Control of particles on semiconductor wafers when implanting boron hydrides
View Patent ↗A method for reducing particle contamination during implantation of ions comprises providing an implantation system for implanting ions into a workpiece via an ion beam, wherein one or more components are under selective vacuum and have one or more contaminants in a first state disposed thereon. A gas is introduced to the implantation system, wherein the gas generally reacts with at least a portion of the one or more contaminants, therein transforming the at least a portion of the one or more contaminants into a second state The at least a portion of the one or more contaminants in the second state remain disposed on the one or more components, and wherein the at least a portion of the second state of the one or more contaminants generally does not produce particle contamination on the one or more workpieces.
1. An ion implantation system, comprising:
an ion source operable to ionize at least boron hydride chemistries;
a beamline assembly for transporting a beam of ions generated by the ion source;
a process chamber housing a workpiece for receiving the beam of ions for implantation thereof;
a vacuum source in selective fluid communication with the process chamber;
a gas source in selective fluid communication with the process chamber, wherein the gas source provides a gas containing at least water vapor; and
a controller, wherein the controller is configured to selectively vent the gas from the gas source to the process chamber and to selectively evacuate the process chamber via control of the respective gas source and vacuum source, wherein boron hydride contamination is generally mitigated by an interaction between the gas and boron hydride.
2. The ion implantation system of claim 1 , further comprising one or more valves disposed between the process chamber and the gas source, wherein the controller is further configured to control a flow of the gas to the process chamber via control of the one or more valves.
3. The ion implantation system of claim 1 , wherein the boron hydride chemistry comprises decaborane or octadecaborane.
4. A method for reducing particle contamination during an implantation of ions into one or more workpieces, the method comprising:
providing an ion implantation system for implanting ions into the one or more workpieces via a boron hydride ion beam, wherein the ion implantation system comprises one or more components under selective vacuum, wherein the one or more components have one or more boron hydride contaminants associated with a formation of the boron hydride ion beam disposed thereon;
introducing a gas to the ion implantation system, wherein the gas contains water vapor, and wherein the gas generally reacts with at least a portion of the one or more boron hydride contaminants, therein generally transforming the at least a portion of the one or more boron hydride contaminants into boric acid and diborane gas, wherein one or more of the boric acid and diborane gas are generally maintained within the ion implantation during subsequent implantation of ions into the one or more workpieces.
5. The method of claim 3 , further comprising implanting boron hydride ions into the one or more workpieces, wherein the gas is introduced concurrently with the implantation.
6. The method of claim 3 , wherein the gas comprises air having a predetermined amount of water vapor.
7. The method of claim 3 , wherein the boron hydride ion beam comprises a molecular decaborane or octadecaborane ion beam.
8. The method of claim 3 , further comprising generally evacuating the diborane gas from the ion implantation system, wherein the boric acid remains generally disposed on the one or more components.