IP Library Granted Patent US 7,990,797
Granted Patent B2
US 7,990,797 · App. 12/369,040 · Granted Aug 2, 2011

State of health monitored flash backed dram module

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Quick Facts
Patent No.
US 7,990,797
App. No.
12/369,040
Granted
Aug 2, 2011
Kind
B2
Abstract

A device includes: non-volatile memory; a controller in communication with the non-volatile memory, wherein the controller is programmed to move data from a volatile memory to the non-volatile memory upon a loss of power of a primary power source of the volatile memory; and a backup power supply providing temporary power to the controller and the volatile memory upon the loss of power of the primary power source, including: a capacitor bank with an output terminal; a connection to a voltage source that charges the capacitor bank to a normal operating voltage; and a state-of-health monitor that is programmed to generate a failure signal based on a voltage at the output terminal of the capacitor bank.

Claims (24)

1. A device comprising:

non-volatile memory;

a controller in communication with the non-volatile memory, wherein the controller is programmed to move data from a volatile memory to the non-volatile memory upon a loss of power of a primary power source for the volatile memory; and

a backup power supply for providing temporary power to the controller and the volatile memory upon the loss of power of the primary power source, comprising:

a capacitor bank with an output terminal;

a connection for connecting to a voltage source that charges the capacitor bank to a normal operating voltage; and

a state-of-health monitor for the backup power supply that is programmed to generate a failure signal based on a voltage at the output terminal of the capacitor bank.

2. The memory device of claim 1 , where the state-of-health monitor is further programmed to:

interrupt the charging of the capacitor bank by the voltage source;

while the charging is interrupted, apply a predetermined resistance across the output terminal of the capacitor bank for a predetermined period of time;

monitor the output terminal of the capacitor bank during the predetermined period of time to determine whether the voltage at the output terminal falls below a predetermined threshold voltage; and

if the voltage at the output terminal falls below the predetermined threshold voltage within the predetermined period of time, generate the failure signal.

3. The memory device of claim 2 , wherein the predetermined resistance and predetermined time are determined to keep the voltage across the output terminal of the capacitor above a necessary operating voltage.

4. The memory device of claim 1 , wherein the capacitor bank comprises a plurality of capacitors in parallel.

5. The memory device of claim 4 , further comprising a capacitor-level terminal at each capacitor of the plurality of capacitors and wherein the state-of-health monitor is further programmed to generate the failure signal based on a voltage at any of the capacitor-level terminals.

6. The memory device of claim 1 , further comprising:

a processor in communication with the volatile memory and a permanent storage system, wherein, if the failure signal is generated by the controller, the processor is programmed to move the data from the volatile memory to the permanent storage system.

7. The memory device of claim 6 , wherein the permanent storage system comprises a hard drive.

8. The memory device of claim 1 , wherein the volatile memory comprises a dynamic random access memory.

9. The memory device of claim 1 , wherein the non-volatile memory comprises electrically erasable programmable read-only memories (EEPROMs).

10. The memory device of claim 1 , wherein the controller comprises at least one of an application-specific integrated circuit (ASIC) and a field programmable gate array (FPGA).

11. The memory device of claim 1 , wherein the controller is further programmed to move data from the non-volatile memory to the volatile memory upon a restoration of power of the primary power source.

12. The memory device of claim 1 , wherein the controller and the backup power supply are in communication through a configuration data bus.

13. The memory device of claim 11 , wherein the configuration data bus is an I2C bus.

Assignments (12)
SECURITY AGREEMENT (SUPPLEMENTAL) Recorded Nov 14, 2024
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 069411/0208 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 11, 2024
From: SANDISK TECHNOLOGIES, INC.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 069168/0273 →
PATENT COLLATERAL AGREEMENT Recorded Aug 23, 2024
From: SANDISK TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS THE AGENT
Reel/Frame 068762/0494 →
CHANGE OF NAME Recorded Jun 27, 2024
From: SANDISK TECHNOLOGIES, INC.
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 067982/0032 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 29, 2024
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 067567/0682 →
PATENT COLLATERAL AGREEMENT - DDTL LOAN AGREEMENT Recorded Aug 21, 2023
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 067045/0156 →
PATENT COLLATERAL AGREEMENT - A&R LOAN AGREEMENT Recorded Aug 21, 2023
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 064715/0001 →
RELEASE OF SECURITY INTEREST AT REEL 052915 FRAME 0566 Recorded Feb 8, 2022
From: JPMORGAN CHASE BANK, N.A.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 059127/0001 →
SECURITY INTEREST Recorded Feb 6, 2020
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS AGENT
Reel/Frame 052915/0566 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 16, 2018
From: HGST TECHNOLOGIES SANTA ANA, INC.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 046174/0446 →
CHANGE OF NAME Recorded Aug 4, 2015
From: STEC, INC.
To: HGST TECHNOLOGIES SANTA ANA, INC.
Reel/Frame 036275/0435 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 11, 2009
From: MOSHAYEDI, MARK; FINKE, DOUGLAS
To: STEC, INC.
Reel/Frame 022239/0330 →