IP Library Granted Patent US 7,978,507
Granted Patent B2
US 7,978,507 · App. 12/339,363 · Granted Jul 12, 2011

Pulse reset for non-volatile storage

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Quick Facts
Patent No.
US 7,978,507
App. No.
12/339,363
Granted
Jul 12, 2011
Kind
B2
Abstract

A non-volatile storage system includes a substrate, control circuitry on the substrate, a three dimensional memory array (above the substrate) that includes a plurality of memory cells with reversible resistance-switching elements, and circuits to SET and RESET the resistance-switching elements. The circuits that RESET the resistance-switching elements provide a pulse to the memory cells that is large enough in magnitude to SET and RESET the memory cells, and long enough to potentially RESET the memory cell but not long enough to SET the memory cells.

Claims (82)

1. A method for operating non-volatile storage, comprising:

programming a non-volatile storage element from a first predetermined resistance state to a second predetermined resistance state by applying a programming voltage for a first period of time, the non-volatile storage element changes from the first predetermined resistance state to the second predetermined resistance state in response to a first voltage magnitude, the non-volatile storage element changes from the second predetermined resistance state to the first predetermined resistance state in response to a second voltage magnitude, the programming voltage is at least as large as the second voltage magnitude, the first period of time is shorter than needed to change the non-volatile storage element to the first predetermined resistance state in response to the programming voltage.

2. The method of claim 1 , wherein:

the first predetermined resistance state is a low resistance state; and

the second predetermined resistance state is a high resistance state.

3. The method of claim 1 , further comprising:

verifying whether the non-volatile storage element is in the second predetermined resistance state after the first period of time; and

repeating the programming if the non-volatile storage element is not in the second predetermined resistance state.

4. The method of claim 1 , further comprising:

determining whether the non-volatile storage element is in the second predetermined resistance state during the first period of time; and

repeating the programming if the non-volatile storage element is not in the second predetermined resistance state.

5. The method of claim 1 , wherein the programming of the non-volatile storage element from a first predetermined resistance state to a second predetermined resistance state comprises:

applying a voltage to a data line; and

applying a voltage pulse to a selection circuit so that the selection circuit connects the data line to a control line during the pulse, the control line is in communication with the non-volatile storage element.

6. The method of claim 5 , further comprising:

sensing a voltage at the data line during the first time period; and

reporting that the non-volatile storage element is in the second predetermined resistance state in response to sensing the voltage at the data line.

7. The method of claim 1 , further comprising:

programming the non-volatile storage element from the second predetermined resistance state to the first predetermined resistance state by applying a programming pulse with a rising amplitude to a data line in communication with the nonvolatile storage element;

sensing a particular voltage at the data line during the programming pulse with the rising amplitude; and

terminating the programming pulse with the rising amplitude in response to sensing the particular voltage at the data line.

8. The method of claim 1 , wherein:

the non-volatile storage element includes reversible resistance-switching material and a steering device.

9. The method of claim 8 , wherein:

the steering device is a diode.

10. The method of claim 1 , wherein:

the second voltage magnitude is larger the first voltage magnitude.

11. The method of claim 1 , wherein:

the first voltage magnitude is larger than the second voltage magnitude.

12. A non-volatile storage system, comprising:

a non-volatile storage element;

a voltage providing circuit that selectively provides a programming voltage, the non-volatile storage element changes from a first predetermined resistance state to a second predetermined resistance state in response to a first voltage magnitude, the non-volatile storage element changes from the second predetermined resistance state to the first predetermined resistance state in response to a second voltage magnitude, the programming voltage is at least as large the second voltage magnitude; and

a selection circuit that selectively connects the non-volatile storage element to the voltage providing circuit for a first period of time, the first period of time is shorter than needed to change the non-volatile storage element to the first predetermined resistance state in response to the programming voltage.

13. The non-volatile storage system of claim 12 , wherein the voltage providing circuit comprises:

a switch receiving the programming voltage at a first terminal and a selection signal at a second terminal; and

a data line in communication with the selection circuit and a third terminal of the switch, the switch selectively provides the programming voltage to the data line in response to the selection signal.

14. The non-volatile storage system of claim 12 , wherein:

the selection circuit selectively connects the non-volatile storage element to an unselected storage element voltage before and after the first period.

15. The non-volatile storage system of claim 12 , wherein the selection circuit comprises:

an inverter having a data input and power input and output, the inverter receives a selection signal at the data input and a pulse at the power input;

a first switch with a gate in communication with the output of the inverter;

a second switch with a gate in communication with the output of the inverter, the first switch is in communication with the voltage providing circuit and a control line for the non-volatile storage element, the second switch is in communication to the control line for the non-volatile storage element and an unselected storage element voltage.

16. The non-volatile storage system of claim 15 , wherein the voltage providing circuit comprises:

a third switch receiving the programming voltage at a first terminal and a selection signal at a second terminal; and

a data line in communication with the first switch and a third terminal of the third switch, the third switch selectively provides the programming voltage to the data line in response to the selection signal.

17. The non-volatile storage system of claim 12 , further comprising:

a sensing circuit in communication with the voltage providing circuit, the sensing circuit senses a particular voltage at the voltage providing circuit that indicates that the non-volatile storage element changed from the first predetermined resistance state to the second predetermined resistance state, the sensing circuit outputs an indication that the non-volatile storage element changed from the first predetermined resistance state to the second predetermined resistance state in response to sensing the particular voltage.

18. The non-volatile storage system of claim 12 , wherein:

the voltage providing circuit includes a data line in communication with the selection circuit;

the non-volatile storage system further comprises a rising pulse providing circuit in communication with the data line and a transition detection circuit in communication with the data line and the rising pulse providing circuit;

the rising pulse providing circuit provide a voltage pulse with a rising magnitude;

the transition detection circuit detects a predetermined current change in the non-volatile storage element and outputs an indication that the non-volatile storage element has changed to the first resistance state in response to detecting the predetermined current change in the non-volatile storage element; and

the rising pulse providing circuit terminates the voltage pulse before the voltage pulse is completed in response to the indication that the non-volatile storage element has changed to the first resistance state.

19. The non-volatile storage system of claim 12 , wherein:

the non-volatile storage element includes reversible resistance-switching material and a steering device.

20. The non-volatile storage system of claim 19 , wherein:

the steering device is a diode.

21. The non-volatile storage system of claim 12 , wherein:

the first predetermined resistance state is a low resistance state; and

the second predetermined resistance state is a high resistance state.

22. The non-volatile storage system of claim 12 , wherein:

the non-volatile storage element is part of a monolithic three dimensional memory array.

23. The non-volatile storage system of claim 12 , wherein:

the second voltage magnitude is greater than or equal to the first voltage magnitude.

24. The non-volatile storage system of claim 12 , wherein:

the first voltage magnitude is greater than or equal to the second voltage magnitude.

25. A non-volatile storage system, comprising:

a non-volatile storage element; and

an electrical circuit in communication with the non-volatile storage element, the electrical circuit programs the non-volatile storage element from a first predetermined resistance state to a second predetermined resistance state by a applying a programming voltage for a first period of time, the non-volatile storage element changes from the first predetermined resistance state to the second predetermined resistance state in response to a first voltage magnitude, the non-volatile storage element changes from the second predetermined resistance state to the first predetermined resistance state in response to a second voltage magnitude, the programming voltage is at least as large as the second voltage magnitude, the first period of time is shorter than needed to change the non-volatile storage element to the first predetermined resistance state in response to the programming voltage.

26. The non-volatile storage system of claim 25 , wherein:

the non-volatile storage element includes reversible resistance-switching material and a steering device;

the first predetermined resistance state is a low resistance state;

the second predetermined resistance state is a high resistance state; and

the non-volatile storage element is part of a monolithic three dimensional memory array.

27. The non-volatile storage system of claim 25 , wherein:

the electrical circuit selectively connects the non-volatile storage element to an unselected storage element voltage before and after the first period.

28. The non-volatile storage system of claim 25 , further comprising:

a sensing circuit in communication with the electrical circuit, the sensing circuit senses a predetermined voltage condition at the electrical circuit during the first period that indicates that the non-volatile storage element changed from the first predetermined resistance state to the second predetermined resistance state, the sensing circuit outputs during the first period an indication that the non-volatile storage element changed from the first predetermined resistance state to the second predetermined resistance state in response to sensing the predetermined voltage condition.

29. The non-volatile storage system of claim 25 , wherein:

the second voltage magnitude is greater than or equal to the first voltage magnitude.

30. The non-volatile storage system of claim 25 , wherein:

the first voltage magnitude is greater than or equal to the second voltage magnitude.

Assignments (6)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 8, 2025
From: SANDISK TECHNOLOGIES, INC.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 070778/0160 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2024
From: SANDISK TECHNOLOGIES LLC
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 069796/0423 →
CHANGE OF NAME Recorded May 25, 2016
From: SANDISK TECHNOLOGIES INC
To: SANDISK TECHNOLOGIES LLC
Reel/Frame 038809/0600 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT LISTED PATENT NUMBER 8853569 TO THE CORRECT PATENT NUMBER 8883569 PREVIOUSLY RECORDED ON REEL 038300 FRAME 0665. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Apr 25, 2016
From: SANDISK 3D LLC
To: SANDISK TECHNOLOGIES INC.
Reel/Frame 038520/0552 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 30, 2016
From: SANDISK 3D LLC.
To: SANDISK TECHNOLOGIES INC.
Reel/Frame 038300/0665 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 19, 2008
From: SCHEUERLEIN, ROY E.
To: SANDISK 3D LLC
Reel/Frame 022008/0621 →