IP Library Granted Patent US 7,898,281
Granted Patent B2
US 7,898,281 · App. 12/316,511 · Granted Mar 1, 2011

Interface for testing semiconductors

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Quick Facts
Patent No.
US 7,898,281
App. No.
12/316,511
Granted
Mar 1, 2011
Kind
B2
Abstract

A system includes an imaging device for capturing a video sequence and a display for displaying the video in a window of the display and effectively positioning a probe relative to probe pads of a device under test for testing a semiconductor wafer supported by a support of a probing environment.

Claims (16)

1. A method for displaying video on a display for a probing system comprising:

(a) receiving a video sequence that includes a plurality of frames sequentially presented at a frame rate and imaging a device under test from light traversing a single optical path extending through a single object lens;

(b) presenting said video sequence in a first window on said display;

(c) simultaneously presenting a portion of said video sequence including a plurality of sequentially presented frames in a second window on said display, a frame of said portion of said video sequence comprising a portion of an image in a frame of said video sequence; and

(d) simultaneously presenting another portion of said video sequence including a plurality of sequentially presented frames in a third window on said display, a frame of said another portion of said video sequence comprising another portion of said image of said frame of said video sequence.

2. The method of claim 1 wherein said single object lens is included together with a microscope.

3. The method of claim 1 wherein said single optical path extends to a single sensing device.

4. The method of claim 1 wherein said first window is larger than said second window.

5. The method of claim 4 wherein said first window is larger than said third window.

6. The method of claim 1 wherein a feature viewable in said second window has a larger scale than the corresponding feature when viewed in said first window.

7. The method of claim 6 wherein a feature viewable in said third window has a larger scale than the corresponding feature when viewed in said second window.

8. The method of claim 1 wherein the corresponding portions of said second window and said third window in said first window are non-overlapping.

9. The method of claim 1 wherein said second window is capable of being resized.

10. The method of claim 9 wherein said third window is capable of being resized.

11. The method of claim 1 wherein said first window is capable of being resized.

12. The method of claim 1 wherein said second window and said third window are automatically provided based upon receiving an interaction with said system.

Assignments (6)
RELEASE OF SECURITY INTEREST Recorded Aug 7, 2025
From: HSBC BANK USA, NATIONAL ASSOCIATION
To: FORMFACTOR, INC.
Reel/Frame 072853/0001 →
SECURITY INTEREST Recorded Jul 29, 2025
From: FORMFACTOR, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
Reel/Frame 072263/0272 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 1, 2021
From: FORMFACTOR BEAVERTON, INC.
To: FORMFACTOR, INC.
Reel/Frame 057393/0609 →
CHANGE OF NAME Recorded Jul 18, 2018
From: CASCADE MICROTECH, INC.
To: FORMFACTOR BEAVERTON, INC.
Reel/Frame 046573/0664 →
SECURITY INTEREST IN UNITED STATES PATENTS AND TRADEMARKS Recorded Jul 12, 2016
From: FORMFACTOR, INC.; ASTRIA SEMICONDUCTOR HOLDINGS, INC.; CASCADE MICROTECH, INC.; MICRO-PROBE INCORPORATED
To: HSBC BANK USA, NATIONAL ASSOCIATION
Reel/Frame 039184/0280 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 12, 2008
From: ANDREWS, PETER; HESS, DAVID; NEW, ROBERT
To: CASCADE MICROTECH, INC.
Reel/Frame 022036/0523 →