Method for monitoring fabrication parameter

1. A method for monitoring fabrication parameters applicable in semiconductor manufacturing, the method comprising the following steps:

obtaining a normal parameter variance curve and a comparing parameter variance curve;

defining a plurality of normal parameter points on the normal parameter variance curve;

defining a plurality of comparing parameter points on the comparing parameter variance curve;

finding the corresponding comparing parameter points nearest to the normal parameter points;

calculating distances between the normal parameter points and the corresponding comparing parameter points thereof;

summing up the distances so as to receive a total distance; and

determining whether or not the total distance exceeds a limit.

2. The method for monitoring fabrication parameters according to claim 1 , further comprising the following step:

issuing an alarm when the total distance exceeds the limit.

3. The method for monitoring fabrication parameters according to claim 1 , wherein a Euclidean distance between the normal parameter points are substantially the same.

4. The method for monitoring fabrication parameters according to claim 3 , wherein the Euclidean distance between the normal parameter points is determined based on the following steps:

calculating a total length of the normal parameter variance curve;

defining a number of normal parameter points; and

dividing the total length of the normal parameter variance curve by the number of normal parameter points, so as to get the Euclidean distance between the normal parameter points.

5. The method for monitoring fabrication parameters according to claim 1 , wherein a Euclidean distance between the comparing parameter points is substantially the same.

6. The method for monitoring fabrication parameters according to claim 5 , wherein the Euclidean distance between the comparing parameter points is determined based on the following steps:

calculating a total length of the comparing parameter variance curve;

defining a number of comparing parameter points; and

dividing the total length of the comparing parameter variance curve by the number of comparing parameter points, so as to get the Euclidean distance between the comparing parameter points.

7. The method for monitoring fabrication parameters according to claim 1 , wherein the comparing parameter points outnumber the normal parameter points.

8. The method for monitoring fabrication parameters according to claim 7 , further comprising the following step:

calculating intervals of the comparing parameter points corresponded to the normal parameter points.

9. The method for monitoring fabrication parameters according to claim 8 , further comprising the following step:

determining whether or not the intervals exceeds another limit.

10. The method for monitoring fabrication parameters according to claim 9 , further comprising the following step:

issuing an alarm when the intervals exceed the limit.

11. The method for monitoring fabrication parameters according to claim 8 , wherein the limit is calculated by multiplying an average of the intervals with a weighted value.

12. The method for monitoring fabrication parameters according to claim 1 , wherein the normal parameter variance curve and the comparing parameter variance curve is respectively generated by a Fault Detection and Classification (FDC) system.

13. A method for monitoring fabrication parameters applicable in semiconductor manufacturing, the method comprising the following steps:

obtaining a normal parameter variance curve and a comparing parameter variance curve;

defining a plurality of normal parameter points on the normal parameter variance curve;

defining a plurality of comparing parameter points on the comparing parameter variance curve;

finding the corresponding comparing parameter points nearest to the normal parameter points;

calculating distances between the normal parameter points and the corresponding comparing parameter points thereof;

summing up the distances so as to receive a total distance; and

determining whether or not the total distance exceeds a limit;

wherein a Euclidean distance between the normal parameter points is substantially the same, and a Euclidean distance between the comparing parameter points is substantially the same.

14. The method for monitoring fabrication parameters according to claim 13 , further comprising the following step:

issuing an alarm when the total distance exceeds the limit.

15. The method for monitoring fabrication parameters according to claim 13 , wherein the Euclidean distance between the normal parameter points is determined based on the following steps:

calculating a total length of the normal parameter variance curve;

defining a number of normal parameter points; and

dividing the total length of the normal parameter variance curve by the number of normal parameter points, so as to get the Euclidean distance between the normal parameter points.

16. The method for monitoring fabrication parameters according to claim 13 , wherein the Euclidean distance between the comparing parameter points is determined based on the following steps:

calculating a total length of the comparing parameter variance curve;

defining a number of comparing parameter points; and

dividing the total length of the comparing parameter variance curve by the number of comparing parameter points, so as to get the Euclidean distance between the comparing parameter points.

17. The method for monitoring fabrication parameters according to claim 13 , wherein the comparing parameter points outnumber the normal parameter points.

18. The method for monitoring fabrication parameters according to claim 13 , wherein the normal parameter variance curve and the comparing parameter variance curve is respectively generated by a Fault Detection and Classification (FDC) system.