Integrated circuit packaging system with leadframe interposer and method of manufacture thereof

1. A method of manufacture of an integrated circuit packaging system comprising:

forming a substrate;

mounting a base integrated circuit on the substrate;

forming a leadframe interposer, over the base integrated circuit, by:

providing a metal sheet,

mounting an integrated circuit die on the metal sheet,

injecting a molded package body on the integrated circuit die and the metal sheet, and

forming a ball pad, a bond finger, and a test pad from the metal sheet that is not protected by the molded package body, the test pad arranged between a number of bond fingers;

coupling a circuit package on the ball pad; and

forming a component package on the substrate, the base integrated circuit, and the leadframe interposer.

2. The method as claimed in claim 1 wherein forming the ball pad, and the bond finger includes forming a signal trace between the ball pad and the bond finger.

3. The method as claimed in claim 1 further comprising mounting an integrated circuit spacer between the base integrated circuit and the molded package body of the leadframe interposer.

4. The method as claimed in claim 1 further comprising coupling an electrical interconnect between the base integrated circuit, the bond finger, the substrate, or a combination thereof.

5. The method as claimed in claim 1 further comprising forming an isolation shield between the ball pad and the bond finger.

6. A method of manufacture of an integrated circuit packaging system comprising:

forming a substrate including forming a contact via in the substrate;

mounting a base integrated circuit on the substrate including applying an adhesive between the base integrated circuit and the substrate;

forming a leadframe interposer, over the base integrated circuit, by:

embossing a metal sheet including foming an array by pressing, etching, laser trimming, or a combination thereof,

mounting an integrated circuit die on the metal sheet including coupling a test pad to the integrated circuit die,

injecting a molded package body on the integrated circuit die and the metal sheet including injecting an epoxy molding compound, and

etching a ball pad, a bond finger, and a test pad from the metal sheet that is not protected by the molded package body including forming a one-on-one connection between the ball pad and the bond finger, the test pad arranged between a number of bond fingers:

coupling a circuit package on the ball pad including coupling an integrated circuit, discrete components, or a combination thereof; and

forming a component package on the substrate, the base integrated circuit, and the leadframe interposer.

7. The method as claimed in claim 6 wherein etching the ball pad and the bond finger includes etching a signal trace between the ball pad and the bond finger including controlling an impedance by placing an isolation shield near the signal trace.

8. The method as claimed in claim 6 further comprising mounting an integrated circuit spacer between the base integrated circuit and the molded package body of the leadframe interposer including providing an electrical interconnect in the integrated circuit spacer.

9. The method as claimed in claim 6 further comprising coupling an electrical interconnect between the base integrated circuit, the bond finger, the substrate, or a combination thereof including coupling a signal between the base integrated circuit, the integrated circuit die, the circuit package, or a combination thereof.

10. The method as claimed in claim 6 further comprising embossing an isolation shield between the ball pad and the bond finger including coupling a shorting bridge between the isolation shield and the test pad.

11. An integrated circuit packaging system comprising:

a substrate;

a base integrated circuit mounted on the substrate;

a leadframe interposer, over the base integrated circuit, includes:

a ball pad, a bond finger, and a test pad, the test pad arranged between a number of bond fingers,

an integrated circuit die mounted over the ball pad, and

a molded package body on the integrated circuit die, the ball pad, and the bond finger;

a circuit package coupled on the ball pad; and

a component package on the substrate, the base integrated circuit, and the leadframe interposer.

12. The system as claimed in claim 11 wherein the ball pad and the bond finger includes a signal trace between the ball pad and the bond finger.

13. The system as claimed in claim 11 further comprising an integrated circuit spacer between the base integrated circuit and the molded package body of the leadframe interposer.

14. The system as claimed in claim 11 further comprising an electrical interconnect between the base integrated circuit, the bond finger, the substrate, or a combination thereof.

15. The system as claimed in claim 11 further comprising an isolation shield between the ball pad and the bond finger.

16. The system as claimed in claim 11 further comprising:

a contact via in the substrate;

an adhesive between the base integrated circuit and the substrate; and

wherein:

the test pad is coupled to the integrated circuit die.

17. The system as claimed in claim 16 wherein the ball pad and the bond finger includes a signal trace between the ball pad and the bond finger with an isolation shield near the signal trace.

18. The system as claimed in claim 16 further comprising an integrated circuit spacer between the base integrated circuit and the molded package body of the leadframe interposer includes an electrical interconnect in the integrated circuit spacer.

19. The system as claimed in claim 16 further comprising an electrical interconnect between the base integrated circuit, the bond finger, the substrate, or a combination thereof includes a signal coupled by a system interconnect to the base integrated circuit, the integrated circuit die, the circuit package, or the combination thereof.

20. The system as claimed in claim 16 further comprising an isolation shield between the ball pad and the bond finger includes a shorting bridge between the isolation shield and the test pad.