IP Library Granted Patent US 9,059,074
Granted Patent B2
US 9,059,074 · App. 12/055,526 · Granted Jun 16, 2015

Integrated circuit package system with planar interconnect

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Quick Facts
Patent No.
US 9,059,074
App. No.
12/055,526
Granted
Jun 16, 2015
Kind
B2
Abstract

An integrated circuit package system includes: mounting an integrated circuit die adjacent to a lead; forming a first encapsulation around and exposing the integrated circuit die and the lead; and forming a planar interconnect between the integrated circuit die and the lead with the planar interconnect on the first encapsulation.

Claims (38)

1. A method of manufacture of an integrated circuit package system comprising:

mounting an integrated circuit die adjacent to a lead,

forming a first encapsulation in direct contact with the integrated circuit die and the lead, the first encapsulation exposing an active side of the integrated circuit die and the lead;

forming a planar interconnect having an interconnect top side in direct contact with the active side of the integrated circuit die, the lead bottom side of the lead, and the first encapsulation; and

forming a second encapsulation covering a non-horizontal side of the planar interconnect, the second encapsulation in direct contact with the active side of the integrated circuit die, the lead bottom side of the lead, and the bottom side of the planar interconnect opposite from the interconnect top side, and the second encapsulation is a transparent laminated epoxy layer, a transparent screen printed epoxy layer, or a transparent stencil printed epoxy layer for image sensor applications and electromagnetic wave activation applications, wherein a top surface of the second encapsulation coplanar with the lead bottom side of the lead, the interconnect top side, and the active side of the integrated circuit die.

2. The method as claimed in claim 1 wherein forming the second encapsulation includes covering the planar interconnect and the integrated circuit die with the second encapsulation.

3. The method as claimed in claim 1 wherein forming the planar interconnect includes forming the planar interconnect in direct contact with the integrated circuit die, the first encapsulation, and the lead.

4. The method as claimed in claim 1 wherein forming the first encapsulation in direct contact with and exposing the integrated circuit die and the lead includes forming the first encapsulation coplanar with both the lead bottom side and the active side of the integrated circuit die.

5. The method as claimed in claim 1 further comprising coupling an external interconnect with the lead.

6. A method of manufacture of an integrated circuit package system, comprising:

mounting an integrated circuit die adjacent to a lead;

forming a first encapsulation around the integrated circuit die and the lead with an active side of the integrated circuit die and the lead exposed;

forming a planar interconnect in direct contact with the active side and the lead, with the planar interconnect on the first encapsulation; and

forming a second encapsulation covering a non-horizontal side of the planar interconnect; the second encapsulation in direct contact with the active side of the integrated circuit die, a lead bottom side of the lead, and an interconnect bottom side of the planar interconnect that is opposite from an interconnect top side, the second encapsulation is a transparent laminated epoxy layer, a transparent screen printed epoxy layer, or a transparent stencil printed epoxy layer for image sensor applications and electromagnetic wave activation applications,

a top surface of the second encapsulation coplanar with the lead bottom side of the lead, the interconnect top side, and the active side of the integrated circuit die.

7. The method as claimed in claim 6 wherein forming the second encapsulation includes forming the second encapsulation having a transparent property and covering the planar interconnect and the integrated circuit die.

8. The method as claimed in claim 6 wherein forming the second encapsulation includes forming the second encapsulation adjacent to the lead and covering the planar interconnect and the integrated circuit die.

9. The method as claimed in claim 6 wherein the integrated circuit die includes an optically active circuitry.

10. The method as claimed in claim 6 further comprising forming an external interconnect coupled to the planar interconnect.

11. An integrated circuit package system comprising:

a lead;

an integrated circuit die adjacent to the lead;

a first encapsulation in direct contact with the integrated circuit die and the lead, the first encapsulation exposing an active side of the integrated circuit die and the lead;

a planar interconnect having an interconnect top side in direct contact with the active side of the integrated circuit die, a lead bottom side of the lead, and the first encapsulation; and

a second encapsulation covers a non-horizontal side of the planar interconnect, the second encapsulation in direct contact with the active side of the integrated circuit die, the lead bottom side of the lead, and the interconnect bottom side of the planar interconnect opposite from the interconnect top side, the second encapsulation is a transparent laminated epoxy layer, a transparent screen printed epoxy layer, or a transparent stencil printed epoxy layer for image sensor applications and electromagnetic wave activation applications,

a top surface of the second encapsulation coplanar with the lead bottom side of the lead, the interconnect top side, and the active side of the integrated circuit die.

12. The system as claimed in claim 11 wherein the second encapsulation covers the planar interconnect and the integrated circuit die.

13. The system as claimed in claim 11 wherein the planar interconnect is in direct contact with the integrated circuit die, the first encapsulation, and the lead.

14. The system as claimed in claim 11 wherein the first encapsulation is coplanar with both the lead bottom side and the active side of the integrated circuit die.

15. The system as claimed in claim 11 further comprising an external interconnect coupled with the lead.

16. The system as claimed in claim 11 wherein:

the integrated circuit die includes the active side;

the first encapsulation exposes the active side and the lead; and

the planar interconnect in direct contact with the active side and the lead.

17. The system as claimed in claim 16 wherein the second encapsulation, having a transparent property, covers the planar interconnect and the integrated circuit die.

18. The system as claimed in claim 16 wherein the second encapsulation, adjacent to the lead, covers the planar interconnect and the integrated circuit die.

19. The system as claimed in claim 16 wherein the integrated circuit die includes an optically active circuitry.

20. The system as claimed in claim 16 further comprising an external interconnect coupled to the planar interconnect.

Assignments (4)
RELEASE OF SECURITY INTEREST Recorded Jun 18, 2020
From: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
To: STATS CHIPPAC, INC.; STATS CHIPPAC PTE. LTD. FORMERLY KNOWN AS STATS CHIPPAC LTD.
Reel/Frame 052972/0001 →
CHANGE OF NAME Recorded Jul 22, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 039428/0928 →
SECURITY INTEREST Recorded Nov 20, 2015
From: STATS CHIPPAC, INC.; STATS CHIPPAC LTD.
To: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
Reel/Frame 037096/0315 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 29, 2008
From: CAMACHO, ZIGMUND RAMIREZ; TAY, LIONEL CHIEN HUI; BATHAN, HENRY DESCALZO; ADVINCULA, ABELARDO JR. HADAP
To: STATS CHIPPAC LTD.
Reel/Frame 020724/0077 →