
US 8,476,965
App. No.
12/045,588
Granted
Jul 2, 2013
Kind
B2
Abstract

The present invention relates to circuits and methods for limiting the operating area of a transistor in a constant current source. The circuits and methods use a detector and a driver to limit the operating area of a transistor. The detector and driver have parameters selected so that, when the voltage at the drain of the transistor satisfies a reference condition, the driver causes drain current of the transistor to decrease. The reference condition is determined relative to the maximum safe drain-to-source voltage at the design drain current of the constant current source.

Claims (45)

1. A circuit for limiting an operating area of a transistor in a constant current source, the circuit comprising:

a driver comprising a variable voltage source coupled to a first input of a first comparator included in the constant current source, the variable voltage source configured for providing a reference voltage to the constant current source, wherein a second input of the first comparator is directly coupled to a source of the transistor in the constant current source and an output of the first comparator is coupled to a gate of the transistor, the driver adapted to be controlled to decrease drain current at the transistor by decreasing the reference voltage provided to the constant current source; and

a detector coupled to the constant current source and to the driver, the detector comprising:

a constant voltage source coupled to a first input of a second comparator included in the detector and configured for providing a set voltage based on determining a safe operating area of the transistor; and

the second comparator including the first input, a second input connected to a drain of the transistor of the constant current source, and an output coupled to the variable voltage source included in the driver, the second comparator being adapted to:

compare the set voltage output from the constant voltage source with voltage at the drain of the transistor; and

output a signal to control the variable voltage source to decrease the drain current at the transistor and, by controlling the variable voltage source to decrease the drain current, cause the transistor to operate in the safe operating area for the transistor, wherein the comparator is adapted to output the signal to control the variable voltage source in response to the voltage at the drain of the transistor exceeding the set voltage output from the constant voltage source.

2. The circuit of claim 1 , wherein the driver comprises:

means for changing the voltage at the reference voltage of the constant current source when the voltage at the drain of the transistor satisfies a reference condition.

3. The circuit of claim 2 , wherein the means for changing the voltage at the reference voltage of the constant current source comprises a resistor and a switch.

4. The circuit of claim 2 wherein the means for changing the voltage at the reference voltage of the constant current source comprises a potentiometer.

5. The circuit of claim 2 wherein the means for changing the voltage at the reference voltage of the constant current source comprises a switch and a first resistor and a second resistor.

6. The circuit of claim 2 , wherein the reference condition is based on the safe operating area of the transistor.

7. The circuit of claim 1 , wherein the driver comprises:

means for increasing a resistance of a sensing resistor of the constant current source.

8. The circuit of claim 1 , wherein the detector comprises a signal processor.

9. The circuit of claim 8 , comprising:

means for maintaining the drain current at its decreased level until a reset signal is received by the signal processor.

10. The circuit of claim 1 , wherein the detector comprises an operational amplifier.

11. The circuit of claim 1 , wherein the detector comprises a digital device.

12. The circuit of claim 1 , wherein the detector comprises an analog device.

13. The circuit of claim 1 , wherein the driver comprises a multiplexer and a digital-to-analog converter.

14. The circuit of claim 13 , wherein:

the multiplexer has a first, second, and third input and an output wherein a normal condition signal is connected to the first input, a fault condition signal is connected to the second input, and the output of the detector is connected to the third input; and

the digital-to-analog converter has an input and an output, wherein the output of the multiplexer is connected to the input of the digital-to-analog converter and the output of the digital-to-analog converter is connected to a reference voltage of the constant current source,

the multiplexer and digital-to-analog converter having parameters selected so that, when the voltage at the drain of the transistor does not satisfy the reference condition, the multiplexer passes the normal-condition signal at its first input to the digital-to-analog converter, and

the multiplexer and digital-to-analog converter having parameters selected so that, when the voltage at the drain of the transistor satisfies the reference condition, the multiplexer passes the fault condition signal at its second input to the digital-to-analog controller causing the digital-to-analog controller to reduce the voltage at its output thereby reducing the reference voltage of the constant current source.

15. The circuit of claim 1 , wherein the circuit is configured for controlling the constant current source that is operable for providing a stable current to a light emitting diode (LED) array.

16. A method for limiting an operating area of a transistor in a constant current source, the method comprising:

determining a safe operating area of the transistor;

configuring a constant voltage source included in a detector coupled to the constant current source for providing a set voltage based on determining the safe operating area of the transistor;

detecting a voltage at a drain of the transistor;

comparing, by a first comparator included in the detector, the voltage at the drain of the transistor to the set voltage at the constant voltage source, the first comparator including a first input coupled to the constant voltage source and a second input coupled to the drain of the transistor;

determining whether the voltage at the drain of the transistor exceeds the set voltage based on the comparing;

responsive to determining that the voltage at the drain of the transistor exceeds the set voltage, controlling a driver comprising a variable voltage source coupled to an output of the first comparator for reducing a reference voltage that is provided by the variable voltage source to a second comparator included in the constant current source; and

based on reducing the reference voltage provided to the second comparator, decreasing the drain current at the transistor and causing the transistor to operate in the safe operating area for the transistor, wherein the drain current at the transistor is controlled by the second comparator, with an input of the second comparator directly coupled to a source of the transistor and an output of the second comparator coupled to a gate of the transistor.

17. The method of claim 16 , further comprising:

changing the voltage at a reference voltage of the constant current source when the voltage at the drain of the transistor satisfies a reference condition.

18. The method of claim 16 , further comprising:

increasing a resistance of a sensing resistor of the constant current source.

19. The method of claim 16 , comprising:

providing a stable current to a light emitting diode (LED) array coupled to the constant current source.

20. The method of claim 16 , wherein determining whether the voltage at the drain of the transistor exceeds the set value based on the comparing comprises:

determining whether the voltage at the drain of the transistor exceeds the set voltage for a specified time duration; and

responsive to determining that the voltage at the drain of the transistor exceeds the set voltage for the specified time duration, controlling the driver to decrease the reference voltage provided to the second comparator by the variable voltage source.

Assignments (20)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: ATMEL CORPORATION
Reel/Frame 038376/0001 →
PATENT SECURITY AGREEMENT Recorded Jan 3, 2014
From: ATMEL CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC. AS ADMINISTRATIVE AGENT
Reel/Frame 031912/0173 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 14, 2011
From: MSILICA INCORPORATED
To: ATMEL CORPORATION
Reel/Frame 026128/0680 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 13, 2011
From: SANTO, HENDRIK; S, DILIP; VI, KIEN; GHOMAN, RANAJIT; SCHINDLER, MATTHEW D.
To: MSILICA INCORPORATED
Reel/Frame 026121/0365 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 17, 2010
From: MSILICA INCORPORATED
To: ATMEL CORPORATION
Reel/Frame 025383/0625 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 16, 2008
From: SANTO, HENDRIK; S, DILIP; VI, KIEN; GHOMAN, RANAJIT; SCHINDLER, MATTHEW D.
To: MSILICA, INCORPORATED
Reel/Frame 020960/0936 →