IP Library Granted Patent US 7,969,195
Granted Patent B1
US 7,969,195 · App. 12/265,609 · Granted Jun 28, 2011

Active biasing in metal oxide semiconductor (MOS) differential pairs

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Quick Facts
Patent No.
US 7,969,195
App. No.
12/265,609
Granted
Jun 28, 2011
Kind
B1
Abstract

Apparatus and methods advantageously maintain transistors of open-drain differential pairs biased in the saturation region when “active,” rather in than the triode or linear region. The biasing techniques are effective over a broad range of process, voltage, and temperature (PVT) variations. By controlling a high voltage level used to drive the gate of a transistor of the differential pair, the biasing of the transistor in the saturation region is maintained. In one embodiment, the low voltage level used to cut off the transistor of the differential pair is also controlled. These techniques advantageously permit differential drivers to exhibit relatively large output swings, relatively high edge rates, relatively high return loss, and relatively good efficiency.

Claims (17)

1. A method of biasing a differential driver with a first transistor and a second transistor, the method comprising:

providing a differential drive signal to a gate of the first transistor and to a gate of the second transistor, wherein each portion of the differential drive signal is switched between a first voltage level and a second voltage level higher than the first voltage level in a complementary manner such that the transistor receiving the first voltage level is deactivated and the transistor receiving the second voltage level is activated; and

electronically adjusting at least the second voltage level such that the activated transistor is operating in the saturation region, wherein the second voltage level is adjusted by regulating a voltage at a source terminal of the first transistor and the second transistor.

2. The method as defined in claim 1 , wherein the voltage at the source terminal is regulated to a reference voltage having a predetermined value.

3. The method as defined in claim 1 , wherein the voltage at the source terminal is regulated to a reference voltage that varies at least partially in response to changing saturation voltage V DSAT .

4. The method as defined in claim 1 , further comprising low-pass filtering the voltage at a source terminal when sensing for voltage for regulation.

5. The method as defined in claim 1 , wherein electronically adjusting the second voltage level further comprises using a feedback loop to regulate a voltage at a source terminal of the first transistor and the second transistor, wherein the second voltage level is in the feedback loop.

6. The method as defined in claim 1 , wherein electronically adjusting at least the second voltage level comprises compensating for process, voltage, and temperature (PVT) variations.

7. The method as defined in claim 1 , further comprising biasing a third transistor in the saturation region, wherein the third transistor is coupled to the sources of the first transistor and the second transistor, wherein the third transistor is used as a current sink or current source.

8. A method of biasing a differential driver with a first transistor and a second transistor, the method comprising:

providing a differential drive signal to a gate of the first transistor and to a gate of the second transistor, wherein each portion of the differential drive signal is switched between a first voltage level and a second voltage level higher than the first voltage level in a complementary manner such that the transistor receiving the first voltage level is deactivated and the transistor receiving the second voltage level is activated;

electronically adjusting at least the second voltage level such that the activated transistor is operating in the saturation region;

regulating a source voltage of an activated replica transistor such that the activated replica transistor is operating in the saturation region; and

using an adjustment signal for the activated replica transistor as a reference voltage for the second voltage level of the differential drive.

9. The method as defined in claim 8 , wherein the activated replica transistor is half of a replica differential pair.

10. The method as defined in claim 8 , wherein electronically adjusting at least the second voltage level comprises compensating for process, voltage, and temperature (PVT) variations.

11. The method as defined in claim 8 , further comprising biasing a third transistor in the saturation region, wherein the third transistor is coupled to the sources of the first transistor and the second transistor, wherein the third transistor is used as a current sink or current source.

Assignments (9)
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
RELEASE OF SECURITY INTEREST Recorded May 29, 2018
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: MICROSEMI STORAGE SOLUTIONS, INC.; MICROSEMI STORAGE SOLUTIONS (U.S.), INC.
Reel/Frame 046251/0271 →
CHANGE OF NAME Recorded Apr 7, 2016
From: PMC-SIERRA, INC.
To: MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 038381/0753 →
PATENT SECURITY AGREEMENT Recorded Feb 3, 2016
From: MICROSEMI STORAGE SOLUTIONS, INC. (F/K/A PMC-SIERRA, INC.); MICROSEMI STORAGE SOLUTIONS (U.S.), INC. (F/K/A PMC-SIERRA US, INC.)
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037689/0719 →
RELEASE OF SECURITY INTEREST Recorded Feb 1, 2016
From: BANK OF AMERICA, N.A.
To: PMC-SIERRA, INC.; PMC-SIERRA US, INC.; WINTEGRA, INC.
Reel/Frame 037675/0129 →
SECURITY INTEREST IN PATENTS Recorded Aug 6, 2013
From: PMC-SIERRA, INC.; PMC-SIERRA US, INC.; WINTEGRA, INC.
To: BANK OF AMERICA, N.A.
Reel/Frame 030947/0710 →